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    • 3. 发明专利
    • Double optical pass double-etalon spectroscope
    • 双光通道双通道光谱仪
    • JP2006138874A
    • 2006-06-01
    • JP2006032382
    • 2006-02-09
    • Cymer Incサイマー, インコーポレイテッドCymer, Inc.
    • SMITH SCOTT TERSHOV ALEXANDER IBUCK JESSE D
    • G01J3/26G01B9/02G01J3/36G01J3/447
    • G01J3/26
    • PROBLEM TO BE SOLVED: To provide a very compact spectroscope which generates very accurate fringe data, and is capable of measuring bandwidth having the required accuracy for microlithography regarding to both Δλ
      FWHM and Δλ
      95% .
      SOLUTION: In a spectroscope, more specifically, a first double optical pass etalon-based spectroscope, a second etalon adapted to the first double optical pass etalon is preferably utilized to form very accurate fringe data. The spectral components of the diffused beam are separated by angles, when they permeate through the etalon. A retroreflector reflects the permeated component to return through the etalon. The spectral components that are twice permeated advance through the second etalon to focus onto a photodetector as a photodiode array in the second preferred embodiment.
      COPYRIGHT: (C)2006,JPO&NCIPI
    • 要解决的问题:为了提供一种非常紧凑的分光镜,其产生非常精确的条纹数据,并且能够测量对于Δλ FWHM 和Δλ的微光刻所需的精度的带宽, 95%。 解决方案:在分光镜中,更具体地,优选地,利用第一双光学通过标准具的分光镜,适用于第一双光学通过标准具的第二标准具来形成非常精确的条纹数据。 扩散光束的光谱分量当它们渗透通过标准具时被角度分离。 后向反射镜反映渗透成分通过标准具返回。 在第二优选实施例中,两次渗透的光谱分量通过第二标准具推进以聚焦到作为光电二极管阵列的光电检测器。 版权所有(C)2006,JPO&NCIPI
    • 10. 发明专利
    • System for protecting internal component of euv light source from plasma-generated debris
    • 用于保护来自等离子体生物反应器的EUV光源的内部组分的系统
    • JP2012099502A
    • 2012-05-24
    • JP2012023033
    • 2012-02-06
    • Cymer Incサイマー インコーポレイテッド
    • BOWERING NORBERT LAM HANSON BYRONALEXANDER N BYKANOVOLEH KHODYKINERSHOV ALEXANDER IPARTLO WILLIAM N
    • H05G2/00H01L21/027
    • G03F7/70925B82Y10/00G03F7/70033G03F7/70166G03F7/70916G21K2201/06H05G2/001
    • PROBLEM TO BE SOLVED: To provide an extreme ultraviolet (EUV) light generator providing EUV light from a plasma.SOLUTION: A system and a method are provided for protecting an optical element surface of an EUV light source plasma production chamber from debris generated by plasma formation. In one aspect of an embodiment of the present invention, a shield including at least one hollow tube positioned between an optical element and a plasma formation site is disclosed. The tube is oriented to capture debris while allowing light to pass through a lumen of the tube via reflection at relatively small angles of grazing incidence. In another aspect of an embodiment of the present invention, a shield heated to a temperature sufficient to remove one or more species of a debris material deposited on the shield is disclosed. Furthermore, in another aspect of an embodiment of the present invention, a system in which a shield is moved from a light source plasma chamber to a cleaning chamber where the shield is cleaned is disclosed.
    • 要解决的问题:提供从等离子体提供EUV光的极紫外(EUV)光发生器。 解决方案:提供一种系统和方法,用于保护EUV光源等离子体生成室的光学元件表面免受由等离子体形成产生的碎片。 在本发明的实施例的一个方面中,公开了一种屏蔽件,其包括位于光学元件和等离子体形成部位之间的至少一个中空管。 管被定向以捕获碎片,同时允许光以相对较小的掠入射角度的反射通过管的内腔。 在本发明的一个实施例的另一方面,公开了一种加热到足以去除沉积在屏蔽上的一种或多种碎屑材料的温度的屏蔽。 此外,在本发明的实施例的另一方面,公开了一种系统,其中屏蔽件从光源等离子体室移动到清洁罩的清洁室。 版权所有(C)2012,JPO&INPIT