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    • 3. 发明申请
    • METHOD AND APPARATUS FOR STORING CIRCUIT CALIBRATION INFORMATION
    • 存储电路校准信息的方法和装置
    • US20070115019A1
    • 2007-05-24
    • US11164040
    • 2005-11-08
    • Anthony BonaccioAllen HaarJoseph IadanzaDouglas StoutIvan Wemple
    • Anthony BonaccioAllen HaarJoseph IadanzaDouglas StoutIvan Wemple
    • G01R31/26
    • G01R31/2884G01R35/005
    • A method for altering circuit characteristics to make them independent of processing parameters of devices within an integrated circuit is disclosed. A process parameter is measured by a kerf or on-chip built-in test on a selective set of chip on a wafer, and the results are stored on a storage device within each respective chip. Then, for each of the remaining chips, a two-dimensional interpolation is performed to determine the process parameter value for the respective chip based on the measured value. The interpolated values are recorded along with the coordinates of the chip in an efuse control file. Such information is subsequently stored into an efuse module within the chip. On-chip digital control structures are used to adjust certain operational characteristics of a functional component within the chip based on the information stored in the efuse module.
    • 公开了一种用于改变电路特性以使它们与集成电路内的器件的处理参数无关的方法。 通过在晶片上的选择性芯片组上的切口或片上内置测试来测量工艺参数,并将结果存储在每个相应芯片内的存储装置上。 然后,对于剩余的每个芯片,执行二维内插,以基于测量值确定各个芯片的处理参数值。 内插值与芯片在efuse控制文件中的坐标一起被记录。 这样的信息随后被存储在芯片内的efuse模块中。 片上数字控制结构用于根据存储在efuse模块中的信息来调整芯片内的功能组件的某些操作特性。
    • 6. 发明申请
    • PSEUDO-RANDOM BINARY SEQUENCE CHECKER WITH AUTOMATIC SYNCHRONIZATION
    • 具有自动同步的PSEUDO随机二进制序列检查器
    • US20050071399A1
    • 2005-03-31
    • US10605381
    • 2003-09-26
    • Anthony BonaccioAllen Haar
    • Anthony BonaccioAllen Haar
    • G01R31/317G01R31/3183G06F1/02G06F7/58
    • G01R31/318385G01R31/31703G01R31/31728G06F7/584G06F2207/582
    • A pseudo-random binary sequence checker having automatic synchronization is disclosed. The pseudo-random binary sequence checker includes a receiver, a synchronizer, and a comparator. The receiver is capable of receiving a pseudo-random binary sequence, which is generated by a pseudo-random binary sequence generator, in a parallel fashion n bits at a time. The synchronizer automatically synchronizes the state of the receiver with an n-bit sample within the pseudo-random binary sequence and calculate all subsequent n-bit sample within the pseudo-random binary sequence. The comparator compares the subsequent calculated n-bit sample within the pseudo-random binary sequence to the next subsequent next received n-bit sample within the pseudo-random binary sequence to indicate an error condition has occurred if each calculated n-bit sample within the pseudo-random binary sequence does not equal to the corresponding received n-bit sample within the pseudo-random binary sequence.
    • 公开了具有自动同步的伪随机二进制序列检验器。 伪随机二进制序列检查器包括接收器,同步器和比较器。 接收机能够以并行方式一次接收由伪随机二进制序列生成器生成的伪随机二进制序列,每个n位。 同步器自动将接收器的状态与伪随机二进制序列内的n位采样同步,并计算伪随机二进制序列内的所有随后的n位采样。 比较器将伪随机二进制序列中随后计算的n位采样与伪随机二进制序列中的下一个接下来的接收到的n位采样进行比较,以指示如果每个计算的n位采样在 伪随机二进制序列不等于伪随机二进制序列内的相应接收的n位样本。