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    • 1. 发明申请
    • INTEGRATED CIRCUIT WITH SENSING TRANSISTOR ARRAY, SENSING APPARATUS AND MEASURING METHOD
    • 带感应晶体管阵列的集成电路,感应装置和测量方法
    • WO2014060916A1
    • 2014-04-24
    • PCT/IB2013/059296
    • 2013-10-11
    • KONINKLIJKE PHILIPS N.V.
    • KLOOTWIJK, Johan HendrikMESCHER, MarleenDE GRAAF, PascalMARCELIS, Bout
    • G01N27/414
    • G01N27/4148G01N27/4141G01N27/4145G01N27/4146H01L29/0673H01L29/1033H01L29/16
    • Integrated circuit (100) sensor array, comprising a semiconductor substrate (110); an insulating layer (120) over said substrate; an first transistor (140a) on said insulating layer, the first transistor comprising an exposed functionalized channel region (146a) in between a source region (142a) and a drain region (144) for sensing an analyte in a medium; a second transistor (140b) on said insulating layer, the second transistor comprising an exposed channel region (146b) in between a source region (142b) and a drain region (144) for sensing a potential of said medium; and a voltage bias generator (150) conductively coupled to the semiconductor substrate for providing said transistors with a bias voltage, said voltage bias generator being responsive to the second transistor. A sensing apparatus comprising such an IC and an analyte measurement method using such an IC are also disclosed.
    • 集成电路(100)传感器阵列,包括半导体衬底(110); 在所述衬底上的绝缘层(120); 在所述绝缘层上的第一晶体管(140a),所述第一晶体管包括用于感测介质中的分析物的源区(142a)和漏区(144)之间的暴露的功能化沟道区(146a) 在所述绝缘层上的第二晶体管(140b),所述第二晶体管包括用于感测所述介质的电位的源极区(142b)和漏极区(144)之间的暴露沟道区(146b) 以及导电耦合到半导体衬底的电压偏置发生器(150),用于向所述晶体管提供偏置电压,所述电压偏置发生器响应于第二晶体管。 还公开了一种包括这种IC的感测装置和使用这种IC的分析物测量方法。
    • 4. 发明申请
    • PHOTON COUNTING X-RAY DETECTOR
    • 光电计数X射线探测器
    • WO2014087290A1
    • 2014-06-12
    • PCT/IB2013/060267
    • 2013-11-20
    • KONINKLIJKE PHILIPS N.V.
    • NELLISSEN, Antonius Johannes MariaVERBAKEL, FrankKLOOTWIJK, Johan HendrikWIECZOREK, Herfried Karl
    • G01T1/24
    • G01T1/241G01T1/18G01T1/24G01T1/247G01T1/366
    • The present invention relates to a photon counting X-ray detector and detection method that effectively suppress polarization even under high flux conditions. The proposed detector comprises a photon counting semiconductor element (10) for generating electron-hole pairs in response to incident X-ray photons,a cathode electrode (11a, 11b; 21a, 21b; 31a, 31b, 31c, 31ac, 31d; 41a, 41b; 51a, 51b) arranged on a first side (10a) of said semiconductor element (10) facing incited X-ray radiation, said cathode electrode comprising two interdigitated cathode elements (11a, 11b; 21a, 21b; 31a, 31b, 31c, 31ac, 31d; 41a, 41b; 1a, 51b), a pixelated anode electrode (12) arranged on a second side (10b) of said semiconductor element (10) opposite said first side (10a), a power source (13) for applying a bias voltage between said cathode electrode and said anode electrode and for temporarily applying an injection voltage between said cathode elements (11a, 11b; 21a, 21b; 31a, 31b, 31c, 31ac, 31d; 41a, 41b; 51a, 51b), and a readout unit (14) for reading out electrical signals from said pixelated anode electrode (12).
    • 本发明涉及即使在高通量条件下也能有效地抑制极化的光子计数X射线检测器和检测方法。 所提出的检测器包括:用于响应于入射的X射线光子产生电子 - 空穴对的光子计数半导体元件(10),阴极电极(11a,11b; 21a,21b; 31a,31b,31c,31ac,31d; 41a ,41b; 51a,51b),所述阴极包括两个交叉指示的阴极元件(11a,11b; 21a,21b; 31a,31b, 31c,31ac,31d; 41a,41b; 1a,51b),布置在所述半导体元件(10)的与所述第一侧(10a)相对的第二侧(10b)上的像素化​​阳极电极(12) ),用于在所述阴极电极和所述阳极电极之间施加偏置电压,并且在所述阴极元件(11a,11b; 21a,21b; 31a,31b,31c,31ac,31d; 41a,41b; 51a, 51b)和用于从所述像素化阳极电极(12)读出电信号的读出单元(14)。
    • 7. 发明申请
    • CAPACITIVE MICRO-MACHINED TRANSDUCER AND METHOD OF MANUFACTURING THE SAME
    • 电容式微机械传动器及其制造方法
    • WO2013111040A1
    • 2013-08-01
    • PCT/IB2013/050481
    • 2013-01-18
    • KONINKLIJKE PHILIPS N.V.
    • DIRKSEN, PeterMAUCZOK, RuedigerKARAKAYA, KorayKLOOTWIJK, Johan HendrikMARCELIS, BoutMULDER, Marcel
    • B06B1/02
    • H02N1/006B06B1/0292B81B3/00B81B2203/0127B81C1/00158B81C1/00373H02N1/08
    • The present invention relates to a method of manufacturing a capacitive micro- machined transducer (100), in particular a CMUT, the method comprising depositing a first electrode layer (10) on a substrate (1), depositing a first dielectric film (20) on the first electrode layer (10), depositing a sacrificial layer (30) on the first dielectric film (20), the sacrificial layer (30) being removable for forming a cavity (35) of the transducer, depositing a second dielectric film (40) on the sacrificial layer (30), and depositing a second electrode layer (50) on the second dielectric film (40), wherein the first dielectric film (20) and/or the second dielectric film (40) comprises a first layer comprising an oxide, a second layer comprising a high-k material, and a third layer comprising an oxide, and wherein the depositing steps are performed by Atomic Layer Deposition. The present invention further relates to a capacitive micro-machined transducer (100), in particular a CMUT, manufactured by such method.
    • 本发明涉及一种制造电容式微机械传感器(100),特别是CMUT的方法,该方法包括在基片(1)上沉积第一电极层(10),沉积第一介电膜(20) 在所述第一电极层(10)上,在所述第一介电膜(20)上沉积牺牲层(30),所述牺牲层(30)可去除以形成所述换能器的空腔(35),沉积第二电介质膜 40),并且在所述第二电介质膜(40)上沉积第二电极层(50),其中所述第一电介质膜(20)和/或所述第二电介质膜(40)包括第一层 包括氧化物,包含高k材料的第二层和包含氧化物的第三层,并且其中所述沉积步骤通过原子层沉积进行。 本发明还涉及通过这种方法制造的电容式微加工的换能器(100),特别是CMUT。