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    • 5. 发明授权
    • Negative resistance semiconductor device
    • 负电阻半导体器件
    • US4816878A
    • 1989-03-28
    • US929783
    • 1986-11-13
    • Hiroyuki KanoMasafumi HashimotoNobuhiko Sawaki
    • Hiroyuki KanoMasafumi HashimotoNobuhiko Sawaki
    • H01L29/80H01L29/15H01L29/205H01L29/68H01L29/86H01L27/12H01L29/161
    • H01L29/86H01L29/155
    • A semiconductor device having a superlattice structure, which comprises at least one unit structure including first and third semiconductor layers as quantum well layers, and a second semiconductor layer as a barrier layer, which are arranged alternately on each other is described. The first semiconductor layer has a higher impurity concentration than the third semiconductor layer and has a quantum energy level determined by its thickness. The third semiconductor layer is of a thickness having quantum energy levels, one of which is lower than that of the first semiconductor layer and the second of which is equal to or higher than that of the first semiconductor layer. The second semiconductor layer is of a thickness which allows electrons existing at the second quantum energy level of the third semiconductor layer to transfer easily from the third to the first semiconductor layer. An increase in voltage applied to the semiconductor device causes electrons to transfer to the first semiconductor layer through the second quantum energy level of the third semiconductor layer to reduce the mobility of electrons in the first semiconductor layer, thus causing the semiconductor device to develop a negative resistance.
    • 描述了具有超晶格结构的半导体器件,其包括至少一个包括作为量子阱层的第一和第三半导体层以及彼此交替布置的阻挡层的第二半导体层的单元结构。 第一半导体层具有比第三半导体层更高的杂质浓度,并且具有由其厚度确定的量子能级。 第三半导体层具有量子能级的厚度,其中一个低于第一半导体层的厚度,第二半导体层的厚度等于或高于第一半导体层的厚度。 第二半导体层的厚度允许存在于第三半导体层的第二量子能级的电子容易地从第三半导体层传输到第一半导体层。 施加到半导体器件的电压的增加导致电子通过第三半导体层的第二量子能级转移到第一半导体层,以降低第一半导体层中的电子的迁移率,从而使得半导体器件产生负的 抵抗性。
    • 9. 发明申请
    • Substrate for forming light-emitting layer, light emitter and light-emitting substance
    • 用于形成发光层,发光体和发光物质的基板
    • US20090250711A1
    • 2009-10-08
    • US11990924
    • 2006-08-24
    • Akira KiyamaRentaro MoriHiroya InaokaMasayuki IchiyanagiNobuhiko SawakiYoshio HondaYasuyuki Yanase
    • Akira KiyamaRentaro MoriHiroya InaokaMasayuki IchiyanagiNobuhiko SawakiYoshio HondaYasuyuki Yanase
    • H01L33/00
    • H01L33/007H01L33/16H01L33/24
    • To also intend the improvement of light-emitting efficiency by microcrystallizing light-emitting layer while utilizing vapor-phase growth method that is advantageous for improving crystal quality, and the like.4 for forming light-emitting layer comprises a substrate single-crystal substrate 1, and an oriented fine crystal layer 3 being formed on the single-crystal substrate 4. One of the crystal axes of respective crystals, which constitute the oriented microcrystal layer 3, is oriented in a specific direction with respect to the single-crystal substrate 1, and an average of the crystal grain diameters of the respective crystals, which constitute the oriented microcrystal layer 3, is adapted to being 1-1,000 nm. A light emitter 8 is equipped with an intermediate layer 5, a light-emitting layer 6 and a clad layer 7, which are formed on the oriented microcrystal layer 3 of this substrate 4 for forming light-emitting layer by means of vapor-phase growth method, respectively, and which comprise a nitride semiconductor. The light-emitting layer 6 is constituted of microcrystal grains whose average grain diameter is 1-1,000 nm.
    • 另外,为了提高发光效率,也可以通过利用气相生长法,通过微结晶发光层来提高发光效率,有利于提高晶体质量等。 用于形成发光层的图4包括基板单晶基板1和形成在单晶基板4上的取向微细晶体层3.构成取向微晶层3的各晶体的晶轴之一, 相对于单晶衬底1在特定方向上取向,并且构成取向微晶层3的各晶体的晶粒直径的平均值适应为1-1000nm。 发光体8配置有中间层5,发光层6和覆盖层7,其形成在该基板4的取向微晶层3上,用于通过气相生长形成发光层 方法,并且其包括氮化物半导体。 发光层6由平均粒径为1-1000nm的微晶粒构成。