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31. 发明授权

US06552616B1 Asynchronous phase detector for a PLD independent of timing requirements 有权
标题翻译：用于独立于时序要求的PLD的异步相位检测器
公开(公告)号：US06552616B1
公开(公告)日：2003-04-22
申请号：US09816948
申请日：2001-03-22
申请人： David Lai , Eugene Wang
发明人： David Lai , Eugene Wang
IPC分类号： H03L7085
CPC分类号： H03L7/089 , H03D13/004 , H04J3/0685
摘要： An apparatus and method of compensating for differences in circuit routing path lengths is described. In one embodiment, a latch is inserted between reset signal generating logic and a pair of flip-flops. When a reset signal is generated, the reset signal is held inside the latch until both flip-flops are reset. A latch reset signal may be generated by the flip-flops to clear the latch. The circuit may be configured to ensure that both flip-flops are reset before the reset signal is disabled.
摘要翻译：描述了补偿电路布线路径长度差异的装置和方法。在一个实施例中，锁存器插入在复位信号产生逻辑和一对触发器之间。当产生复位信号时，复位信号保持在锁存器内，直到两个触发器复位。触发器可以产生锁存复位信号以清除锁存器。电路可以被配置为确保在复位信号被禁止之前两个触发器都被复位。

32. 发明授权

US06512769B1 Method and apparatus for rate-based cell traffic arbitration in a switch 失效
标题翻译：交换机中用于基于速率的小区业务仲裁的方法和装置
公开(公告)号：US06512769B1
公开(公告)日：2003-01-28
申请号：US09090676
申请日：1998-06-03
申请人： Gene Chui , Lambert Fong , Eugene Wang
发明人： Gene Chui , Lambert Fong , Eugene Wang
IPC分类号： H04L1228
CPC分类号： H04L47/10 , H04L47/283 , H04L47/32 , H04L49/90
摘要： A method and apparatus for rate-based cell traffic arbitration in a switch are provided, wherein arbitration is provided between eight traffic sources in the form of eight cell bus service modules on the same cell bus. A cell bus controller (CBC) is programmed with an 8-bit Relative Service Delay (RSD) value for each of the eight service modules. The value for each RSD is calculated based on the bandwidths allotted for each service module. This RSD value determines the portion of the total bandwidth of the switch platform reserved for the respective service module. Furthermore, each service module uses an 8-bit Service Delay Accumulator (SDA) register. The SDA register of each service module is configured using an SDA value, wherein the SDA register keeps track of when each of the service modules should receive service. The SDA value is calculated at each cell bus frame time for each of the service modules based on the RSD value for each of the service modules, a request for service, and the minimum SDA value among the service modules during a cell bus frame time. If the bandwidth is under-subscribed, the remaining bandwidth is shared among all eight service modules according to the RSD value of each service module. If the bandwidth is over-subscribed, each service module will have the assigned bandwidth portion decreased according to the RSD values.
摘要翻译：提供了一种用于交换机中基于速率的小区业务仲裁的方法和装置，其中在相同信元总线上以八个信元总线服务模块的形式在八个业务源之间提供仲裁。单元总线控制器（CBC）被编程为八个服务模块中的每一个的8位相对服务延迟（RSD）值。每个RSD的值根据为每个服务模块分配的带宽计算。该RSD值确定为相应服务模块保留的交换机平台的总带宽的部分。此外，每个服务模块使用8位服务延迟累加器（SDA）寄存器。每个服务模块的SDA寄存器使用SDA值进行配置，其中SDA寄存器跟踪每个服务模块何时应该接收服务。基于每个服务模块的RSD值，服务请求以及在信元总线帧时间期间服务模块中的最小SDA值，在每个服务模块的每个信元总线帧时间处计算SDA值。如果带宽不足，则剩余带宽根据每个业务模块的RSD值在所有八个业务模块之间共享。如果带宽超额订购，则每个服务模块将分配带宽部分根据RSD值减少。

33. 发明授权

US5382850A Selectable timing delay system 失效
标题翻译：可选定时延系统
公开(公告)号：US5382850A
公开(公告)日：1995-01-17
申请号：US949718
申请日：1992-09-23
申请人： Greg Aldrich , Stephen S. Si , Eugene Wang
发明人： Greg Aldrich , Stephen S. Si , Eugene Wang
IPC分类号： G06F1/10 , H03K5/13 , H03K5/159 , H01L25/00 , H03K7/00 , H04L7/00
CPC分类号： G06F1/10 , H03K5/131 , H03K5/133
摘要： A selectable timing delay system which provides for delaying an input signal a specified length of time within a specified tolerance wherein the range and resolution of the selectable timing delay system are so specified that the selected delay within the selected tolerance is obtainable regardless of the relative speed of the integrated circuit chips used in forming the selectable timing delay system.
摘要翻译：一种可选择的定时延迟系统，其提供在指定的公差内将输入信号延迟指定的时间长度，其中可选择的定时延迟系统的范围和分辨率被如此规定，使得在所选公差内的所选延迟无论相对速度如何用于形成可选定时延迟系统的集成电路芯片。

34. 发明申请

US20130316918A1 MODEL-BASED RESIDUAL CORRECTION OF INTENSITIES 审中-公开
标题翻译：基于模型的强度的残差校正
公开(公告)号：US20130316918A1
公开(公告)日：2013-11-28
申请号：US13989026
申请日：2011-11-22
申请人： Ming Jiang , Chengyong Yang , Eugene Wang
发明人： Ming Jiang , Chengyong Yang , Eugene Wang
IPC分类号： C12Q1/68
CPC分类号： C12Q1/6874 , G16B25/00
摘要： A method for improving color calls or base calls utilizes current and prior cycle multi-channel intensity data from a sequencing run to model residual cycle buildup. The model is applied to correct the multi-cycle channel intensity for the current cycle. The corrected multi-cycle channel intensity is used for color calls or base calls for the current cycle.
摘要翻译：用于改进颜色调用或基本调用的方法利用来自测序运行的模型残余循环积累的当前和先前循环多通道强度数据。该模型用于校正当前周期的多周期通道强度。校正的多周期信道强度用于当前周期的彩色呼叫或基本呼叫。

35. 发明授权

US07989228B2 Method and structure for sample preparation for scanning electron microscopes in integrated circuit manufacturing 有权
标题翻译：集成电路制造中扫描电子显微镜样品制备的方法和结构
公开(公告)号：US07989228B2
公开(公告)日：2011-08-02
申请号：US11378888
申请日：2006-03-16
申请人： Xudong Wan , Liqi Guo , Eugene Wang
发明人： Xudong Wan , Liqi Guo , Eugene Wang
IPC分类号： H01L21/66
CPC分类号： H01J37/28 , G01N23/225 , H01J2237/2817 , H01J2237/2826
摘要： A method for using a calibration standard. The method includes providing a calibration standard. In a specific embodiment, the calibration standard has a substrate, a thickness of material having an edge region; and a conformal material of uniform thickness disposed on the edge region. The standard also has an upper surface pattern having the uniform thickness provided on the edge region. The method also includes using the upper surface pattern for a calibration process on a scanning electron microscope process.
摘要翻译：一种使用校准标准的方法。该方法包括提供校准标准。在具体实施例中，校准标准具有衬底，具有边缘区域的材料的厚度; 以及设置在边缘区域上的均匀厚度的保形材料。该标准还具有设置在边缘区域上的具有均匀厚度的上表面图案。该方法还包括在扫描电子显微镜工艺上使用上表面图案进行校准过程。

36. 发明授权

US07988198B2 Photo album 失效
标题翻译：相片集
公开(公告)号：US07988198B2
公开(公告)日：2011-08-02
申请号：US12074036
申请日：2008-02-29
申请人： Eugene Wang
发明人： Eugene Wang
IPC分类号： B42D3/00
CPC分类号： B42D3/06 , B42D1/02 , B42D1/08
摘要： An album includes a front cover panel, a back cover panel, and a spine panel extending between the front and the back cover panels edge-to-edge. A folding arrangement, which couples between a last album page and the back cover panel, includes a flexible sheet having two longitudinal edges coupling at an outer side of last album page and an inner side of the back cover panel to retain the last album page being overlapped on the back cover panel in a slidably movable manner. When the album is folded at an opened position, the front cover panel, the spine panel, and the back cover panel are aligned to form a planer backing for providing a completely plane on the surface of the album.
摘要翻译：专辑包括前盖板，后盖板和在前盖和后盖板之间边缘到边缘延伸的脊板。耦合在最后一个专辑页面和后盖面板之间的折叠装置包括一个柔性片，其具有在最后专辑页面的外侧耦合的两个纵向边缘和后盖面板的内侧，以保持最后的专辑页面为以可滑动的方式重叠在后盖板上。当专辑折叠在打开位置时，前盖板，脊板和后盖板对准以形成用于在相册的表面上提供完全平面的刨床背衬。

37. 发明申请

US20080221831A1 METHOD AND SYSTEM FOR YIELD SIMILARITY OF SEMICONDUCTOR DEVICES 有权
标题翻译：半导体器件的焊接相似性的方法和系统
公开(公告)号：US20080221831A1
公开(公告)日：2008-09-11
申请号：US11853794
申请日：2007-09-11
申请人： Eugene Wang
发明人： Eugene Wang
IPC分类号： G06F17/18
CPC分类号： G01R31/2894
摘要： A method and system for yield similarity of semiconductor devices. The method includes providing a first plurality of semiconductor devices, providing a second plurality of semiconductor devices, obtaining a first plurality of yields associated with a first yield, and obtaining a second plurality of yields associated with a second yield. Additionally, the method includes performing a first statistical analysis for the first plurality of yields, determining a first statistical distribution, performing a second statistical analysis for the second plurality of yields, and determining a second statistical distribution. Moreover, the method includes processing information associated with the first statistical distribution and the second statistical distribution, and determining an indicator. Also, the method includes processing information associated with the indicator, determining a confidence level, processing information associated with the confidence level, and determining whether the first yield and the second yield are similar.
摘要翻译：一种半导体器件产量相似性的方法和系统。该方法包括提供第一多个半导体器件，提供第二多个半导体器件，获得与第一产率相关联的第一多个产量，以及获得与第二产率相关联的第二多个产量。另外，该方法包括执行第一多个产量的第一统计分析，确定第一统计分布，对第二多个产量执行第二统计分析，以及确定第二统计分布。此外，该方法包括处理与第一统计分布和第二统计分布相关联的信息，以及确定指标。此外，该方法包括处理与指示符相关联的信息，确定置信水平，处理与置信水平相关联的信息，以及确定第一收益率和第二收益率是否相似。

38. 发明申请

US20080079539A1 Friends Finder Service for a Mobile Device in a Network 审中-公开
标题翻译：网络中移动设备的朋友搜索服务
公开(公告)号：US20080079539A1
公开(公告)日：2008-04-03
申请号：US11839396
申请日：2007-08-15
申请人： Robert Daley , Eugene Wang , Sunil Marolia
发明人： Robert Daley , Eugene Wang , Sunil Marolia
IPC分类号： H04Q7/08
CPC分类号： H04W4/029 , H04L67/04 , H04L67/18 , H04L67/306 , H04W8/08 , H04W8/14
摘要： A method and system for interfacing to an electronic device is disclosed. A service provider may receive a request from the electronic device to determine whether any of the specified mobile terminals may be within a specified range of the electronic device. The range may be a default value and/or specified by a user of the electronic device. The service provider may communicate to the electronic device whether any of the specified mobile terminals may be within the specified range. If so, the service provider may communicate information regarding the location of the mobile terminals within range. The service provider may also communicate to the electronic device a map on which the mobile terminals may be placed.
摘要翻译：公开了一种用于与电子设备接口的方法和系统。服务提供商可以从电子设备接收请求，以确定指定的移动终端中的任何一个是否在电子设备的指定范围内。范围可以是默认值和/或由电子设备的用户指定的。服务提供商可以向电子设备通信是否任何指定的移动终端可以在指定的范围内。如果是这样，则服务提供商可以将关于移动终端的位置的信息传送到范围内。服务提供商还可以向电子设备通信可以放置移动终端的地图。

39. 发明授权

US07319938B2 Method and system for processing commonality of semiconductor devices 有权
标题翻译：用于处理半导体器件通用性的方法和系统
公开(公告)号：US07319938B2
公开(公告)日：2008-01-15
申请号：US11286255
申请日：2005-11-22
申请人： Eugene Wang , Jinghua Ni
发明人： Eugene Wang , Jinghua Ni
IPC分类号： G06F19/00
CPC分类号： G05B15/02
摘要： A method and system for processing commonality of semiconductor devices. The method includes providing a first plurality of semiconductor devices, providing a second plurality of semiconductor devices, obtaining a first plurality of measured values corresponding to a characteristic associated with the first plurality of semiconductor devices, obtaining a second plurality of measured values corresponding to the characteristic associated with the second plurality of semiconductor devices, performing a first statistical analysis for the first plurality of measured values, determining a first statistical distribution, performing a second statistical analysis for the second plurality of measured values, and determining a second statistical distribution. Moreover, the method includes processing information associated with the first statistical distribution and the second statistical distribution, and determining an indicator. Also, the method includes processing information associated with the indicator, determining a confidence level, processing information associated with the confidence level, and determining whether the characteristic is stable.
摘要翻译：一种用于处理半导体器件的通用性的方法和系统。该方法包括提供第一多个半导体器件，提供第二多个半导体器件，获得对应于与第一多个半导体器件相关联的特性的第一多个测量值，获得对应于特性的第二多个测量值与所述第二多个半导体器件相关联，对所述第一多个测量值执行第一统计分析，确定第一统计分布，对所述第二多个测量值执行第二统计分析，以及确定第二统计分布。此外，该方法包括处理与第一统计分布和第二统计分布相关联的信息，以及确定指标。此外，该方法包括处理与指示符相关联的信息，确定置信水平，处理与置信水平相关联的信息，以及确定特征是否稳定。

40. 发明申请

US20070111518A1 Method and structure for sample preparation for scanning electron microscopes in integrated circuit manufacturing 有权
标题翻译：集成电路制造中扫描电子显微镜样品制备的方法和结构
公开(公告)号：US20070111518A1
公开(公告)日：2007-05-17
申请号：US11378888
申请日：2006-03-16
申请人： Xudong Wan , Liqi Guo , Eugene Wang
发明人： Xudong Wan , Liqi Guo , Eugene Wang
IPC分类号： H01L21/44 , H01L21/4763
CPC分类号： H01J37/28 , G01N23/225 , H01J2237/2817 , H01J2237/2826
摘要： A method for using a calibration standard. The method includes providing a calibration standard. In a specific embodiment, the calibration standard has a substrate, a thickness of material having an edge region; and a conformal material of uniform thickness disposed on the edge region. The standard also has an upper surface pattern having the uniform thickness provided on the edge region. The method also includes using the upper surface pattern for a calibration process on a scanning electron microscope process.
摘要翻译：一种使用校准标准的方法。该方法包括提供校准标准。在具体实施例中，校准标准具有衬底，具有边缘区域的材料的厚度; 以及设置在边缘区域上的均匀厚度的保形材料。该标准还具有设置在边缘区域上的具有均匀厚度的上表面图案。该方法还包括在扫描电子显微镜工艺上使用上表面图案进行校准过程。

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