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    • 24. 发明公开
    • 수직광 렌티큐라 노광기
    • 曝光装置
    • KR1020130053837A
    • 2013-05-24
    • KR1020110119514
    • 2011-11-16
    • 성낙훈
    • 성낙훈
    • G03F7/20
    • G03F7/70008G03F7/70075G03F7/70141G03F7/70191G03F7/70208G03F7/70308G03F7/70325
    • PURPOSE: A vertical light lenticular exposure apparatus is provided to use a vertical light in a center part of a lenticular lens which is located in the lower part of a light source. CONSTITUTION: A vertical light lenticular exposure apparatus(1) irradiates a film(6) with a light from a light source device(2) and exposes photosensitive agent(7) into patterns formed on a film by light irradiation. The vertical light lenticular exposure apparatus includes the light source device which forms vertical light by using function of a center part region of a lenticular lens(11). The light source device is located in and below a light source emitting light and includes a lenticular which is composed by connecting center regions of each lenticular lens.
    • 目的:提供一种垂直光透镜曝光装置,用于在位于光源下部的双凸透镜的中心部分使用垂直光。 构成:垂直光柱状体曝光装置(1)用来自光源装置(2)的光照射薄膜(6),并通过光照射将感光剂(7)暴露于形成在薄膜上的图案。 垂直光双凸透镜装置包括通过利用双凸透镜(11)的中心部分区域的功能形成垂直光的光源装置。 光源装置位于发光光源的内部和下方,并且包括通过连接每个双凸透镜的中心区域而组成的透镜。
    • 28. 发明公开
    • 리소그래피 방법 및 장치
    • LITHOGRAPHY设备和LITHOGRAPHY方法
    • KR1020110013909A
    • 2011-02-10
    • KR1020090071615
    • 2009-08-04
    • 한국기계연구원
    • 김기홍이재종최기봉임형준최두선
    • H01L21/027
    • G03F7/7055G03F7/70233G03F7/70308G03F7/70325G03F7/70466
    • PURPOSE: A lithography method and a lithography apparatus are provided to improve the integrate degree and the precision of a semiconductor device by forming fine patterns, compared to the wavelength of laser beam. CONSTITUTION: A substrate supporting stand(15) supports a substrate(1). A plurality of reflective mirrors(11) radiates light to the substrate. A light splitter(112) splits incident light(E) into two right and left interference lights(E1, E2). A light direction adjusting part(13) adjusts the incident angle of the right and left interference lights. An incident angle adjusting part(14) radiates the interference lights with adjusted incident angle to the substrate.
    • 目的:提供光刻方法和光刻装置,与激光束的波长相比,通过形成精细图案来提高半导体器件的集成度和精度。 构成:衬底支撑架(15)支撑衬底(1)。 多个反射镜(11)向基板辐射光。 光分路器(112)将入射光(E)分成两个左右干涉光(E1,E2)。 光调整部(13)调整左右干涉光的入射角。 入射角度调节部件(14)将具有调节的入射角的干涉光照射到基板。