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    • 137. 发明申请
    • The process of coating super-fine particles of multi-element thin film
    • 涂覆多元素薄膜超细颗粒的过程
    • US20010011634A1
    • 2001-08-09
    • US09751690
    • 2000-12-28
    • Chung-Lin ChouChen-Chun Hsu
    • C23C014/32
    • C23C14/325C23C14/022C23C14/0664
    • This invention provides a process for coating super fine ion particles of multiple elements on the surface of a micro router substrate, characteristics of which is that the coating step is operated under low temperatures and vacuums. First, raw micro routers are cleaned by electron beams under atmospheric pressures and room temperatures, then the raw micro routers are transferred into a vacuum environment, and increase the temperature of the environment. Next, the surface of the micro router is cleaned by ions, then proceed with the coating process. An arc source is used to bombard cations from a target, while a filtration net is used to get filtrate of small cation particles. Then, an ion assistant device is operated to further fine the filtrated particles, therefore only super fine ion particles are coated on the surface of the micro router substrates. The coated substance is super fine particle and has good adhesion to the micro router substrate, therefore cutting speed and wear-resistance of the coated micro router has increased, the cutting precision, and the life has also improved. This invention has short process time and successfully coats a thin film with good adhesion to a micro router substrate which can not be easily achieved by conventional technologies.
    • 本发明提供了一种在微路由器基板的表面上涂覆多个元件的超细离子颗粒的方法,其特征在于涂覆步骤在低温和真空下运行。 首先,原子微路由器在大气压和室温下被电子束清洗,然后将原始微路由器转移到真空环境中,并增加环境温度。 接下来,微型路由器的表面被离子清洗,然后进行涂覆处理。 使用电弧源从靶中轰击阳离子,而使用过滤网来获得小阳离子颗粒的滤液。 然后,操作离子辅助装置以进一步细化过滤的颗粒,因此在微路由器基板的表面上仅涂覆超细离子颗粒。 涂层物质为超细颗粒,对微路由器基材具有良好的粘附性,因此涂层微型路由器的切割速度和耐磨性提高,切割精度和寿命也有所提高。 本发明处理时间短,成功地涂覆了一种具有良好粘合性的薄膜,微型路由器基板不易于通过传统技术实现。
    • 138. 发明授权
    • Physical vapor processing of a surface with non-uniformity compensation
    • 具有不均匀补偿的表面物理蒸汽处理
    • US06224724B1
    • 2001-05-01
    • US09119291
    • 1998-07-20
    • Thomas J. LicataSteven D. Hurwitt
    • Thomas J. LicataSteven D. Hurwitt
    • C23C1434
    • H01J37/321C23C14/022C23C14/35H01J37/3402H01J37/3405H01J37/347H01L21/28556
    • An apparatus and method for compensating the process-related asymmetries produced in physical vapor processing of a surface. The apparatus and method may be used on either a substrate when sputtering material from a source or when using an ionized physical vapor deposition (IPVD) apparatus to either deposit a film onto or remove material from a substrate. A compensating magnet is configured and positioned to produce a compensating magnetic field. The compensating magnetic is positioned to offset the effects of chamber and process-related asymmetries, particularly those that affect the distribution of plasma processing on a substrate where the plasma has been otherwise symmetrically produced. Assymetries about an axis of the substrate, for example, are corrected, in, for example, systems such as sputter coating machines where a rotating magnet cathode or other such technique produces an initially symmetrical plasma. Asymmetrical non-uniformities in deposited films are reduced to an acceptable amount and substrates may be cleaned in situ prior to metallization.
    • 一种用于补偿在表面的物理蒸汽处理中产生的与工艺有关的不对称的装置和方法。 当从源溅射材料时或者当使用离子化物理气相沉积(IPVD)装置将薄膜沉积在衬底上或从衬底移除材料时,该装置和方法可以用于衬底上。 补偿磁体被配置和定位以产生补偿磁场。 补偿磁性被定位以抵消室和工艺相关不对称性的影响,特别是影响等离子体对称地产生的衬底上的等离子体处理分布的影响。 例如,在例如诸如溅射镀膜机的系统中校正关于衬底的轴线的部分,其中旋转磁体阴极或其它这样的技术产生初始对称的等离子体。 沉积膜中的不对称不均匀性降低到可接受的量,并且可以在金属化之前原位清洁衬底。