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    • 3. 发明授权
    • Multi-level dram trench store utilizing two capacitors and two plates
    • 使用两个电容器和两个电路板的多层次的沟渠商店
    • US06429080B2
    • 2002-08-06
    • US09793517
    • 2001-02-27
    • Toshiharu FurukawaDavid V. HorakHoward L. Kalter
    • Toshiharu FurukawaDavid V. HorakHoward L. Kalter
    • H01L21336
    • G11C11/565G11C11/404H01L27/108H01L27/10864H01L27/1087H01L27/10882
    • A multi-level memory cell capable of storing two or three bits of digital data occupies only four lithographic squares and requires only one or two logic level voltage sources, respectively. High noise immunity derives from integration of the multi-level signal in the memory cell directly from logic level digital signals applied to two capacitors (as well as the bit line for the eight level mode of operation) by using capacitors having different values in order to avoid digital-to-analog conversion during writing. The capacitors can be simultaneously written and read to reduce memory cycle time. Transistor channels and capacitor connections are formed on adjacent semiconductor pillars using plugs of semiconductor material between pillars as common gate structures and connections. Opposite surfaces of the pillars also serve as storage nodes with common capacitor plates formed by conformal deposition between rows of plugs and pillars.
    • 能够存储两位或三位数字数据的多级存储器单元仅占用四个光刻平面,并且仅分别仅需要一个或两个逻辑电平电压源。 通过使用具有不同值的电容器,可以直接从施加到两个电容器的逻辑电平数字信号(以及八电平工作模式的位线)将存储单元中的多电平信号集成到高抗噪声性能 避免在写入过程中进行数模转换。 电容器可以同时写入和读取,以减少存储周期时间。 晶体管通道和电容器连接使用在柱之间的半导体材料的塞子作为公共栅极结构和连接形成在相邻的半导体柱上。 支柱的相对表面还用作具有通过塞子和柱之间的共形沉积形成的公共电容器板的存储节点。
    • 4. 发明授权
    • Multi-level DRAM trench store utilizing two capacitors and two plates
    • 使用两个电容器和两个板的多级DRAM沟槽存储器
    • US06282115B1
    • 2001-08-28
    • US09469275
    • 1999-12-22
    • Toshiharu FurukawaDavid V. HorakHoward L. Kalter
    • Toshiharu FurukawaDavid V. HorakHoward L. Kalter
    • G11C1124
    • G11C11/565G11C11/404H01L27/108H01L27/10864H01L27/1087H01L27/10882
    • A multi-level memory cell capable of storing two or three bits of digital data occupies only four lithographic squares and requires only one or two logic level voltage sources, respectively. High noise immunity derives from integration of the multi-level signal in the memory cell directly from logic level digital signals applied to two capacitors (as well as the bit line for the eight level mode of operation) by using capacitors having different values in order to avoid digital-to-analog conversion during writing. The capacitors can be simultaneously written and read to reduce memory cycle time. Transistor channels and capacitor connections are formed on adjacent semiconductor pillars using plugs of semiconductor material between pillars as common gate structures and connections. Opposite surfaces of the pillars also serve as storage nodes with common capacitor plates formed by conformal deposition between rows of plugs and pillars.
    • 能够存储两位或三位数字数据的多级存储器单元仅占用四个光刻平面,并且仅分别仅需要一个或两个逻辑电平电压源。 通过使用具有不同值的电容器,可以直接从施加到两个电容器的逻辑电平数字信号(以及八电平工作模式的位线)将存储单元中的多电平信号集成到高抗噪声性能 避免在写入过程中进行数模转换。 电容器可以同时写入和读取,以减少存储周期时间。 晶体管通道和电容器连接使用在柱之间的半导体材料的塞子作为公共栅极结构和连接形成在相邻的半导体柱上。 支柱的相对表面还用作具有通过塞子和柱之间的共形沉积形成的公共电容器板的存储节点。
    • 7. 发明授权
    • Complementary depletion switch body stack off-chip driver
    • 互补耗尽开关体堆栈片外驱动
    • US06177818B1
    • 2001-01-23
    • US09303508
    • 1999-04-30
    • Claude L. BertinAnthony R. BonaccioHoward L. KalterThomas M. MaffittJack A. MandelmanWilliam R. Tonti
    • Claude L. BertinAnthony R. BonaccioHoward L. KalterThomas M. MaffittJack A. MandelmanWilliam R. Tonti
    • H03B2100
    • H03K19/09482H03K19/00361H03K19/018521
    • An off-chip driver circuit including an enhancement PFET, a depletion PFET, a depletion NFET and an enhancement NFET connected in series. The large enhancement PFET and large enhancement NFET turn off the OCD in tri-state and to turn off the unused half of the OCD to prevent overlap current when driving a ‘0’ or a ‘1’. A first gate signal is applied to the gate of the enhancement PFET and a second gate signal is applied to the enhancement NFET. A fixed voltage is connected to the gate of the depletion NFET and ground to gate of the depletion PFET. An output signal is obtained from a node between the depletion PFET and depletion NFET devices. In another embodiment, a reflection/overshoot sensor 60 is added. The output of sensor is connected to the body of a depletion PFET and an NFET. The feedback from sensor is such that the threshold voltage of the depletion devices are made more positive if the sensor detects that the output is being over-driven. A more positive threshold voltage will reduce the driver's IDS, but leaves the device in the linear mode.
    • 包括增强型PFET,耗尽型PFET,耗尽型NFET和增强型NFET的片外驱动电路。 大增强型PFET和大增强型NFET在三态关闭OCD并关闭OCD的未使用的一半以防止在驱动“0”或“1”时重叠电流。 第一栅极信号被施加到增强PFET的栅极,并且第二栅极信号被施加到增强NFET。 固定电压连接到耗尽型NFET的栅极,并连接到耗尽PFET的栅极。 从耗尽PFET和耗尽NFET器件之间的节点获得输出信号。 在另一个实施例中,添加了反射/过冲传感器60。 传感器的输出连接到耗尽PFET和NFET的主体。 来自传感器的反馈使得如果传感器检测到输出被过驱动,则耗尽装置的阈值电压变得更为正。 更正的阈值电压将减少驾驶员的IDS,但使设备处于线性模式。