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    • 55. 发明公开
    • 멀티포트 메모리에서의 액세스시의 충돌 처리
    • 处理多个存储器中的访问之间的冲突
    • KR1020140011929A
    • 2014-01-29
    • KR1020130072792
    • 2013-06-25
    • 에이알엠 리미티드
    • 도게일비벡
    • G06F13/376
    • G11C7/1075G06F12/0853G11C7/12G11C8/16G11C8/18
    • A multiport memory comprises an array of storage cells for storing data. Each storage cell comprises data storage circuitry and a plurality of access control devices for isolating the storage circuitry from or connecting the storage circuitry to a data line. The memory comprises a plurality of sets of access control lines and corresponding data lines. The access control lines of each set controls one of the plurality of the access control devices for each of the storage cells. Each of the data lines is coupled to a column of the storage cells and each of the access control lines is coupled to a row of the storage cells. The multiport memory further includes access control circuitry configured to assign each data access port to one among the data access ports, the access control lines, and the sets of the data lines corresponding thereto. The access control circuitry comprises collision detection circuitry configured to detect a colliding data access request received from the second data access port that requests access to a row of the storage cells currently being accessed by a data access request received from the first data access port. The access control circuitry is configured to respond to the detected collision to assign the set of the access control lines and corresponding data lines currently assigned to the first data access port to the second data access port and, after the completion of the data access request received from the first data access port, to assign the first data access port to the set of the access control lines and corresponding data lines previously assigned to the second access port. [Reference numerals] (21) Array; (25) Access control circuit; (28,CC) Collision; (29) Indicator; (30) Processor A; (32) Processor B; (AA) Port A; (BB) Row comparator; (DD) Port B
    • 多端口存储器包括用于存储数据的存储单元阵列。 每个存储单元包括数据存储电路和用于将存储电路与存储电路隔离或连接到数据线的多个访问控制装置。 存储器包括多组访问控制线和对应的数据线。 每个组的访问控制线控制每个存储单元的多个访问控制设备之一。 每个数据线耦合到存储单元的列,并且每个访问控制线耦合到一行存储单元。 多端口存储器还包括访问控制电路,其被配置为将每个数据访问端口分配给数据访问端口,访问控制线以及与其对应的数据线的集合中的一个。 所述访问控制电路包括冲突检测电路,其被配置为检测从所述第二数据访问端口接收到的冲突数据访问请求,所述冲突检测请求通过从所述第一数据访问端口接收到的数据访问请求来请求对当前正在访问的存储单元的行的访问。 访问控制电路被配置为响应于检测到的冲突,以将当前分配给第一数据访问端口的访问控制线路和对应数据线的集合分配给第二数据访问端口,并且在接收到数据访问请求完成之后 从第一数据访问端口将第一数据访问端口分配给先前分配给第二访问端口的访问控制线和对应的数据线的集合。 (21)阵列; (25)门禁控制电路; (28,CC)碰撞; (29)指标; (30)处理器A; (32)处理器B; (AA)港A; (BB)行比较器; (DD)端口B
    • 59. 发明公开
    • 반도체 메모리 장치 및 그의 테스트 방법
    • 半导体存储器件及其测试方法
    • KR1020120119532A
    • 2012-10-31
    • KR1020110037509
    • 2011-04-21
    • 에스케이하이닉스 주식회사
    • 윤영준
    • G11C7/10G11C29/00
    • G11C7/02G11C7/1075G11C29/1201G11C29/48
    • PURPOSE: A semiconductor memory device and a testing method thereof are provided to reduce manufacturing costs by including an interface and a pad for a probe test. CONSTITUTION: First to fourth memory unit blocks(210,220,230,240) independently operates without interference. A plurality of pads for a test mode input and output data in the test mode. A common input and output block(250) inputs and outputs data between the first to fourth memory unit blocks and the plurality of pads for the test mode. [Reference numerals] (210) Channel #0; (212) First core region; (214) First peri region; (216) First connection region; (220) Channel #1; (222) Second core region; (224) Second peri region; (226) Second connection region; (230) Channel #2; (232) Third core region; (234) Third peri region; (236) Third connection region; (240) Channel #3; (242) Fourth core region; (244) Fourth peri region; (246) Fourth connection region; (250) Common input and output block
    • 目的:提供半导体存储器件及其测试方法,以通过包括用于探针测试的界面和垫来降低制造成本。 构成:第一至第四存储器单元块(210,220,230,240)独立地工作而不受干扰。 在测试模式下用于测试模式输入和输出数据的多个焊盘。 公共输入和输出块(250)在第一至第四存储器单元块和用于测试模式的多个焊盘之间输入和输出数据。 (210)通道#0; (212)第一核心区域; (214)第一周围地区; (216)第一连接区域; (220)频道#1; (222)第二核心区域; (224)第二周边地区; (226)第二连接区域; (230)频道#2; (232)第三核心区域; (234)第三围区; (236)第三连接区域; (240)频道#3; (242)第四核心区; (244)第四区域; (246)第四连接区域; (250)公共输入和输出块