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    • 2. 发明授权
    • Method and system for calibrating measurement tools for semiconductor device manufacturing
    • 用于校准半导体器件制造测量工具的方法和系统
    • US08044668B2
    • 2011-10-25
    • US11193016
    • 2005-07-29
    • Eugene WangYu Chen
    • Eugene WangYu Chen
    • G01R35/00
    • G05B19/401G05B2219/37008G05B2219/37224G05B2219/45031
    • A method and system for calibrating a plurality of measurement systems. The method includes obtaining a first plurality of calibration standards. The first plurality of calibration standards is associated with a plurality of predetermined values. Additionally, the method includes measuring the first plurality of calibration standards by a plurality of measurement systems to obtain a first plurality of measured values, processing information associated with the first plurality of measured values, and selecting a first measurement system from the plurality of measurement systems based on at least information associated with the first plurality of measured values. Moreover, the method includes calibrating the first measurement system with the first plurality of calibration standards, obtaining a second plurality of calibration standards, and measuring the second plurality of calibration standards by the first measurement system to obtain a second plurality of measured values.
    • 一种用于校准多个测量系统的方法和系统。 该方法包括获得第一多个校准标准。 第一多个校准标准与多个预定值相关联。 此外,该方法包括通过多个测量系统来测量第一多个校准标准以获得第一多个测量值,处理与第一多个测量值相关联的信息,以及从多个测量系统中选择第一测量系统 至少基于与第一多个测量值相关联的信息。 此外,该方法包括用第一多个校准标准校准第一测量系统,获得第二多个校准标准,以及通过第一测量系统测量第二多个校准标准以获得第二多个测量值。
    • 3. 发明授权
    • Method and system for yield similarity of semiconductor devices
    • 半导体器件产量相似性的方法和系统
    • US07831409B2
    • 2010-11-09
    • US11853794
    • 2007-09-11
    • Eugene Wang
    • Eugene Wang
    • G06F17/18
    • G01R31/2894
    • Method and system for yield similarity of semiconductor devices. Embodiments of the present invention provides a method for yield similarity of semiconductor devices. The method includes providing a first plurality of semiconductor devices and a second plurality of semiconductor devices. The method also includes obtaining a first plurality of yields associated with a first yield related to the first plurality of semiconductor devices. The method further includes obtaining a second plurality of yields associated with a second yield related to the second plurality of semiconductor devices. The method also includes providing a processor and performing a first statistical analysis for the first plurality of yields using at least the processor. The method includes determining a first statistical distribution based on at least information associated with the first statistical analysis. The method includes performing a second statistical analysis for the second plurality of yields.
    • 半导体器件产量相似性的方法和系统。 本发明的实施例提供了半导体器件的屈服相似性的方法。 该方法包括提供第一多个半导体器件和第二多个半导体器件。 该方法还包括获得与第一多个半导体器件相关的第一产量相关联的第一多个产量。 该方法还包括获得与第二多个半导体器件相关的第二产量相关联的第二多个产量。 该方法还包括提供处理器并且使用至少该处理器对第一多个产量执行第一统计分析。 该方法包括至少基于与第一统计分析相关联的信息来确定第一统计分布。 该方法包括对第二多个产量执行第二统计分析。
    • 7. 发明授权
    • Method and system for processing stability of semiconductor devices
    • 用于处理半导体器件稳定性的方法和系统
    • US06965844B1
    • 2005-11-15
    • US10880761
    • 2004-06-29
    • Eugene WangJinghua Ni
    • Eugene WangJinghua Ni
    • G06K9/00H01L21/66
    • H01L22/20H01L2924/0002H01L2924/00
    • A method and system for processing stability of semiconductor devices. The method includes providing a first plurality of semiconductor devices, providing a second plurality of semiconductor devices, obtaining a first plurality of measured values corresponding to a characteristic, and obtaining a second plurality of measured values corresponding to the characteristic. Additionally, the method includes performing a first statistical analysis for the first plurality of measured values, determining a first statistical distribution, performing a second statistical analysis for the second plurality of measured values, and determining a second statistical distribution. Moreover, the method includes processing information associated with the first statistical distribution and the second statistical distribution, and determining an indicator. Also, the method includes processing information associated with the indicator, determining a confidence level, processing information associated with the confidence level, and determining whether the characteristic is stable.
    • 一种用于处理半导体器件的稳定性的方法和系统。 该方法包括提供第一多个半导体器件,提供第二多个半导体器件,获得对应于特性的第一多个测量值,以及获得与该特性对应的第二多个测量值。 另外,该方法包括对第一多个测量值执行第一统计分析,确定第一统计分布,对第二多个测量值执行第二统计分析,以及确定第二统计分布。 此外,该方法包括处理与第一统计分布和第二统计分布相关联的信息,以及确定指标。 此外,该方法包括处理与指示符相关联的信息,确定置信水平,处理与置信水平相关联的信息,以及确定特征是否稳定。
    • 8. 发明授权
    • Method and apparatus for providing asynchronous memory functions for bi-directional traffic in a switch platform
    • 用于在交换平台中为双向业务提供异步存储器功能的方法和装置
    • US06438102B1
    • 2002-08-20
    • US09090299
    • 1998-06-03
    • Gene ChuiLambert FongEugene Wang
    • Gene ChuiLambert FongEugene Wang
    • G01R3108
    • H04L49/107G06F5/16H04L49/102H04L49/552
    • A method and apparatus for providing asynchronous memory functions for bi-directional cell traffic in a switch platform are provided, wherein a parameterized bi-directional FIFO unit controls cell traffic in a switch platform using a first and a second unidirectional FIFO buffer. The first and second unidirectional FIFO buffers each comprises asynchronous read and write ports. A cell size and a word size of the first and second unidirectional FIFO buffers are programmable. The bi-directional FIFO unit is coupled to write at least one cell from and read at least one cell to at lest one asynchronous transfer mode (ATM) interface, at least one frame relay interface, at least one voice interface, and at least one data interface. As such, the first unidirectional FIFO buffer is coupled to write at least one cell from, and the second unidirectional FIFO buffer is coupled to read at least one cell to an ATM interface, a frame relay interface, a voice interface, and a data interface. The first unidirectional FIFO buffer is coupled to read at least one cell to at least one switch, and the second unidirectional FIFO buffer is coupled to write at least one cell from at least one switch, wherein the switch handles cells from sources having a number of bandwidths. The switch is coupled to route the at least one cell between an OC12 trunk line and at least one service module. The service module is coupled to provide the cell to at least one service subscriber using T1, E1, T3, E3, TC3, and OC 12 ports.
    • 提供了一种用于在交换平台中为双向小区业务提供异步存储器功能的方法和装置,其中参数化双向FIFO单元使用第一和第二单向FIFO缓冲器来控制交换平台中的小区业务。 第一和第二单向FIFO缓冲器包括异步读取和写入端口。 第一和第二单向FIFO缓冲器的单元大小和单词大小是可编程的。 双向FIFO单元被耦合以从至少一个小区写入至少一个小区,至少读取一个小区至少一个异步传输模式(ATM)接口,至少一个帧中继接口,至少一个语音接口和至少一个 数据接口。 这样,第一单向FIFO缓冲器被耦合以写入至少一个单元,并且第二单向FIFO缓冲器被耦合以将至少一个单元读取到ATM接口,帧中继接口,语音接口和数据接口 。 耦合第一单向FIFO缓冲器以将至少一个单元读取到至少一个开关,并且第二单向FIFO缓冲器被耦合以从至少一个开关写入至少一个单元,其中该开关处理来自具有多个 带宽。 交换机被耦合以在OC12中继线与至少一个服务模块之间路由至少一个小区。 服务模块被耦合以将小区提供给使用T1,E1,T3,E3,TC3和OC12端口的至少一个服务订户。