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    • 2. 发明申请
    • METHOD AND APPARATUS FOR CONTROLLING PLASMA UNIFORMITY
    • 用于控制等离子体均匀性的方法和装置
    • US20090197015A1
    • 2009-08-06
    • US12344210
    • 2008-12-24
    • Jozef KudelaGaku FurutaCarl A. SorensenSoo Young ChoiJohn M. White
    • Jozef KudelaGaku FurutaCarl A. SorensenSoo Young ChoiJohn M. White
    • C23C16/513
    • H01J37/32623C23C16/345C23C16/5096H01J37/32082
    • Systems, methods, and apparatus involve a plasma processing chamber for depositing a film on a substrate. The plasma processing chamber includes a lid assembly having a ground plate, a backing plate, and a non-uniformity existing between the ground plate and the backing plate. The non-uniformity may interfere with RF wave uniformity and cause an impedance imbalance between portions of the ground plate and backing plate. The non-uniformity may include a structure or a reduced spacing of non-uniform surfaces. A reduced spacing of non-uniform surfaces may exist where a first distance between the ground plate and the backing plate at a first end is different from a second distance between the ground plate and the backing plate at a second end. The structure may be from 2 cm to 10 cm thick, cover from 20% to 50% of the backing plate, and be located away from a discontinuity existing inside the chamber.
    • 系统,方法和装置包括用于在基板上沉积膜的等离子体处理室。 等离子体处理室包括具有接地板,背板和存在于接地板和背板之间的不均匀性的盖组件。 不均匀性可能会干扰RF波均匀性,并导致接地板和背板的部分之间的阻抗不平衡。 不均匀性可以包括非均匀表面的结构或减小的间隔。 存在不均匀表面的减小的间隔,其中在第一端处的接地板和背板之间的第一距离在第二端处不同于接地板和背板之间的第二距离。 该结构可以是2cm至10cm厚,覆盖背板的20%至50%,并且位于远离存在于腔室内的不连续处。