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    • 21. 发明授权
    • Mask holding device, and an exposure apparatus and a device
manufacturing method using the device
    • 掩模保持装置,以及使用该装置的曝光装置和装置制造方法
    • US5608773A
    • 1997-03-04
    • US348837
    • 1994-11-29
    • Nobusige KorenagaKouichi HaraShinichi Hara
    • Nobusige KorenagaKouichi HaraShinichi Hara
    • G03F7/20G03B11/00
    • G03F7/707
    • A mask for exposure is supported at three positions on a holding surface of a mask chuck of an X-ray exposure apparatus by means of kinematic mounting. Magnetic units, each comprising an electromagnet, and magnetic rings are provided around supporting points at the three,positions on the mask chuck and on the mask frame, respectively. It is thereby possible to generate a tensile force to magnetically attract the mask frame in the direction of the normal of the holding surface of the mask chuck, and to attract and hold the mask on the mask chuck. Thus, the mask can be chucked on the X-ray exposure apparatus in substantially the same state as that of a mechanical clamp on an electron beam (EB) scanning apparatus while the mask is manufactured, without using a mechanical clamping mechanism.
    • 用于曝光的掩模通过运动学安装在X射线曝光设备的掩模卡盘的保持表面上的三个位置处被支撑。 分别在掩模卡盘和掩模框架上的三个位置处的支撑点周围设置各自包括电磁体和磁环的磁性单元。 由此,可以产生拉伸力,以沿着掩模卡盘的保持面的法线方向磁吸引掩模框架,并且将掩模吸引并保持在掩模卡盘上。 因此,在不使用机械夹持机构的情况下,可以在制造掩模的同时,以与电子束(EB)扫描装置上的机械夹具基本相同的状态将掩模夹持在X射线曝光装置上。
    • 26. 发明授权
    • Tracking-type laser interferometer
    • 跟踪式激光干涉仪
    • US08199330B2
    • 2012-06-12
    • US12707255
    • 2010-02-17
    • Shinichi Hara
    • Shinichi Hara
    • G01B11/02G01C3/08
    • G01S7/4811G01B11/002G01S17/66
    • A tracking-type laser interferometer in which a pattern emission control unit controls a changing mechanism such that light is emitted along a predetermined pattern when judged by a first judgment unit that at least one of received-light amounts at first and second light reception units is not greater than a first threshold value. A tracking control unit causes the changing mechanism to keep track of a retro reflector when judged by a second judgment unit that both of the received-light amounts at the first and second light reception units are greater than second threshold values during a time period in which the pattern emission control unit controls the changing mechanism for the emission of light along the pattern. The interferometer emits light along the pattern to search for the retro reflector upon losing sight thereof. Upon detection, the interferometer can keep track of the reflector again and resume measurement.
    • 一种跟踪型激光干涉仪,其中图案发射控制单元控制改变机构,使得当由第一判断单元判断时沿着预定图案发射光,第一和第二光接收单元的接收光量中的至少一个为 不大于第一阈值。 跟踪控制单元使第一和第二光接收单元的接收光量在第二判断单元判定时大于第二阈值时,使变化机构跟踪回光反射器,在此期间, 图案发射控制单元控制沿着图案发光的改变机构。 干涉仪沿着图案发光,以便在看不见时搜索复古反射器。 检测后,干涉仪可以重新跟踪反射镜并恢复测量。
    • 29. 发明授权
    • Apparatus and method for removing contaminant on original, method of manufacturing device, and original
    • 用于去除原始污染物的装置和方法,制造装置的方法和原件
    • US07319507B2
    • 2008-01-15
    • US11250072
    • 2005-10-12
    • Masami YonekawaShinichi HaraRyo Edo
    • Masami YonekawaShinichi HaraRyo Edo
    • G03B27/42G03B27/52
    • G03F7/70925
    • At least one exemplary embodiment is directed to an apparatus which includes an original stage, to hold an original, which moves in a scan direction, an illumination optical system configured to illuminate the original held by the original stage with exposure light, a substrate stage configured to hold a substrate and to move in a scan direction, a projection optical system configured to project a pattern of the original onto the substrate with the exposure light, and an irradiation unit configured to irradiate the original held by the original stage. Irradiation by the irradiation unit and movement of the original stage in the scan direction are carried out substantially in parallel with each other so as to remove a contaminant on the original.
    • 至少一个示例性实施例涉及一种装置,其包括原始台,用于保持沿扫描方向移动的原件,配置成用曝光灯照亮由原始台保持的原件的照明光学系统,衬底台配置 保持基板并沿扫描方向移动;投影光学系统,被配置为利用曝光光将原稿的图案投影到基板上;以及照射单元,被配置为照射由原始台保持的原稿。 通过照射单元的照射和原始台沿扫描方向的移动基本上彼此平行地进行,以便去除原件上的污染物。