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    • 1. 发明授权
    • Techniques for providing a direct injection semiconductor memory device
    • 提供直接注入半导体存储器件的技术
    • US08315099B2
    • 2012-11-20
    • US12844477
    • 2010-07-27
    • Michael A. Van BuskirkBetina HoldWayne Ellis
    • Michael A. Van BuskirkBetina HoldWayne Ellis
    • G11C16/04
    • G11C5/02G11C5/06G11C7/00G11C11/402G11C16/26H01L27/1023H01L27/10802H01L29/73H01L29/7841
    • Techniques for providing a direct injection semiconductor memory device are disclosed. In one particular exemplary embodiment, the techniques may be realized as a direct injection semiconductor memory device including a plurality of memory cells arranged in an array of rows and columns. At least one of the plurality of memory cells may include a first region coupled to a respective bit line of the array and a second region coupled to a respective source line of the array. At least one of the plurality of memory cells may also include a body region spaced apart from and capacitively coupled to a respective word line of the array, wherein the body region may be electrically floating and disposed between the first region and the second region. At least one of the plurality of memory cells may further include a third region coupled to a respective carrier injection line of the array and wherein the respective carrier injection line may be one of a plurality of carrier injection lines in the array that are coupled to each other.
    • 公开了提供直接注入半导体存储器件的技术。 在一个特定的示例性实施例中,这些技术可以被实现为包括布置成行和列阵列的多个存储单元的直接注入半导体存储器件。 多个存储器单元中的至少一个可以包括耦合到阵列的相应位线的第一区域和耦合到阵列的相应源极线的第二区域。 多个存储器单元中的至少一个还可以包括与阵列的相应字线间隔开并且电容耦合到阵列的相应字线的主体区域,其中主体区域可以是电浮置的并且设置在第一区域和第二区域之间。 多个存储器单元中的至少一个可以进一步包括耦合到阵列的相应载流子注入线的第三区域,并且其中相应的载流子注入管线可以是阵列中耦合到每个的多个载流子注入管线之一 其他。
    • 2. 发明申请
    • TECHNIQUES FOR PROVIDING A DIRECT INJECTION SEMICONDUCTOR MEMORY DEVICE
    • 提供直接注入半导体存储器件的技术
    • US20110019482A1
    • 2011-01-27
    • US12844477
    • 2010-07-27
    • Michael A. Van BuskirkBetina HoldWayne Ellis
    • Michael A. Van BuskirkBetina HoldWayne Ellis
    • G11C16/04
    • G11C5/02G11C5/06G11C7/00G11C11/402G11C16/26H01L27/1023H01L27/10802H01L29/73H01L29/7841
    • Techniques for providing a direct injection semiconductor memory device are disclosed. In one particular exemplary embodiment, the techniques may be realized as a direct injection semiconductor memory device including a plurality of memory cells arranged in an array of rows and columns. At least one of the plurality of memory cells may include a first region coupled to a respective bit line of the array and a second region coupled to a respective source line of the array. At least one of the plurality of memory cells may also include a body region spaced apart from and capacitively coupled to a respective word line of the array, wherein the body region may be electrically floating and disposed between the first region and the second region. At least one of the plurality of memory cells may further include a third region coupled to a respective carrier injection line of the array and wherein the respective carrier injection line may be one of a plurality of carrier injection lines in the array that are coupled to each other.
    • 公开了提供直接注入半导体存储器件的技术。 在一个特定的示例性实施例中,这些技术可以被实现为包括布置成行和列阵列的多个存储单元的直接注入半导体存储器件。 多个存储器单元中的至少一个可以包括耦合到阵列的相应位线的第一区域和耦合到阵列的相应源极线的第二区域。 多个存储器单元中的至少一个还可以包括与阵列的相应字线间隔开并且电容耦合到阵列的相应字线的主体区域,其中主体区域可以是电浮置的并且设置在第一区域和第二区域之间。 多个存储器单元中的至少一个可以进一步包括耦合到阵列的相应载流子注入线的第三区域,并且其中相应的载流子注入管线可以是阵列中耦合到每个的多个载流子注入管线之一 其他。
    • 4. 发明授权
    • Performance characteristic monitoring circuit and method
    • 性能特征监测电路及方法
    • US09404966B2
    • 2016-08-02
    • US13548238
    • 2012-07-13
    • Sandeep DwivediBetina Hold
    • Sandeep DwivediBetina Hold
    • G01R31/02G01R31/317G11C29/02G11C7/08G11C7/12G11C7/22G11C29/04
    • G01R31/31718G01R31/31725G11C7/08G11C7/12G11C7/22G11C29/023G11C29/028G11C2029/0409
    • A performance characteristic monitoring circuitry includes a first delay circuitry providing a first delay path, where transmission of a data value over that first delay path incurs a first delay that varies in dependence on the performance characteristic. Reference delay circuitry is also included to provide a reference delay path, where transmission of the data value over the reference delay path incurs a reference delay. The reference delay circuitry includes components configured to provide a capacitive loading on the reference delay path in order to produce a self-compensating effect on the reference delay that causes the reference delay to be less sensitive than the first delay to variation in the performance characteristic. Comparison circuitry is then used to generate the output signal of the monitoring circuitry in dependence on a comparison of the first delay and the reference delay.
    • 性能特征监测电路包括提供第一延迟路径的第一延迟电路,其中在该第一延迟路径上的数据值的传输导致根据性能特性而变化的第一延迟。 还包括参考延迟电路以提供参考延迟路径,其中数据值在参考延迟路径上的传输引起参考延迟。 参考延迟电路包括被配置为在参考延迟路径上提供电容负载的组件,以便产生对参考延迟的自补偿作用,该参考延迟使得参考延迟比对性能特性变化的第一延迟更不敏感。 然后根据第一延迟和参考延迟的比较,比较电路用于产生监控电路的输出信号。
    • 5. 发明授权
    • Timing control for sense amplifiers in a memory circuit
    • 存储器电路中读出放大器的时序控制
    • US07339842B1
    • 2008-03-04
    • US11504766
    • 2006-08-16
    • Betina Hold
    • Betina Hold
    • G11C7/00
    • G11C7/08G11C7/14
    • An integrated circuit 18 includes a memory 20 having timing circuitry formed of a global controller 26 and a self-timing path for triggering the sense amplifiers 28 to read bit lines 30 within the array of bit cells 24. The self timing path includes timing cells 34 embedded within the array 24 and modelling behavior of the bit cells 32 in changing the bit line signals. The self timing path uses active low signalling throughout as this can be implemented with predominantly n-type transistors matching the n-type transistors which dominate within the array 24.
    • 集成电路18包括存储器20,其具有由全局控制器26形成的定时电路和用于触发读出放大器28读取位单元24阵列内的位线30的自定时路径。 自定时路径包括嵌入在阵列24内的定时单元34和位单元32在改变位线信号时的建模行为。 自定时通路全部使用有源低信号,因为这可以主要用与在阵列24内占优势的n型晶体管相匹配的n型晶体管来实现。
    • 6. 发明申请
    • TIMING CONTROL FOR SENSE AMPLIFIERS IN A MEMORY CIRCUIT
    • 用于存储器电路中的感测放大器的时序控制
    • US20080043555A1
    • 2008-02-21
    • US11504766
    • 2006-08-16
    • Betina Hold
    • Betina Hold
    • G11C7/00G11C7/02
    • G11C7/08G11C7/14
    • An integrated circuit 18 includes a memory 20 having timing circuitry formed of a global controller 26 and a self-timing path for triggering the sense amplifiers 28 to read bit lines 30 within the array of bit cells 24. The self timing path includes timing cells 34 embedded within the array 24 and modelling behaviour of the bit cells 32 in changing the bit line signals. The self timing path uses active low signalling throughout as this can be implemented with predominantly n-type transistors matching the n-type transistors which dominate within the array 24.
    • 集成电路18包括存储器20,其具有由全局控制器26形成的定时电路和用于触发读出放大器28读取位单元24阵列内的位线30的自定时路径。自定时路径包括定时单元34 嵌入在阵列24内,并且改变位线信号时的位单元32的建模行为。 自定时通路全部使用有源低信号,因为这可以主要用与在阵列24内占优势的n型晶体管相匹配的n型晶体管来实现。
    • 8. 发明授权
    • Techniques for reading from and/or writing to a semiconductor memory device
    • 从半导体存储器件读取和/或写入的技术
    • US08369177B2
    • 2013-02-05
    • US12718310
    • 2010-03-05
    • Betina HoldRobert Murray
    • Betina HoldRobert Murray
    • G11C8/00
    • G11C7/00G11C7/10
    • Techniques for reading from and/or writing to a semiconductor memory device are disclosed. In one particular exemplary embodiment, the techniques may be realized as an apparatus including a first memory cell array having a first plurality of memory cells arranged in a matrix of rows and columns and a second memory cell array having a second plurality of memory cells arranged in a matrix of row and columns. The apparatus may also include a data sense amplifier latch circuitry having a first input node and a second input node. The apparatus may further include a first bit line input circuitry configured to couple the first memory cell array to the first input node of the data sense amplifier latch circuitry and a second bit line input circuitry configured to couple the second memory cell array to the second input node of the data sense amplifier latch circuitry.
    • 公开了从半导体存储器件读取和/或写入半导体存储器件的技术。 在一个特定示例性实施例中,这些技术可以被实现为包括具有以行和列的矩阵排列的第一多个存储器单元的第一存储器单元阵列的装置,以及具有布置在其中的第二多个存储单元的第二存储单元阵列 行和列的矩阵。 该装置还可以包括具有第一输入节点和第二输入节点的数据读出放大器锁存电路。 该装置还可以包括第一位线输入电路,其被配置为将第一存储单元阵列耦合到数据读出放大器锁存电路的第一输入节点;以及第二位线输入电路,其被配置为将第二存储单元阵列耦合到第二输入 数据读出放大器锁存电路的节点。
    • 9. 发明授权
    • Techniques for providing a source line plane
    • 提供源线平面的技术
    • US08319294B2
    • 2012-11-27
    • US12695964
    • 2010-01-28
    • Betina Hold
    • Betina Hold
    • H01L27/088
    • H01L29/7841G11C11/404G11C2211/4016H01L27/108H01L27/10802H01L27/10882
    • Techniques for providing a source line plane are disclosed. In one particular exemplary embodiment, the techniques may be realized as an apparatus for providing a source line plane. The apparatus may comprise a source line plane coupled to at least one constant voltage source. The apparatus may also comprise a plurality of memory cells arranged in an array of rows and columns, each memory cell including one or more memory transistors. Each of the one or more memory transistors may comprise a first region coupled to the source line plane, a second region coupled to a bit line, a body region disposed between the first region and the second region, wherein the body region may be electrically floating, and a gate coupled to a word line and spaced apart from, and capacitively coupled to, the body region.
    • 公开了提供源线平面的技术。 在一个特定的示例性实施例中,这些技术可以被实现为用于提供源线平面的装置。 该装置可以包括耦合到至少一个恒定电压源的源极线平面。 该装置还可以包括布置成行和列阵列的多个存储单元,每个存储单元包括一个或多个存储晶体管。 一个或多个存储器晶体管中的每一个可以包括耦合到源极线平面的第一区域,耦合到位线的第二区域,设置在第一区域和第二区域之间的主体区域,其中主体区域可以是电浮置的 以及耦合到字线并与身体区域间隔开并且电容耦合到身体区域的栅极。