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    • 5. 发明申请
    • Resistive Devices and Methods of Operation Thereof
    • 电阻器件及其操作方法
    • US20140003125A1
    • 2014-01-02
    • US13610690
    • 2012-09-11
    • Foroozan Sarah KoushanMichael A. Van Buskirk
    • Foroozan Sarah KoushanMichael A. Van Buskirk
    • G11C11/00
    • G11C13/003G11C13/0002G11C13/0004G11C13/0007G11C13/0009G11C13/0011G11C13/004G11C13/0069G11C2013/0071G11C2013/0092G11C2213/74G11C2213/79
    • In accordance with an embodiment of the present invention, a method of operating a resistive switching device includes applying a signal including a pulse on a first access terminal of an access device having the first access terminal and a second access terminal. The second access terminal is coupled to a first terminal of a two terminal resistive switching device. The resistive switching device has the first terminal and a second terminal. The resistive switching device has a first state and a second state. The pulse includes a first ramp from a first voltage to a second voltage over a first time period, a second ramp from the second voltage to a third voltage over a second time period, and a third ramp from the third voltage to a fourth voltage over a third time period. The second ramp and the third ramp have an opposite slope to the first ramp. The sum of the first time period and the second time period is less than the third time period.
    • 根据本发明的实施例,一种操作电阻式交换设备的方法包括:在具有第一接入终端的接入设备的第一接入终端和第二接入终端上应用包括脉冲的信号。 第二接入终端耦合到两端电阻式交换设备的第一终端。 电阻式开关装置具有第一端子和第二端子。 电阻式开关装置具有第一状态和第二状态。 脉冲包括在第一时间段内从第一电压到第二电压的第一斜坡,在第二时间段内从第二电压到第三电压的第二斜坡,以及从第三电压到第四电压的第三斜坡 第三个时期。 第二斜坡和第三斜坡与第一坡道具有相反的斜坡。 第一时间段和第二时间段的总和小于第三时间段。
    • 7. 发明授权
    • Techniques for providing a direct injection semiconductor memory device
    • 提供直接注入半导体存储器件的技术
    • US08315099B2
    • 2012-11-20
    • US12844477
    • 2010-07-27
    • Michael A. Van BuskirkBetina HoldWayne Ellis
    • Michael A. Van BuskirkBetina HoldWayne Ellis
    • G11C16/04
    • G11C5/02G11C5/06G11C7/00G11C11/402G11C16/26H01L27/1023H01L27/10802H01L29/73H01L29/7841
    • Techniques for providing a direct injection semiconductor memory device are disclosed. In one particular exemplary embodiment, the techniques may be realized as a direct injection semiconductor memory device including a plurality of memory cells arranged in an array of rows and columns. At least one of the plurality of memory cells may include a first region coupled to a respective bit line of the array and a second region coupled to a respective source line of the array. At least one of the plurality of memory cells may also include a body region spaced apart from and capacitively coupled to a respective word line of the array, wherein the body region may be electrically floating and disposed between the first region and the second region. At least one of the plurality of memory cells may further include a third region coupled to a respective carrier injection line of the array and wherein the respective carrier injection line may be one of a plurality of carrier injection lines in the array that are coupled to each other.
    • 公开了提供直接注入半导体存储器件的技术。 在一个特定的示例性实施例中,这些技术可以被实现为包括布置成行和列阵列的多个存储单元的直接注入半导体存储器件。 多个存储器单元中的至少一个可以包括耦合到阵列的相应位线的第一区域和耦合到阵列的相应源极线的第二区域。 多个存储器单元中的至少一个还可以包括与阵列的相应字线间隔开并且电容耦合到阵列的相应字线的主体区域,其中主体区域可以是电浮置的并且设置在第一区域和第二区域之间。 多个存储器单元中的至少一个可以进一步包括耦合到阵列的相应载流子注入线的第三区域,并且其中相应的载流子注入管线可以是阵列中耦合到每个的多个载流子注入管线之一 其他。
    • 8. 发明申请
    • TECHNIQUES FOR PROVIDING A DIRECT INJECTION SEMICONDUCTOR MEMORY DEVICE
    • 提供直接注入半导体存储器件的技术
    • US20110019482A1
    • 2011-01-27
    • US12844477
    • 2010-07-27
    • Michael A. Van BuskirkBetina HoldWayne Ellis
    • Michael A. Van BuskirkBetina HoldWayne Ellis
    • G11C16/04
    • G11C5/02G11C5/06G11C7/00G11C11/402G11C16/26H01L27/1023H01L27/10802H01L29/73H01L29/7841
    • Techniques for providing a direct injection semiconductor memory device are disclosed. In one particular exemplary embodiment, the techniques may be realized as a direct injection semiconductor memory device including a plurality of memory cells arranged in an array of rows and columns. At least one of the plurality of memory cells may include a first region coupled to a respective bit line of the array and a second region coupled to a respective source line of the array. At least one of the plurality of memory cells may also include a body region spaced apart from and capacitively coupled to a respective word line of the array, wherein the body region may be electrically floating and disposed between the first region and the second region. At least one of the plurality of memory cells may further include a third region coupled to a respective carrier injection line of the array and wherein the respective carrier injection line may be one of a plurality of carrier injection lines in the array that are coupled to each other.
    • 公开了提供直接注入半导体存储器件的技术。 在一个特定的示例性实施例中,这些技术可以被实现为包括布置成行和列阵列的多个存储单元的直接注入半导体存储器件。 多个存储器单元中的至少一个可以包括耦合到阵列的相应位线的第一区域和耦合到阵列的相应源极线的第二区域。 多个存储器单元中的至少一个还可以包括与阵列的相应字线间隔开并且电容耦合到阵列的相应字线的主体区域,其中主体区域可以是电浮置的并且设置在第一区域和第二区域之间。 多个存储器单元中的至少一个可以进一步包括耦合到阵列的相应载流子注入线的第三区域,并且其中相应的载流子注入管线可以是阵列中耦合到每个的多个载流子注入管线之一 其他。
    • 9. 发明授权
    • Adaptive detection of threshold levels in memory
    • 内存阈值水平的自适应检测
    • US07672161B2
    • 2010-03-02
    • US11742371
    • 2007-04-30
    • Ping HouEugen GershonMichael A. Van Buskirk
    • Ping HouEugen GershonMichael A. Van Buskirk
    • G11C11/03
    • G11C11/5642
    • Systems, methods, and/or devices that facilitate accessing data from memory are presented. An adaptive detection component can be employed to reduce or minimize detection error and distinguish information stored in memory cells during read operations. A decoder component can include the adaptive detection component, which can employ an adaptive Linde-Buzo-Gray (LBG) algorithm. The decoder component can receive information associated with a current level from a memory location during a read operation, and can analyze and process such information. The adaptive detection component can receive the processed information and, along with other information, can process such information using the iterative LBG algorithm until reconstruction levels and corresponding threshold levels are determined. Such reconstruction levels and/or threshold levels can be compared to the value associated with the information read from the memory location to determine the data value of the data in the memory location.
    • 介绍了便于从存储器访问数据的系统,方法和/或设备。 可以采用自适应检测部件来减少或最小化检测误差,并且在读取操作期间区分存储在存储器单元中的信息。 解码器组件可以包括自适应检测组件,其可以采用自适应林德 - 布佐灰色(LBG)算法。 解码器组件可以在读取操作期间从存储器位置接收与当前级别相关联的信息,并且可以分析和处理这样的信息。 自适应检测组件可以接收经处理的信息,并且与其他信息一起可以使用迭代LBG算法来处理这样的信息,直到确定重建级别和对应的阈值级别为止。 可以将这样的重建级别和/或阈值级别与与从存储器位置读取的信息相关联的值进行比较,以确定存储器位置中的数据的数据值。