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    • 1. 发明申请
    • Decoding circuit for non-binary groups of memory line drivers
    • 用于非二进制组的存储器线路驱动器的解码电路
    • US20060221702A1
    • 2006-10-05
    • US11146952
    • 2005-06-07
    • Roy ScheuerleinChristopher PettiLuca Fasoli
    • Roy ScheuerleinChristopher PettiLuca Fasoli
    • G11C11/34
    • G11C8/10G11C5/063G11C8/08G11C8/14
    • A decoding circuit for non-binary groups of memory line drivers is disclosed. In one embodiment, an integrated circuit is disclosed comprising a binary decoder and circuitry operative to perform a non-binary arithmetic operation, wherein a result of the non-binary arithmetic operation is provided as input to the binary decoder. In another embodiment, an integrated circuit is disclosed comprising a memory array comprising a plurality of array lines, a non-integral-power-of-two number of array line driver circuits, and control circuitry configured to select one of the array line driver circuits. The control circuitry can comprise a binary decoder and a pre-decoder portion that performs a non-binary arithmetic operation. The concepts described herein may be used alone or in combination.
    • 公开了一种用于非二进制组的存储器线驱动器的解码电路。 在一个实施例中,公开了一种集成电路,其包括二进制解码器和用于执行非二进制算术运算的电路,其中非二进制算术运算的结果被提供作为二进制解码器的输入。 在另一个实施例中,公开了一种集成电路,其包括存储器阵列,该存储器阵列包括多个阵列线,两个非整数倍数量的阵列线驱动器电路,以及控制电路,被配置为选择阵列线驱动电路之一 。 控制电路可以包括执行非二进制算术运算的二进制解码器和预解码器部分。 本文所述的概念可以单独使用或组合使用。
    • 9. 发明申请
    • Integrated circuit including memory array incorporating multiple types of NAND string structures
    • 集成电路包括并入多种类型的NAND串结构的存储器阵列
    • US20060146608A1
    • 2006-07-06
    • US11026492
    • 2004-12-30
    • Luca FasoliRoy Scheuerlein
    • Luca FasoliRoy Scheuerlein
    • G11C16/04
    • G11C16/0483G11C11/005H01L27/11524H01L27/11551
    • A monolithic integrated circuit includes a memory array having first and second groups of NAND strings, each NAND string comprising at least two series-connected devices and coupled at one end to an associated global array line. NAND strings of the first and second groups differ in at least one physical characteristic, such as the number of series-connected devices forming the NAND string, but both groups are disposed in a region of the memory array traversed by a plurality of global array lines. The memory array may include a three-dimensional memory array having more than one memory plane. Some of the NAND strings of the first group may be disposed on one memory plane, and some of the NAND strings of the second group may be disposed on another memory plane. In some cases, NAND strings of both groups may share global array lines.
    • 单片集成电路包括具有第一和第二组NAND串的存储器阵列,每个NAND串包括至少两个串联连接的器件,并在一端耦合到相关联的全局阵列线。 第一组和第二组的NAND串在至少一个物理特性方面不同,例如形成NAND串的串联连接器件的数量,但两组都设置在由多个全局阵列线穿过的存储器阵列的区域中 。 存储器阵列可以包括具有多于一个存储器平面的三维存储器阵列。 第一组的一些NAND串可以被布置在一个存储器平面上,并且第二组的一些NAND串可以被布置在另一个存储器平面上。 在某些情况下,两组的NAND串可能共享全局阵列线。
    • 10. 发明申请
    • Method of programming a monolithic three-dimensional memory
    • 编写单片三维存储器的方法
    • US20060067127A1
    • 2006-03-30
    • US10955049
    • 2004-09-30
    • Luca FasoliRoy ScheuerleinAlper IlkbaharEn-Hsing ChenTanmay Kumar
    • Luca FasoliRoy ScheuerleinAlper IlkbaharEn-Hsing ChenTanmay Kumar
    • G11C11/34G11C16/04
    • G11C16/12G11C16/16
    • A method of programming a monolithic three-dimensional (3-D) memory having a plurality of levels of memory cells above a silicon substrate is disclosed. The method includes initializing a program voltage and program time interval; selecting a memory cell to be programmed within the three-dimensional memory having the plurality of levels of memory cells; applying a pulse having the program voltage and the program time interval to the selected memory cell; performing a read after write operation with respect to the selected memory cell to determine a measured threshold voltage value; and comparing the measured threshold voltage value to a minimum program voltage. In response to the comparison between the measured threshold voltage value and the minimum program voltage, the method further includes selectively applying at least one subsequent program pulse to the selected memory cell.
    • 公开了一种在硅衬底上编程具有多层存储单元的单片三维(3-D)存储器的方法。 该方法包括初始化程序电压和程序时间间隔; 选择要在具有多个级别的存储器单元的三维存储器内编程的存储器单元; 将具有编程电压和程序时间间隔的脉冲施加到所选存储单元; 在对所选择的存储单元进行写操作之后执行读取以确定测量的阈值电压值; 以及将所测量的阈值电压值与最小编程电压进行比较。 响应于测量的阈值电压值和最小编程电压之间的比较,该方法还包括选择性地将至少一个后续编程脉冲施加到所选存储单元。