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    • 2. 发明申请
    • VOLTAGE DEPENDENT PARAMETER ANALYSIS
    • 电压依赖参数分析
    • US20060229828A1
    • 2006-10-12
    • US11095327
    • 2005-03-31
    • David HathawayDouglas StoutIvan Wemple
    • David HathawayDouglas StoutIvan Wemple
    • G06F19/00
    • G06F17/5036
    • A method of, and a system for, determining an extreme value of a voltage dependent parameter of an integrated circuit design is provided. The method includes determining a plurality of current waveforms, each of the plurality of waveforms corresponding to one of a plurality of aggressor objects in the design of the integrated circuit; applying each of the plurality of current waveforms to a subset of the plurality of power bus nodes, the subset of the plurality of power bus nodes being designed to supply power to a corresponding one of the plurality of aggressor objects; determining a plurality of voltage waveforms, each of the plurality of voltage waveforms being at one of the plurality of power bus nodes and corresponding to one of the plurality of current waveforms; using the plurality of voltage waveforms to determine the extreme value.
    • 提供了一种用于确定集成电路设计的电压相关参数的极值的方法和系统。 所述方法包括确定多个电流波形,所述多个波形中的每一个对应于所述集成电路的设计中的多个侵略对象中的一个; 将所述多个电流波形中的每一个应用于所述多个电力总线节点的子集,所述多个电力总线节点的子集被设计为向所述多个侵权者对象中的相应一个提供电力; 确定多个电压波形,所述多个电压波形中的每一个在所述多个电力总线节点中的一个处并且对应于所述多个电流波形中的一个; 使用多个电压波形来确定极值。
    • 4. 发明申请
    • METHOD FOR RETICLE SHAPES ANALYSIS AND CORRECTION
    • 用于形式分析和校正的方法
    • US20070061771A1
    • 2007-03-15
    • US11162586
    • 2005-09-15
    • Peter HabitzDavid HathawayJerry HayesAnthony PolsonTad Wilder
    • Peter HabitzDavid HathawayJerry HayesAnthony PolsonTad Wilder
    • G06F17/50
    • G03F1/36
    • A method for reticle design correction and electrical parameter extraction of a multi-cell reticle design. The method including: selecting a subset of cell designs of a multi-cell reticle design, each cell design of the subset of cell designs having a corresponding shape to process, for each cell design of the subset of cell designs determining a respective cell design location of the corresponding shape; determining a common shapes processing rule for all corresponding shapes of each cell design based on the respective cell design locations of each of the corresponding shapes; and performing shapes processing of the corresponding shape only of a single cell design of the subset of cell designs to generate resulting data for the subset of cell designs. Also a computer usable medium including computer readable program code having an algorithm adapted to implement the method for reticle design correction and electrical extraction.
    • 一种多光栅掩模版设计的掩模版设计校正和电参数提取的方法。 该方法包括:选择多小区掩模版设计的小区设计的子集,小区设计子集的每个小区设计具有相应的处理形状,用于确定相应小区设计位置的小区设计子集的每个小区设计 的相应形状; 基于每个相应形状的相应单元设计位置,确定每个单元设计的所有对应形状的共同形状处理规则; 以及仅对单元设计的子集的单个单元设计执行相应形状的形状处理,以生成用于所述单元设计的子集的结果数据。 还有一种包括计算机可读程序代码的计算机可用介质,其具有适于实现掩模版设计校正和电提取的方法的算法。
    • 5. 发明申请
    • THE USE OF REDUNDANT ROUTES TO INCREASE THE YIELD AND RELIABILITY OF A VLSI LAYOUT
    • 使用冗余路由增加VLSI布局的可靠性
    • US20060265684A1
    • 2006-11-23
    • US10908593
    • 2005-05-18
    • Markus BuehlerJohn CohnDavid HathawayJason HibbelerJuergen Koehl
    • Markus BuehlerJohn CohnDavid HathawayJason HibbelerJuergen Koehl
    • G06F17/50
    • G06F17/5077G06F17/5068
    • Disclosed is a method and system for inserting redundant paths into an integrated circuit. Particularly, the invention provides a method for identifying a single via in a first path connecting two elements, determining if an alternate route is available for connecting the two elements (other than a redundant via), and for inserting a second path into the available alternate route. The combination of the first and second paths provides greater redundancy than inserting a redundant via alone. More importantly, such redundant paths provide for redundancy when congestion prevents a redundant via from being inserted adjacent to the single via. An embodiment of the method further comprises removing the single via and any redundant wire segments, if all of the additional vias used to form the second path can be made redundant.
    • 公开了一种将冗余路径插入到集成电路中的方法和系统。 特别地,本发明提供了一种用于在连接两个元件的第一路径中识别单个通孔的方法,确定替代路线是否可用于连接两个元件(不同于冗余通路),以及用于将第二路径插入到可用交替 路线。 第一和第二路径的组合提供了比单独插入冗余通道更大的冗余。 更重要的是,当拥塞阻止冗余通道被插入邻近单个通道时,这种冗余路径提供了冗余。 如果用于形成第二路径的所有附加通孔都可以是冗余的,则该方法的实施例还包括去除单个通孔和任何冗余线段。
    • 7. 发明申请
    • METHOD FOR ESTIMATING CLOCK JITTER FOR STATIC TIMING MEASUREMENTS OF MODELED CIRCUITS
    • 用于估计建模电路静态时序测量的时钟抖动的方法
    • US20060247906A1
    • 2006-11-02
    • US10908100
    • 2005-04-27
    • John AustinDavid HathawayTimothy PlattStephen Wyatt
    • John AustinDavid HathawayTimothy PlattStephen Wyatt
    • G06F17/50
    • G06F17/5031
    • A method in accordance with the invention for modeling period jitter for testing a modeled logic circuit. Clock signals can be derived from a phase lock loop having a voltage controlled oscillator for use to evaluate timing problems within a modeled circuit. An estimation of period jitter for the modeled clock signals can be made by considering the number of periods of the voltage controlled oscillator signal which generates the clock signal occurring within a test interval. By using the relationship as an index to a table, a value of period jitter may be obtained from a table which increases longer the timing interval being considered. Instructions for carrying out the steps of correcting intervals between clock signals used in static timing tests may be stored on a computer readable medium along with a table containing the amount of period jitter as a function of the number of VCO periods occurring within a testing period. The improved accuracy in period jitter estimation improves the reliability of static testing of modeled circuits.
    • 根据本发明的用于建模用于测试建模的逻辑电路的周期抖动的方法。 时钟信号可以从具有压控振荡器的锁相环导出,用于评估建模的电路内的定时问题。 可以通过考虑产生在测试间隔内发生的时钟信号的压控振荡器信号的周期数来进行建模时钟信号的周期抖动的估计。 通过使用该关系作为表的索引,可以从考虑的时间间隔更长的表获得周期抖动的值。 用于执行校正在静态定时测试中使用的时钟信号之间的时间间隔的步骤的指令可以与包含在测试周期内出现的VCO周期数的函数的周期抖动量的表一起存储在计算机可读介质上。 周期抖动估计的改进精度提高了建模电路的静态测试的可靠性。
    • 8. 发明申请
    • Hybrid linear wire model approach to tuning transistor widths of circuits with RC interconnect
    • 混合线性线模型方法来调整具有RC互连的电路的晶体管宽度
    • US20060206845A1
    • 2006-09-14
    • US11077043
    • 2005-03-10
    • Vasant RaoCindy WashburnJun ZhouJeffrey SoreffPatrick WilliamsDavid Hathaway
    • Vasant RaoCindy WashburnJun ZhouJeffrey SoreffPatrick WilliamsDavid Hathaway
    • G06F17/50
    • G06F17/5045G06F17/5031G06F17/5068
    • A hybrid linear wire model for tuning the transistor widths of circuits linked by RC interconnects is described. The method uses two embedded simulators during the tuning process on netlists that contain resistors (Rs). A Timing oriented simulator is used only for timing purposes on the original netlist that includes all the Rs. A Gradient oriented simulator is then run only on the modified netlist with all Rs shorted and within the iterative loop of the tuner to compute gradients. The present hybrid method achieves a significant improvement in computational speed. The Timing oriented simulator is fast and accurate for only timing netlists with Rs, but cannot compute gradients efficiently. The Gradient oriented simulator computes gradients efficiently but cannot do so in the presence of Rs. To prevent “de-tuning” that typically occurs when all Rs are shorted, ‘wire-adjusts’ are provided that make the initial timing results using the Gradient oriented simulator on the shorted netlist match the timing results using Timing oriented simulator on the original netlist. This permits the optimizer sense initially the correct set of critical timing paths, and more significantly, it permits the wire-adjusts keep track of the changing transistor widths to guide the optimizer during the iterations until convergence is achieved.
    • 描述了用于调谐由RC互连链接的电路的晶体管宽度的混合线性线模型。 在调谐过程中,该方法使用两个嵌入式模拟器,其中包含电阻(Rs)。 面向计时的模拟器仅用于包含所有Rs的原始网表的时序目的。 然后,一个面向梯度的模拟器仅在修改后的网表上运行,所有的Rs都已经短路,并在调谐器的迭代循环内计算梯度。 目前的混合方法实现了计算速度的显着提高。 面向时序的模拟器只需要具有Rs的时间网络列表即可快速准确,但无法有效地计算渐变。 梯度导向模拟器有效地计算梯度,但在Rs的存在下不能这样做。 为了防止所有Rs短路时通常发生的“去调谐”,提供“线调整”,使得在短路网表上使用面向梯度的模拟器的初始定时结果与使用定时模型的原始网表上的定时结果相匹配 。 这允许优化器最初感测正确的关键定时路径集合,并且更重要的是,它允许线路调整跟踪改变的晶体管宽度,以在迭代期间引导优化器直到实现收敛。