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    • 1. 发明申请
    • STRAINED GETTERING LAYERS FOR SEMICONDUCTOR PROCESSES
    • 用于半导体工艺的应变取向层
    • WO2006039684A1
    • 2006-04-13
    • PCT/US2005/035595
    • 2005-10-03
    • MASSACHUSETTS INSTITUTE OF TECHNOLOGYPITERA, Arthur, J.FITZGERALD, Eugene, A.
    • PITERA, Arthur, J.FITZGERALD, Eugene, A.
    • H01L21/762
    • H01L21/26506C30B25/20C30B33/00H01L21/3221H01L21/3226H01L21/76254
    • A method and structure for forming semiconductor structures using tensilely strained gettering layers. The method includes forming a donor wafer comprising a tensilely strained gettering layer disposed over a substrate, and at least one material layer disposed over the tensilely strained gettering layer. Additionally, the donor wafer may possess a particle-confining region proximate the tensilely strained layer. The method can also include introducing particles into the donor wafer to a depth below the surface, and accumulating at least some particles within the tensilely strained gettering layer. Next, the method can include initiating a cleaving action so as to separate at least one of the material layers form the substrate. The tensilely strained gettering layer may accumulate particles and/or point defects and reduce the implantation dose and thermal budget required for cleaving.
    • 使用拉伸应变吸气层形成半导体结构的方法和结构。 该方法包括形成供体晶片,其包括设置在基板上的拉伸变应性吸收层,以及设置在拉伸应变吸气层上的至少一个材料层。 另外,施主晶片可以具有靠近拉伸应变层的颗粒约束区域。 该方法还可以包括将颗粒引入供体晶片中至表面下方的深度,并且在拉伸变应的吸气层内积聚至少一些颗粒。 接下来,该方法可以包括引发切割作用,以分离至少一个材料层形成基底。 拉伸应变的吸气层可能积聚颗粒和/或点缺陷,并减少切割所需的注射剂量和热预算。
    • 5. 发明申请
    • INSULATED GATE DEVICES AND METHOD OF MAKING SAME
    • 绝缘闸门装置及其制造方法
    • WO2007067589A2
    • 2007-06-14
    • PCT/US2006/046493
    • 2006-12-05
    • MASSACHUSETTS INSTITUTE OF TECHNOLOGYLEE, Minjoo, LarryFITZGERALD, Eugene, A.
    • LEE, Minjoo, LarryFITZGERALD, Eugene, A.
    • H01L23/28
    • H01L27/0605H01L21/8252H01L29/2003H01L29/432H01L29/513H01L29/517H01L29/66522H01L29/802H01L2924/0002H01L2924/00
    • Structures and devices, and methods of making such structures and devices, including a gate dielectric layer are provided. A semiconductor structure can include a semiconductor channel layer including a nitride-free semiconductor layer and a gate dielectric layer including a group Ill-nitride layer, wherein the gate dielectric layer is disposed over the semiconductor channel layer. A method of making a semiconductor device structure is also provided. The method includes providing a semiconductor channel layer including a nitride-free semiconductor layer and providing a gate dielectric layer including a group Ill-nitride layer, wherein the gate dielectric layer is disposed over the semiconductor channel layer. A metal-insulator-semiconductor field effect transistor (MISFIT) device structure can include a semiconductor channel layer including a nitride- free semiconductor layer and a gate dielectric layer comprising a group Ill-nitride layer, wherein the gate dielectric layer is disposed over the semiconductor channel layer. The MISFIT may include a gate electrode disposed over the gate dielectric. The MISFIT may include a source and drain region separated by the semiconductor channel layer.
    • 提供了包括栅介质层的结构和器件以及制造这种结构和器件的方法。 半导体结构可以包括包括无氮化物半导体层的半导体沟道层和包括III族氮化物层的栅极电介质层,其中栅极电介质层设置在半导体沟道层上。 还提供了制造半导体器件结构的方法。 该方法包括提供包括无氮化物的半导体层的半导体沟道层,并提供包括III族氮化物层的栅介质层,其中栅极电介质层设置在半导体沟道层上。 金属 - 绝缘体 - 半导体场效应晶体管(MISFIT)器件结构可以包括包括无氮化物半导体层的半导体沟道层和包括III族氮化物层的栅极电介质层,其中栅极电介质层设置在半导体 通道层。 MISFIT可以包括设置在栅极电介质上的栅电极。 MISFIT可以包括由半导体沟道层分离的源极和漏极区域。
    • 10. 发明申请
    • DIGITAL METAMORPHIC ALLOYS FOR GRADED BUFFERS
    • 用于分级缓冲器的数字变形合金
    • WO2010098876A2
    • 2010-09-02
    • PCT/US2010/000591
    • 2010-02-26
    • MASSACHUSETTS INSTITUTE OF TECHNOLOGYLEE, Kenneth, E.FITZGERALD, Eugene, A.
    • LEE, Kenneth, E.FITZGERALD, Eugene, A.
    • H01L21/20
    • H01L21/02543H01L21/02395H01L21/02461H01L21/02463H01L21/02507H01L21/0251H01L21/0262Y10T428/2495
    • Digital metamorphic alloy (DMA) buffer structures for transitioning from a bottom crystalline layer to a lattice mismatched top crystalline layer, and methods for manufacturing such layers are described. In some embodiments, a layered crystalline structure includes a first layer of a first crystalline material having a fist in-plane lattice constant and a second layer of a second crystalline material disposed over the first layer and having a second in-plane lattice constant that is lattice mismatched with the first crystalline material. Multiple sets of buffer layers may be disposed between the first layer and the second layer. Each set is a digital metamorphic alloy including a buffer layer of a third crystalline material and a buffer layer of a fourth crystalline material where an effective in-plane lattice constant of each set falls between the first lattice of the first layer and the second lattice constant of the second layer.
    • 描述了用于从底部晶体层向晶格失配顶部晶体层转变的数字变质合金(DMA)缓冲结构,以及用于制造这种层的方法。 在一些实施例中,层状晶体结构包括具有第一面内晶格常数的第一晶体材料的第一层和设置在第一层上且具有第二面内晶格常数的第二晶体材料的第二层, 晶格与第一晶体材料不匹配。 多组缓冲层可以设置在第一层和第二层之间。 每组是包括第三晶体材料的缓冲层和第四晶体材料的缓冲层的数字变质合金,其中每组的有效面内晶格常数落入第一层的第一晶格和第二晶格常数之间 的第二层。