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    • 5. 发明专利
    • Film thickness, contact state measuring method and apparatus
    • JP5374890B2
    • 2013-12-25
    • JP2008058889
    • 2008-03-10
    • 株式会社Ihi
    • 吉之 齋藤孝行 廣瀬剛 寺内利幸 中島
    • G01B7/06G01N27/06G01N27/22
    • PROBLEM TO BE SOLVED: To provide a method and an apparatus for measuring a film thickness and a contact state which can accurately measure the film thickness of an oil film of a lubricant by capacitance measurement in a fluid lubricated state and can evaluate the contact state of a piston ring in relation to a cylinder liner by electric resistance measurement in a boundary lubrication state. SOLUTION: In an arithmetic evaluation unit 13 for the film thickness and contact state, a switch 9 is ordinarily switched over to a capacitance measuring circuit 10 side by a switchover command signal 13a at every prescribed crank rotation angle at which a measuring trigger signal 14a from a crank rotation angle detector 14 is inputted, and the film thickness of the oil film in the fluid lubricated state is determined on the basis of a measured value obtained by the capacitance measuring circuit 10. Meanwhile, when the film thickness becomes a set value or below while the piston ring 5 passes a place where a sensor electrode 8 is buried, the switch 9 is switched over to the electric resistance measuring circuit 11 side by the switchover command signal 13a and the contact state of the piston ring 5 in relation to the cylinder liner 3 in the boundary lubrication state is evaluated on the basis of the measured value by an electric resistance measuring circuit 11. COPYRIGHT: (C)2009,JPO&INPIT