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    • 2. 发明授权
    • Supply voltages switch circuit
    • 电源开关电路
    • US6040734A
    • 2000-03-21
    • US109630
    • 1998-07-02
    • Corrado VillaLuigi BettiniSimone Bartoli
    • Corrado VillaLuigi BettiniSimone Bartoli
    • G11C5/14G11C16/12H03K17/687H03K17/693H02J3/38
    • G11C5/143G11C16/12H03K17/6871H03K17/693
    • A circuit for switching between supply voltages and in particular for non-volatile flash memory devices and of the type comprising a first and a second circuit branch each incorporating a pair of transistors connected in series provides that at least one branch of the circuit be structured with a bridge circuit made up of P-channel MOS transistors. The bridge is made of a first and a second pairs of transistors connected between a first supply voltage reference and a common node. The first pair comprises transistors bigger than the transistors of the second pair while between the transistors making up the second pair is inserted a pair of resistors. Between the pair of resistors there is an interconnection node connected to a corresponding interconnection node between the transistors of the first pair.
    • 用于在电源电压之间切换的电路,特别是用于非易失性闪速存储器件的电路以及包括第一和第二电路支路的类型的电路,每个连接在一起的串联的一对晶体管使电路的至少一个支路与 由P沟道MOS晶体管构成的桥接电路。 该桥由连接在第一电源电压基准和公共节点之间的第一对和第二对晶体管构成。 第一对包括大于第二对的晶体管的晶体管,而构成第二对的晶体管之间插入一对电阻器。 在一对电阻器之间存在连接到第一对晶体管之间的对应互连节点的互连节点。
    • 5. 发明授权
    • Non-volatile memory array architecture with joined word lines
    • 具有连接字线的非易失性存储器阵列架构
    • US07684245B2
    • 2010-03-23
    • US11928086
    • 2007-10-30
    • Steve SchumannMassimiliano FrulioSimone BartoliLorenzo BedaridaEdward Shue-Ching Hui
    • Steve SchumannMassimiliano FrulioSimone BartoliLorenzo BedaridaEdward Shue-Ching Hui
    • G11C11/34G11C16/04G11C5/06
    • G11C16/3418Y10T29/49002
    • In an embodiment, a non-volatile memory array wherein narrow word lines, as small as the minimum feature size width F, in separate strings, are extended outwardly from a non-volatile memory array and joined by wider connector segments. The joined word lines provide new opportunities. First, metal straps that can be formed to overlie the word lines can be joined by metal connector segments to the word lines. The connector segments can serve as an interface between the polysilicon word lines and the metal straps. Two adjacent word lines in the same string share a single metal strap using these segments thereby reducing the overall number of segments and contacts in the array. Increased width of the polysilicon joinder segments joining word lines in different strings, provides the opportunity for widening the connection beyond the minimum feature size so that contact may be readily made between the metal straps and the polysilicon word lines. Second, the joined word lines require fewer row decoder circuits. One row decoder is provided for each joined set of word lines.
    • 在一个实施例中,非易失性存储器阵列,其中与分离的串中的最小特征尺寸宽度F一样小的窄字线从非易失性存储器阵列向外延伸并由更宽的连接器段连接。 加入的词语提供了新的机会。 首先,可以形成为覆盖字线的金属带可以通过金属连接器部分连接到字线。 连接器部分可以用作多晶硅字线和金属带之间的接口。 相同字符串中的两个相邻字线使用这些段共享单个金属带,从而减少阵列中的段和触点的总数。 在不同的串中连接字线的多晶硅接合段的增加的宽度提供了将连接扩大超出最小特征尺寸的机会,使得可以容易地在金属带和多晶硅字线之间进行接触。 第二,连接的字线需要更少的行解码器电路。 为每个连接的字线组提供一行解码器。
    • 6. 发明授权
    • Implementation of column redundancy for a flash memory with a high write parallelism
    • 实现具有高写入并行性的闪存的列冗余
    • US07551498B2
    • 2009-06-23
    • US11611452
    • 2006-12-15
    • Simone BartoliStefano SuricoAndrea SaccoMaria Mostola
    • Simone BartoliStefano SuricoAndrea SaccoMaria Mostola
    • G11C7/00
    • G11C29/82G11C29/806G11C29/846
    • A redundant memory array has r columns of redundant memory cells, r redundant senses, and a redundant column decoder. Redundant address registers store addresses of defective regular memory cells. Redundant latches are provided in n groups of r latches. Redundancy comparison logic compares addresses of defective regular memory cells with an external input address. If the comparison is true, what is provided is: a DISABLE_LOAD signal to disable the regular senses for one of the n groups of m columns, an ENABLE_LATCH signal to one of the n groups of m columns to disables corresponding regular senses, and one or r REDO signals to a respective one of the r redundant latches in one of the n groups that is disabled. The selected one of the redundant latches activates one of the r redundant senses to access a redundant column.
    • 冗余存储器阵列具有r列的冗余存储器单元,r冗余感测器和冗余列解码器。 冗余地址寄存器存储有缺陷的常规存储单元的地址。 在n组r个锁存器中提供冗余锁存器。 冗余比较逻辑将缺陷常规存储单元的地址与外部输入地址进行比较。 如果比较是真的,提供的是:DISABLE_LOAD信号,用于禁用n列m列中的一个的常规感测,将一个ENABLE_LATCH信号分配给m列的n组中的一组,以禁用相应的常规感官,以及其中之一 r REDO信号到禁用的n个组之一的r个冗余锁存器中的相应一个。 所选的一个冗余锁存器激活r个冗余感测之一以访问冗余列。
    • 7. 发明授权
    • Compensated method to implement a high voltage discharge phase after erase pulse in a flash memory device
    • 补偿方法在闪存器件中擦除脉冲后实现高电压放电相位
    • US07177198B2
    • 2007-02-13
    • US11123979
    • 2005-05-06
    • Lorenzo BedaridaSimone BartoliGiorgio OddoneDavide Manfre′
    • Lorenzo BedaridaSimone BartoliGiorgio OddoneDavide Manfre′
    • G11C11/34
    • G11C16/14
    • A method for discharge in a flash memory device includes: initiating a discharge of a memory cell after an erase operation; coupling a first discharge circuit to a first plate of a gate-bulk capacitor, and a second discharge circuit to a second plate of the gate-bulk capacitor, where the first plate represents the common gate node of the memory cell and the second plate represents the bulk-source node of the memory cell; and coupling the common gate node and the bulk-source node to ground to provide for a complete discharge. The current injected into the first plate approximately equals the current extracted from the second plate. In this manner, dangerous oscillations of the gate and bulk-source voltages as they go to ground are eliminated without complicated designs or voltage limitators, and without sacrificing the fast discharge after the erase operation. The reliability of the discharge operation is thus significantly improved.
    • 一种闪速存储装置中的放电方法包括:在擦除操作之后启动存储单元的放电; 将第一放电电路耦合到栅极 - 体积电容器的第一板,以及将第二放电电路耦合到栅极 - 体积电容器的第二板,其中第一板表示存储单元的公共栅极节点,第二板表示 存储器单元的批量源节点; 并将公共栅极节点和体源节点耦合到地,以提供完全放电。 注入第一板的电流大约等于从第二板提取的电流。 以这种方式,在没有复杂设计或限压器的情况下,栅极和体源电压的危险振荡消除,而不会在擦除操作之后不牺牲快速放电。 因此,放电操作的可靠性显着提高。
    • 9. 发明申请
    • Compensated method to implement a high voltage discharge phase after erase pulse in a flash memory device
    • 补偿方法在闪存器件中擦除脉冲后实现高电压放电相位
    • US20060062063A1
    • 2006-03-23
    • US11123979
    • 2005-05-06
    • Lorenzo BedaridaSimone BartoliGiorgio OddoneDavide Manfre'
    • Lorenzo BedaridaSimone BartoliGiorgio OddoneDavide Manfre'
    • G11C16/04G11C7/00
    • G11C16/14
    • A method for discharge in a flash memory device includes: initiating a discharge of a memory cell after an erase operation; coupling a first discharge circuit to a first plate of a gate-bulk capacitor, and a second discharge circuit to a second plate of the gate-bulk capacitor, where the first plate represents the common gate node of the memory cell and the second plate represents the bulk-source node of the memory cell; and coupling the common gate node and the bulk-source node to ground to provide for a complete discharge. The current injected into the first plate approximately equals the current extracted from the second plate. In this manner, dangerous oscillations of the gate and bulk-source voltages as they go to ground are eliminated without complicated designs or voltage limitators, and without sacrificing the fast discharge after the erase operation. The reliability of the discharge operation is thus significantly improved.
    • 一种闪速存储装置中的放电方法包括:在擦除操作之后启动存储单元的放电; 将第一放电电路耦合到栅极 - 体积电容器的第一板,以及将第二放电电路耦合到栅极 - 体积电容器的第二板,其中第一板表示存储单元的公共栅极节点,第二板表示 存储器单元的批量源节点; 并将公共栅极节点和体源节点耦合到地,以提供完全放电。 注入第一板的电流大约等于从第二板提取的电流。 以这种方式,在没有复杂设计或限压器的情况下,栅极和体源电压的危险振荡消除,而不会在擦除操作之后不牺牲快速放电。 因此,放电操作的可靠性显着提高。