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    • 1. 发明授权
    • Systems and methods for multilevel media defect detection
    • 多层次介质缺陷检测的系统和方法
    • US08745439B2
    • 2014-06-03
    • US12425626
    • 2009-04-17
    • Shaohua YangWeijun TanYuan Xing Lee
    • Shaohua YangWeijun TanYuan Xing Lee
    • G06F11/10
    • H03M13/2957G11B20/18G11B2020/1826G11B2020/185G11B2220/2516H03M13/1102H03M13/6343
    • Various embodiments of the present invention provide systems and methods for deriving data from a defective media region. As an example, a method for deriving data from a defective media region is disclosed that includes providing a storage medium and performing a media defect detection that indicates a defective region on the storage medium. A first data decode is performed on data corresponding to the defective region. The first data decode yields a first output. It is determined that the first output failed to converge and based at least in part on the failure of the first output to converge, a second data decode is performed on the data corresponding to the defective region. The second data decode includes zeroing out any soft data corresponding to the defective region and providing a second output.
    • 本发明的各种实施例提供了用于从缺陷介质区域导出数据的系统和方法。 作为示例,公开了一种用于从缺陷介质区域导出数据的方法,其包括提供存储介质并执行指示存储介质上的缺陷区域的介质缺陷检测。 对与缺陷区域对应的数据执行第一数据解码。 第一个数据解码产生第一个输出。 确定第一输出不能收敛并且至少部分地基于第一输出的失败而收敛,对对应于该缺陷区域的数据执行第二数据解码。 第二数据解码包括将与缺陷区域对应的任何软数据清零并提供第二输出。
    • 3. 发明授权
    • Systems and methods for updating detector parameters in a data processing circuit
    • 用于更新数据处理电路中检测器参数的系统和方法
    • US08578253B2
    • 2013-11-05
    • US12651956
    • 2010-01-04
    • Shaohua YangJonseung ParkChangyou XuMadhusudan KalluriYuan Xing LeeKapil Gaba
    • Shaohua YangJonseung ParkChangyou XuMadhusudan KalluriYuan Xing LeeKapil Gaba
    • H03M13/00
    • H03M13/1111G11B2220/2516H03M13/3723
    • Various embodiments of the present invention provide systems and methods for updating detector parameters in a data processing circuit. For example, a data processing circuit is disclosed that includes a first detector circuit, a second detector circuit, and a calibration circuit. The first detector circuit is operable to receive a first data set and to apply a data detection algorithm to the first data set, and the second detector circuit is operable to receive a second data set and to apply the data detection algorithm to the second data set. The calibration circuit is operable to calculate a data detection parameter based upon a third data set. The data detection parameter is used by the first detector circuit in applying the data detection algorithm to the first data set during a period that the data detection parameter is used by the second detector circuit in applying the data detection algorithm to the second data set.
    • 本发明的各种实施例提供用于在数据处理电路中更新检测器参数的系统和方法。 例如,公开了一种包括第一检测器电路,第二检测器电路和校准电路的数据处理电路。 第一检测器电路可操作以接收第一数据集并将数据检测算法应用于第一数据集,并且第二检测器电路可操作以接收第二数据集并将数据检测算法应用于第二数据集 。 校准电路可操作以基于第三数据集计算数据检测参数。 数据检测参数由第一检测器电路在将数据检测算法应用于第二数据集时由第二检测器电路使用的时段期间将数据检测算法应用于第一数据集使用。
    • 10. 发明授权
    • Systems and methods for storage channel testing
    • 存储通道测试的系统和方法
    • US07990642B2
    • 2011-08-02
    • US12425757
    • 2009-04-17
    • Yuan Xing LeeGeorge MathewShaohua YangHongwei SongWeijun TanHao Zhong
    • Yuan Xing LeeGeorge MathewShaohua YangHongwei SongWeijun TanHao Zhong
    • G11B27/36
    • G11B20/182G11B2220/2516
    • Various embodiments of the present invention provide systems and methods for validating elements of storage devices. A an example, various embodiments of the present invention provide semiconductor devices that include a write path circuit, a read path circuit and a validation circuit. The write path circuit is operable to receive a data input and to convert the data input into write data suitable for storage to a storage medium. The read path circuit is operable to receive read data and to convert the read data into a data output. The validation circuit is operable to: receive the write data, augment the write data with a first noise sequence to yield a first augmented data series; and augment a derivative of the first augmented data series with a second noise sequence to yield the read data.
    • 本发明的各种实施例提供用于验证存储设备的元件的系统和方法。 作为示例,本发明的各种实施例提供包括写入路径电路,读取路径电路和验证电路的半导体器件。 写入路径电路可操作用于接收数据输入并将数据输入转换成适合于存储的写数据到存储介质。 读路径电路可操作以接收读数据并将读数据转换为数据输出。 验证电路可操作以:接收写入数据,用第一噪声序列增加写入数据以产生第一增强数据序列; 并且用第二噪声序列来增加第一增强数据序列的导数以产生读取的数据。