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1. 发明申请

WO2004053920A8 HUMIDIFIED IMAGING WITH AN ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE 审中-公开
标题翻译：带环境扫描电子显微镜的加湿成像
公开(公告)号：WO2004053920A8
公开(公告)日：2004-08-26
申请号：PCT/CA0301903
申请日：2003-12-09
申请人： BALLARD POWER SYSTEMS , ORFINO FRANCESCO P , ZIMMERMANN JOERG , ERICKSON LYNN C
发明人： ORFINO FRANCESCO P , ZIMMERMANN JOERG , ERICKSON LYNN C
IPC分类号： G01N23/225 , G01N33/00 , G01Q30/02 , G01Q30/10 , G01Q30/12 , G01Q30/14 , G01Q30/18 , G21K7/00 , H01J37/00
CPC分类号： G01N33/0011 , G01N23/2251 , H01J2237/2003 , H01J2237/2605
摘要： A method and appararatus are described for imaging wet samples with an Environmental Scanning Electron Microscope (ESEM). In particular, a carrier gas is humidified such that the water vapor in the carrier gas in the sample chamber of the ESEM has a partial pressure equal to the saturated vapor pressure of water. Thus, the sample can be imaged without observing any evaporation or condensation thereon. Both the carrier gas and the water vapor may act as the imaging gas within the ESEM. The apparatus is an imaging gas delivery system for the ESEM wherein the carrier gas may be appropriately humidified.
摘要翻译：描述了用环境扫描电子显微镜（ESEM）成像湿样品的方法和装置。特别地，载气被加湿，使得ESEM的样品室中的载气中的水蒸气的分压等于水的饱和蒸汽压。因此，样品可以成像而不观察到其上的任何蒸发或凝结。载气和水蒸气都可以作为ESEM内的成像气体。该设备是用于ESEM的成像气体输送系统，其中载气可以被适当地加湿。

2. 发明申请

WO02021113A1 THERMAL LENS MICROSCOPE DEVICE 审中-公开
标题翻译：热透镜显微镜装置
公开(公告)号：WO02021113A1
公开(公告)日：2002-03-14
申请号：PCT/JP2001/007794
申请日：2001-09-07
IPC分类号： G01N25/16 , G01N21/41 , G01N21/59 , G01N37/00 , G01Q30/10 , G02B6/12 , G02B6/13 , G02B21/00 , G02B21/02
CPC分类号： G02B21/0008 , G02B6/13 , G02B21/02 , G02B2006/12102
摘要： A small and portable microscope for ultramicroanalysis having an excellent spatial resolution and a fixed position analyzing adility in which a exciting light source (3), a detecting light source (4) and at least a part of a thermal lens microscope optical system are arranged integrally in a device body comprising an analyzing cell (1) and substrates (2A), (2B) supporting the analyzing cell (1).
摘要翻译：一种用于超微量分析的小型便携式显微镜，其具有优异的空间分辨率和固定位置分析能力，其中激发光源（3），检测光源（4）和至少一部分热透镜显微镜光学系统一体地布置在包括分析单元（1）和支撑分析单元（1）的基板（2A），（2B）的装置主体中。

3. 发明申请

WO2009062631A3 METHOD FOR EXAMINING A SAMPLE BY SCANNING TUNNELING MICROSCOPY USING A CONTRAST AGENT 审中-公开
标题翻译：程序对样品BY STM有造影剂的应用
公开(公告)号：WO2009062631A3
公开(公告)日：2009-07-23
申请号：PCT/EP2008009391
申请日：2008-11-07
申请人： FORSCHUNGSZENTRUM JUELICH GMBH , TEMIROV RUSLAN , SUBACH SERGEY , TAUTZ FRANK STEFAN
发明人： TEMIROV RUSLAN , SUBACH SERGEY , TAUTZ FRANK STEFAN
IPC分类号： G01Q30/10 , G01Q30/12 , G01Q60/10
CPC分类号： G01Q60/10 , G01Q30/10 , G01Q30/12
摘要： The invention relates to a method for examining a sample using a scanning tunneling microscope, characterised in that in at least one location on the tip of the scanning tunneling microscope and/or on the sample, which is part of the tunneling contact on taking an image, a contrast agent is applied before or during the image taking, whilst the temperature at said location is adjusted to be at or below the condensation temperature of the contrast agent. A corresponding scanning tunneling microscope is also disclosed.
摘要翻译：本发明涉及用于分析在扫描隧道显微镜的样品，其特征在于，至少一个位置上的扫描隧道显微镜和/或它是图像接收隧道结的一部分在所述样品的末端的方法，将造影剂之前或图像记录过程中引入而温度低于或等于所述造影剂的冷凝温度被设定在该位置。扫描隧道显微镜此被公开。

4. 发明申请

WO2004053920A3 HUMIDIFIED IMAGING WITH AN ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE 审中-公开
标题翻译：用环境扫描电子显微镜进行均匀成像
公开(公告)号：WO2004053920A3
公开(公告)日：2008-01-03
申请号：PCT/CA0301903
申请日：2003-12-09
申请人： BALLARD POWER SYSTEMS , ORFINO FRANCESCO P , ZIMMERMANN JOERG , ERICKSON LYNN C
发明人： ORFINO FRANCESCO P , ZIMMERMANN JOERG , ERICKSON LYNN C
IPC分类号： H01J37/20 , G01N23/225 , G01N33/00 , G01Q30/02 , G01Q30/10 , G01Q30/12 , G01Q30/14 , G01Q30/18 , G21K7/00
CPC分类号： G01N33/0011 , G01N23/2251 , H01J2237/2003 , H01J2237/2605
摘要： A method and appararatus are described for imaging wet samples with an Environmental Scanning Electron Microscope (ESEM). In particular, a carrier gas is humidified such that the water vapor in the carrier gas in the sample chamber of the ESEM has a partial pressure equal to the saturated vapor pressure of water. Thus, the sample can be imaged without observing any evaporation or condensation thereon. Both the carrier gas and the water vapor may act as the imaging gas within the ESEM. The apparatus is an imaging gas delivery system for the ESEM wherein the carrier gas may be appropriately humidified.
摘要翻译：描述了用环境扫描电子显微镜（ESEM）对湿样品成像的方法和装置。特别地，载气被加湿，使得ESEM的样品室中的载气中的水蒸气具有等于水的饱和蒸气压的分压。因此，可以在不观察其上的任何蒸发或冷凝的情况下成像样品。载气和水蒸气都可以作为ESEM内的成像气体。该装置是用于ESEM的成像气体输送系统，其中载气可以被适当地加湿。

5. 发明申请

WO02057014A1 METHOD AND DEVICE FOR MANIPULATING SMALL QUANTITIES OF LIQUID 审中-公开
标题翻译：方法及装置液体操纵少量
公开(公告)号：WO02057014A1
公开(公告)日：2002-07-25
申请号：PCT/EP2001/014598
申请日：2001-12-12
IPC分类号： G01N35/00 , B01J19/00 , B01L3/00 , B81B1/00 , G01N35/02 , G01N35/10 , G01Q30/10 , G01Q80/00
CPC分类号： B01L3/50273 , B01L2300/0816 , B01L2300/0819 , B01L2300/089 , B01L2400/0415 , B01L2400/0427 , B01L2400/0433 , B01L2400/0439 , B01L2400/0442 , B01L2400/0496 , Y10T436/2575
摘要： The invention relates to a device for manipulating small quantities of liquid on the surface of a solid body, said surface having at least one defined reservoir zone with different wetting properties from the surrounding area, the material of said zone being chosen in such a way that the liquid to be manipulated is preferably contained in the reservoir zone. Said reservoir zone has at least one narrowing which cannot be breached by the liquid as a result of its surface tension under normal conditions. The device is provided with at least one unit for generating an external force, substantially acting in the direction of the narrowing(s). The invention also relates to a corresponding method for manipulating small quantities of liquid on the surface of a solid body and to a method for producing a defined quantity of liquid using said inventive method.
摘要翻译：本发明bettrift的装置，用于与至少具有比周围的环境，其材料以这样的方式被选择，使得操纵液体优选驻留在位置区域中，位置区域包括至少一个收缩其它润湿性质的限定的位置区域上的固体表面操纵少量液体，液体由于在正常状态下它的表面张力的不能克服，以及用于在其上设置至少一个收缩的方向基本上产生外部力的至少一个装置。本发明还涉及一种用于操纵少量液体到固体身体表面的相应的方法以及使用本发明的方法产生在限定的液体量的方法。

6. 发明申请

WO02025375A2 PINHOLE DEFECT REPAIR BY RESIST FLOW 审中-公开
标题翻译：用微流量法以微孔形式进行故障修复
公开(公告)号：WO02025375A2
公开(公告)日：2002-03-28
申请号：PCT/US2001/029565
申请日：2001-09-21
IPC分类号： G01Q30/10 , G01Q60/00 , G01Q70/00 , G01Q80/00 , G01Q90/00 , G03F7/40 , H01L21/027 , H01L21/66 , G03F7/00
CPC分类号： B82Y15/00 , G03F7/40
摘要： According to one aspect of the present invention, pinhole defects in resist coatings are repaired by heating the resist briefly to induce the resist to flow and fill pinholes. The resist is brought to a temperature at or above that at which the resist flows for long enough to permit the resist to flow and fill pinhole defects, but not so long as to corrupt the resist pattern. The original resist pattern may be biased to allow for some flow during the pinhole repair process. The entire patterned resist may be heated at once, or it may be heated one portion at a time. The application of heat may optionally be limited to locations where pinhole defects are found. By means of the invention, very thin patterned resist coatings free from pinhole defects may be obtained.
摘要翻译：本发明使得可以修复出现在抗蚀剂涂层上的微孔形式的缺陷。要做到这一点，加热器会短暂加热以引起抗蚀剂流动并填充微孔。使抗蚀剂达到等于或大于流动温度的温度足够的时间以使抗蚀剂流动并填充微孔，但不足以改变抗蚀剂图案。最初的抗蚀剂图案可以被偏置以在微孔修复操作期间允许流动。整个图案化的抗蚀剂可以立即或逐渐加热。而且，热量的施加可能仅限于微孔出现的位置。本发明提供了非常精细的抗蚀剂涂层而没有不希望的微孔。

7. 发明申请

WO2021226354A1 DAMPING BASE FOR MODULAR SCANNING PROBE MICROSCOPE HEAD 审中-公开
公开(公告)号：WO2021226354A1
公开(公告)日：2021-11-11
申请号：PCT/US2021/031120
申请日：2021-05-06
申请人： RUTGERS, THE STATE UNIVERSITY OF NEW JERSEY
发明人： COE, Angela , LI, Guohong , ANDREI, Eva Y.
IPC分类号： G01Q30/10 , G01Q30/16 , G01Q30/18
摘要： An apparatus, including a scanning probe microscope base (112) that includes a frame (130) configured to be secured to an end of an insert in a cryostat; a top (134) configured to be connected to a base of a scanning probe microscope head that is configured to be disposed inside the insert; and a damping system disposed between the frame and the top and comprising a bellows (150) that seals the end of the insert. This sealing separates an ultra-high vacuum (UHV) environment in the insert from a high vacuum (HV) environment surrounding the end of the insert and also positions an upper surface of the top in the UHV environment.

8. 发明申请

WO2018082811A1 FELDEFFEKTTRANSISTOR IN EINER OPEN-GATE-FET-SCHALTUNG 审中-公开
标题翻译：场效应晶体管在OPEN-GATE-FET电路中的应用
公开(公告)号：WO2018082811A1
公开(公告)日：2018-05-11
申请号：PCT/EP2017/001274
申请日：2017-11-02
申请人： UNIVERSITÄT DUISBURG-ESSEN
发明人： MÖLLER, Rolf , NIENHAUS, Hermann
IPC分类号： H03F1/56 , G01Q30/10
CPC分类号： H03F1/56 , H03F2200/261
摘要： Bei der Verwendung eines Feldeffekttransistors in einer Open-Gate-FET-Schaltung soll bei Messungen von kleinsten Signalen die Messempfindlichkeit gesteigert werden. Dies wird dadurch erreicht, dass der Feldeffekttransistor derart gekühlt wird, dass die Leckströme innerhalb des Transistors weniger als 10 -15 A betragen.
摘要翻译：当在开路FET电路中使用场效应晶体管时，为了测量最小的信号，应该增加测量灵敏度。这是通过选择场效应晶体管以使晶体管内的泄漏电流小于10 -15 A来实现的。

9. 发明申请

WO2011116389A3 LOW DRIFT SCANNING PROBE MICROSCOPE 审中-公开
标题翻译：低速扫描探针显微镜
公开(公告)号：WO2011116389A3
公开(公告)日：2012-03-15
申请号：PCT/US2011029232
申请日：2011-03-21
申请人： BRUKER NANO INC , RUITER ANTHONIUS G , MITTEL HENRY
发明人： RUITER ANTHONIUS G , MITTEL HENRY
IPC分类号： G01Q60/24 , G01Q30/10
CPC分类号： G01Q30/10 , B82Y35/00 , G01Q70/04
摘要： A scanning probe microscope, such as an atomic force microscope, include a z-stage and a bridge structure comprised substantially free of Invar. A scanner containing a probe is mounted to the z-stage, which is movable in the z-axis to raise and lower the probe. A drift compensation system is provided to reduce thermal drift of the z-stage and the bridge. The drift compensation system includes heating elements thermally coupled to the z-stage and the bridge, ambient temperature sensors, and a controller to actively control the heating elements to maintain the bridge and the z-stage at an elevated temperature.
摘要翻译：诸如原子力显微镜的扫描探针显微镜包括基本上不含Invar的z级和桥式结构。包含探头的扫描器安装在z阶段，z阶可在z轴上移动以升高和降低探针。提供了一种漂移补偿系统，以减少z级和桥梁的热漂移。漂移补偿系统包括热耦合到z级的加热元件和桥接器，环境温度传感器和控制器，以主动地控制加热元件以将桥接器和z级保持在升高的温度。

10. 发明申请

WO03019238A3 MULTIPLE PLATE TIP OR SAMPLE SCANNING RECONFIGURABLE SCANNED PROBE MICROSCOPE WITH TRANSPARENT INTERFACING OF FAR-FIELD OPTICAL MICROSCOPES 审中-公开
标题翻译：多平板提示或样品扫描可重复扫描的扫描显微镜，具有透明的光场显微镜接口
公开(公告)号：WO03019238A3
公开(公告)日：2003-10-09
申请号：PCT/US0225947
申请日：2002-08-27
申请人： NANONICS IMAGING LTD , AARON LEWIS , KOMISSAR ANATOLY , TAHA HISHAM , RATNER ALEXANDER
发明人： LEWIS AARON , KOMISSAR ANATOLY , TAHA HISHAM , RATNER ALEXANDER
IPC分类号： G01Q10/04 , G01Q20/00 , G01Q30/02 , G01Q30/10 , G01Q60/38 , G01Q70/02 , G01B5/28 , G01B7/34
CPC分类号： G01Q70/02 , G01Q20/02 , G01Q30/025 , G01Q30/10 , G01Q60/38
摘要： The invention is directed to a scanned probe microscope including one plate (12.1) allowing for tip scanning and second plate (12.2) other allowing for sample scanning, with the optical axis of the scanned probe microscope being free to permit incorporation into standard optical microscopes.
摘要翻译：本发明涉及一种扫描探针显微镜，其包括允许尖端扫描的一个板（12.1）和其他允许样品扫描的第二板（12.2），扫描的探针显微镜的光轴可自由地允许并入标准光学显微镜。

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