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    • 91. 发明申请
    • GAS DIFFUSION SHOWER HEAD DESIGN FOR LARGE AREA PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION
    • 气体扩散淋浴头设计用于大面积等离子体增强化学蒸气沉积
    • US20090104376A1
    • 2009-04-23
    • US12254742
    • 2008-10-20
    • SOO YOUNG CHOIJohn M. WhiteRobert I. Greene
    • SOO YOUNG CHOIJohn M. WhiteRobert I. Greene
    • C23C16/513B08B6/00
    • C23C16/45559B05B1/005C23C16/4405C23C16/45565H01J37/3244
    • Embodiments of a gas distribution plate for distributing gas in a processing chamber are provided. In one embodiment, a gas distribution plate includes a diffuser plate having an upstream side and a downstream side, and a plurality of gas passages passing between the upstream and downstream sides of the diffuser plate. At least one of the gas passages has a right cylindrical shape for a portion of its length extending from the upstream side and a coaxial conical shape for the remainder length of the diffuser plate, the upstream end of the conical portion having substantially the same diameter as the right cylindrical portion and the downstream end of the conical portion having a larger diameter. The gas distribution plate is relatively easy to manufacture and provides good chamber cleaning rate, good thin film deposition uniformity and good thin film deposition rate. The gas distribution plate also has the advantage of reduced chamber cleaning residues on the diffuser surface and reduced incorporation of the cleaning residues in the thin film being deposited.
    • 提供了用于在处理室中分配气体的气体分配板的实施例。 在一个实施例中,气体分配板包括具有上游侧和下游侧的扩散板和通过扩散板的上游侧和下游侧之间的多个气体通道。 气体通道中的至少一个具有从上游侧延伸的一部分长度的右圆柱形状,并且对于扩散板的剩余长度为同轴圆锥形,锥形部分的上游端具有与 锥形部分的右圆柱形部分和下游端具有较大的直径。 气体分配板相对容易制造,提供良好的室清洁率,良好的薄膜沉积均匀性和良好的薄膜沉积速率。 气体分配板还具有减小扩散器表面上的室清洁残留物的优点,并且减少了沉积在薄膜中的清洁残余物的结合。
    • 95. 发明申请
    • IN-SITU PARTICLE COLLECTOR
    • 现场颗粒收集器
    • US20080142481A1
    • 2008-06-19
    • US11612066
    • 2006-12-18
    • John M. WhiteSoo Young Choi
    • John M. WhiteSoo Young Choi
    • H01L21/306C03C15/00
    • C23C16/4401H01J37/32871H01J2237/022
    • A plasma-processing chamber is configured with a particle collection conductor to remove charged particles from the chamber during plasma processing of substrates. The particle collection conductor is positioned in a processing region of the chamber and a power supply applies a DC bias to the conductor when plasma is present in the processing region. The conductor may comprise aluminum, and the power supply may be controlled by a plasma controller of the plasma-processing chamber. In one aspect, the conductor may be configured to translate through the processing region during substrate processing. A method is also provided for removing particles from the processing region of a plasma-processing chamber, comprising positioning a substrate in a processing chamber, flowing a processing gas into the processing chamber, generating a plasma in the processing chamber, and applying a DC bias to a particle collection conductor positioned in the processing chamber.
    • 等离子体处理室配置有粒子收集导体,以在衬底的等离子体处理期间从腔室去除带电粒子。 颗粒收集导体位于室的处理区域中,并且当处理区域中存在等离子体时,电源向导体施加DC偏压。 导体可以包括铝,并且电源可以由等离子体处理室的等离子体控制器控制。 在一个方面,导体可以被配置成在衬底处理期间平移通过处理区域。 还提供了一种用于从等离子体处理室的处理区域去除颗粒的方法,包括将处理室中的基板定位在处理室中,使处理气体流入处理室,在处理室中产生等离子体,并施加DC偏压 到位于处理室中的颗粒收集导体。