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    • 1. 发明授权
    • Negative resistance semiconductor device
    • 负电阻半导体器件
    • US4816878A
    • 1989-03-28
    • US929783
    • 1986-11-13
    • Hiroyuki KanoMasafumi HashimotoNobuhiko Sawaki
    • Hiroyuki KanoMasafumi HashimotoNobuhiko Sawaki
    • H01L29/80H01L29/15H01L29/205H01L29/68H01L29/86H01L27/12H01L29/161
    • H01L29/86H01L29/155
    • A semiconductor device having a superlattice structure, which comprises at least one unit structure including first and third semiconductor layers as quantum well layers, and a second semiconductor layer as a barrier layer, which are arranged alternately on each other is described. The first semiconductor layer has a higher impurity concentration than the third semiconductor layer and has a quantum energy level determined by its thickness. The third semiconductor layer is of a thickness having quantum energy levels, one of which is lower than that of the first semiconductor layer and the second of which is equal to or higher than that of the first semiconductor layer. The second semiconductor layer is of a thickness which allows electrons existing at the second quantum energy level of the third semiconductor layer to transfer easily from the third to the first semiconductor layer. An increase in voltage applied to the semiconductor device causes electrons to transfer to the first semiconductor layer through the second quantum energy level of the third semiconductor layer to reduce the mobility of electrons in the first semiconductor layer, thus causing the semiconductor device to develop a negative resistance.
    • 描述了具有超晶格结构的半导体器件,其包括至少一个包括作为量子阱层的第一和第三半导体层以及彼此交替布置的阻挡层的第二半导体层的单元结构。 第一半导体层具有比第三半导体层更高的杂质浓度,并且具有由其厚度确定的量子能级。 第三半导体层具有量子能级的厚度,其中一个低于第一半导体层的厚度,第二半导体层的厚度等于或高于第一半导体层的厚度。 第二半导体层的厚度允许存在于第三半导体层的第二量子能级的电子容易地从第三半导体层传输到第一半导体层。 施加到半导体器件的电压的增加导致电子通过第三半导体层的第二量子能级转移到第一半导体层,以降低第一半导体层中的电子的迁移率,从而使得半导体器件产生负的 抵抗性。
    • 7. 发明授权
    • Noise control device
    • 噪音控制装置
    • US08411873B2
    • 2013-04-02
    • US12528181
    • 2008-12-24
    • Hiroyuki Kano
    • Hiroyuki Kano
    • A61F11/06
    • G10K11/178B64C2220/00G10K2210/128G10K2210/3022G10K2210/3023G10K2210/3026G10K2210/3028G10K2210/3033G10K2210/30391G10K2210/3046G10K2210/3055G10K2210/3056G10K2210/3221G10K2210/503
    • A noise control device eliminates a possibility that a noise arriving at a control point is increased as compared to a case where noise control is not performed and has a reduced circuit scale. The device includes a controlling noise detector for detecting a given noise to output a controlling noise signal, a controlling filter section for signal-processing the controlling noise signal, by using a preset fixed filter coefficient, to output a control signal, and a control speaker for reducing the given noise, by emitting toward the control point a control sound based on the control signal. The device also includes a noise determination section for determining whether the given noise is a noise corresponding to the fixed filter coefficient, and an output control section for stopping output of the control signal from the controlling filter section when the given noise does not correspond.
    • 噪声控制装置消除了与不执行噪声控制并且具有减小的电路规模的情况相比,到达控制点的噪声增加的可能性。 该装置包括用于检测给定噪声以输出控制噪声信号的控制噪声检测器,用于使用预设的固定滤波器系数信号处理控制噪声信号的控制滤波器部分,以输出控制信号,以及控制扬声器 为了减少给定的噪声,通过向控制点发射基于控制信号的控制声音。 该装置还包括一个噪声确定部分,用于确定给定噪声是否是与固定滤波器系数相对应的噪声;以及输出控制部分,用于在给定噪声不对应时停止来自控制滤波器部分的控制信号的输出。
    • 8. 发明申请
    • DIFFRACTED SOUND REDUCTION DEVICE, DIFFRACTED SOUND REDUCTION METHOD, AND FILTER COEFFICIENT DETERMINATION METHOD
    • 衍射衰减装置,衍射减影法和滤光系数确定方法
    • US20130034246A1
    • 2013-02-07
    • US13641250
    • 2012-02-17
    • Hiroyuki Kano
    • Hiroyuki Kano
    • H03G3/00
    • H04S7/305H04R1/403H04R3/12H04R2217/03H04R2499/15
    • A diffracted sound reduction device includes: a reproduction speaker that outputs reproduced sound having properties indicated by an input signal; control speakers each of which reproduces corresponding one of control signals, the diffracted sound being a part of the reproduced sound and arriving at corresponding one of the control points except the control point at the listener's position; and control filters each of which filters the input signal to generate corresponding one of the control signals. Each of the control points faces a corresponding speaker from among the reproduction speaker and the control speakers. Each of the control filters generates the corresponding one of the control signals so that a sound pressure of the diffracted sound at corresponding one of the control points is lower than a sound pressure of direct sound that is a part of the reproduced sound which arrives at the control point of the listener's position.
    • 衍射声衰减装置包括:再现扬声器,其输出具有由输入信号表示的特性的再现声音; 控制扬声器,每个扬声器再现对应的一个控制信号,衍射声音是再现声音的一部分,并到达除了听者位置的控制点之外的控制点的对应一个; 以及控制滤波器,每个滤波器对输入信号进行滤波以产生对应的一个控制信号。 每个控制点面对来自再现扬声器和控制扬声器之间的对应扬声器。 每个控制滤波器产生对应的一个控制信号,使得对应的一个控制点处的衍射声的声压低于作为再现声音的一部分的直接声音的声压 听众位置的控制点。
    • 10. 发明授权
    • Particle density measuring probe and particle density measuring equipment
    • 颗粒密度测量探头和颗粒密度测量设备
    • US07782463B2
    • 2010-08-24
    • US11987264
    • 2007-11-28
    • Masanu HoriSeigo TakashimaHiroyuki KanoShoji Den
    • Masanu HoriSeigo TakashimaHiroyuki KanoShoji Den
    • G01N21/00G01B9/02G01J3/45H05B31/26H01J7/24
    • H05H1/0037G01N21/15G01N21/68
    • Disclosed is a particle density measuring probe for measuring the density of atoms or molecules in a plasma atmosphere by absorption spectroscopy. The probe has a cylindrical light guiding member provided in the plasma atmosphere. At the front end of the light guiding member, there is provided a reflection plate for reflecting light that has propagated through the cylindrical light guiding member. Behind the reflection plate, in a cross section perpendicular to the longitudinal direction of the light guiding member, a part devoid of a portion of wall surface is provided by a predetermined length in the longitudinal direction. A plasma introducing portion allows mutual contact between light passing through this part devoid of a portion of wall surface and atoms or molecules in the plasma atmosphere. The probe has a main body that guides light in an axial direction by total reflection by a side wall, and that is located behind the plasma introducing portion.
    • 公开了一种用于通过吸收光谱法测量等离子体气氛中的原子或分子的密度的颗粒密度测量探针。 探针具有设置在等离子体气氛中的圆柱形导光构件。 在导光构件的前端设置有用于反射已经传播通过圆柱形导光构件的光的反射板。 在反射板的后方,在与导光部件的纵向垂直的截面中,没有壁面的一部分的部分在长度方向上设置规定的长度。 等离子体引入部分允许通过该部分没有壁表面的一部分的光与等离子体气氛中的原子或分子之间的相互接触。 探针具有通过侧壁的全反射引导轴向的光的主体,位于等离子体导入部的后方。