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    • 2. 发明申请
    • VOLTAGE DEPENDENT PARAMETER ANALYSIS
    • 电压依赖参数分析
    • US20060229828A1
    • 2006-10-12
    • US11095327
    • 2005-03-31
    • David HathawayDouglas StoutIvan Wemple
    • David HathawayDouglas StoutIvan Wemple
    • G06F19/00
    • G06F17/5036
    • A method of, and a system for, determining an extreme value of a voltage dependent parameter of an integrated circuit design is provided. The method includes determining a plurality of current waveforms, each of the plurality of waveforms corresponding to one of a plurality of aggressor objects in the design of the integrated circuit; applying each of the plurality of current waveforms to a subset of the plurality of power bus nodes, the subset of the plurality of power bus nodes being designed to supply power to a corresponding one of the plurality of aggressor objects; determining a plurality of voltage waveforms, each of the plurality of voltage waveforms being at one of the plurality of power bus nodes and corresponding to one of the plurality of current waveforms; using the plurality of voltage waveforms to determine the extreme value.
    • 提供了一种用于确定集成电路设计的电压相关参数的极值的方法和系统。 所述方法包括确定多个电流波形,所述多个波形中的每一个对应于所述集成电路的设计中的多个侵略对象中的一个; 将所述多个电流波形中的每一个应用于所述多个电力总线节点的子集,所述多个电力总线节点的子集被设计为向所述多个侵权者对象中的相应一个提供电力; 确定多个电压波形,所述多个电压波形中的每一个在所述多个电力总线节点中的一个处并且对应于所述多个电流波形中的一个; 使用多个电压波形来确定极值。
    • 3. 发明申请
    • METHOD AND APPARATUS FOR STORING CIRCUIT CALIBRATION INFORMATION
    • 存储电路校准信息的方法和装置
    • US20070115019A1
    • 2007-05-24
    • US11164040
    • 2005-11-08
    • Anthony BonaccioAllen HaarJoseph IadanzaDouglas StoutIvan Wemple
    • Anthony BonaccioAllen HaarJoseph IadanzaDouglas StoutIvan Wemple
    • G01R31/26
    • G01R31/2884G01R35/005
    • A method for altering circuit characteristics to make them independent of processing parameters of devices within an integrated circuit is disclosed. A process parameter is measured by a kerf or on-chip built-in test on a selective set of chip on a wafer, and the results are stored on a storage device within each respective chip. Then, for each of the remaining chips, a two-dimensional interpolation is performed to determine the process parameter value for the respective chip based on the measured value. The interpolated values are recorded along with the coordinates of the chip in an efuse control file. Such information is subsequently stored into an efuse module within the chip. On-chip digital control structures are used to adjust certain operational characteristics of a functional component within the chip based on the information stored in the efuse module.
    • 公开了一种用于改变电路特性以使它们与集成电路内的器件的处理参数无关的方法。 通过在晶片上的选择性芯片组上的切口或片上内置测试来测量工艺参数,并将结果存储在每个相应芯片内的存储装置上。 然后,对于剩余的每个芯片,执行二维内插,以基于测量值确定各个芯片的处理参数值。 内插值与芯片在efuse控制文件中的坐标一起被记录。 这样的信息随后被存储在芯片内的efuse模块中。 片上数字控制结构用于根据存储在efuse模块中的信息来调整芯片内的功能组件的某些操作特性。
    • 4. 发明申请
    • METHOD FOR DESIGNING AN INTEGRATED CIRCUIT HAVING MULTIPLE VOLTAGE DOMAINS
    • 用于设计具有多个电压域的集成电路的方法
    • US20050108667A1
    • 2005-05-19
    • US10707068
    • 2003-11-19
    • Joseph IadanzaRaminderpal SinghSebastian VentroneIvan Wemple
    • Joseph IadanzaRaminderpal SinghSebastian VentroneIvan Wemple
    • G06F17/50G06G7/62
    • G06F17/5045
    • A method for designing an integrated circuit having multiple voltage domains, including: (a) generating a logical integrated circuit design from information contained in a high-level design file, the high-level design file defining global connection declarations and voltage domain connection declarations; (b) synthesizing the logical integrated circuit design into a synthesized integrated circuit design based upon the logical integrated circuit design, information in a preferred components file and information in a voltage domain definition file; (c) generating a noise model from the synthesized integrated circuit design based on information in the voltage domain definition file and a design constraint file; and (d) simulating the noise model against constraints in the design constraint file and constraints in a circuit level profile file to determine if the synthesized integrated circuit design meets predetermined noise simulation targets.
    • 一种用于设计具有多个电压域的集成电路的方法,包括:(a)从包含在高级设计文件中的信息,定义全局连接声明和电压域连接声明的高级设计文件生成逻辑集成电路设计; (b)基于逻辑集成电路设计,优选组件文件中的信息和电压域定义文件中的信息,将逻辑集成电路设计合成为合成集成电路设计; (c)基于电压域定义文件和设计约束文件中的信息从合成的集成电路设计中产生噪声模型; 和(d)根据设计约束文件中的约束和电路级配置文件中的约束模拟噪声模型,以确定合成的集成电路设计是否满足预定的噪声模拟目标。
    • 10. 发明申请
    • INTEGRATED CIRCUIT AND METHOD FOR INTERFACING TWO VOLTAGE DOMAINS USING A TRANSFORMER
    • 使用变压器接合两个电压域的集成电路和方法
    • US20050093620A1
    • 2005-05-05
    • US10605855
    • 2003-10-31
    • Shiu HoIvan WempleStephen Wyatt
    • Shiu HoIvan WempleStephen Wyatt
    • H01L27/02H03K17/691H03K19/0175H03B1/00
    • H03K19/017545H01L27/0251H03K17/691
    • An integrated circuit designed to reduce on-chip noise coupling. In one embodiment, circuit (60) includes the following: a circuit transformer (62) capable of converting a noise sensitive input reference clock signal to an output signal having a voltage compatible with a predetermined sink voltage logic level; and a biased receiver network (64) having a PFET current mirror (74) coupled with a NFET current (72), the biased receiver transistor network designed to multiply the transformer signal to offset a mutual coupling loss of the transformer. In at least one alternative embodiment, the input reference clock signal originates at an off-chip clock generator circuit (42) and the output signal from receiver (64) is input to a PLL (44). In another alternative embodiment, the transformer is a monolithic integrated transformer. Another alternative embodiment of the present invention is a method of reducing on-chip noise coupling.
    • 一种集成电路,旨在减少片内噪声耦合。 在一个实施例中,电路(60)包括以下:电路变压器(62),其能够将噪声敏感的输入参考时钟信号转换成具有与预定接收电压逻辑电平兼容的电压的输出信号; 以及偏置的接收器网络(64),其具有与NFET电流(72)耦合的PFET电流镜(74),所述偏置的接收器晶体管网络被设计为将变压器信号乘以偏移变压器的互耦合损耗。 在至少一个备选实施例中,输入参考时钟信号起始于片外时钟发生器电路(42),并且来自接收机(64)的输出信号被输入到PLL(44)。 在另一替代实施例中,变压器是单片集成变压器。 本发明的另一替代实施例是减少片上噪声耦合的方法。