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    • 6. 发明申请
    • SYSTEMS AND METHODS FOR DISTINGUISHING REFLECTIONS OF MULTIPLE LASER BEAMS FOR CALIBRATION FOR SEMICONDUCTOR STRUCTURE PROCESSING
    • 用于确定用于半导体结构处理校准的多个激光束反射的系统和方法
    • WO2008019252A1
    • 2008-02-14
    • PCT/US2007/074773
    • 2007-07-30
    • ELECTRO SCIENTIFIC INDUSTRIES, INC.LO, Ho WaiHEMENWAY, David MartinNILSEN, BradyBRULAND, Kelly J.
    • LO, Ho WaiHEMENWAY, David MartinNILSEN, BradyBRULAND, Kelly J.
    • H01L21/66H01L21/82
    • H01L23/5258G11C17/14G11C17/143H01L2924/0002H01L2924/00
    • A system (700A, 700B, 800) determines relative positions of a semiconductor substrate (240) and a plurality of laser beam spots on or within the semiconductor substrate (240) in a machine for selectively irradiating structures on or within the substrate using a plurality of laser beams. The system (700A, 700B, 800) comprises a laser source (220, 720), first and second laser beam propagation paths, first and second reflection sensors (798, 853), and a processor (680). The laser source (220, 720) produces at least the first and second laser beams, which propagate toward the substrate along the first and second propagation paths, respectively, which have respective first and second axes that intersects the substrate at respective first and second spots. The reflection sensors (798, 853) are positioned to detect reflection of the spots, as the spots moves relative to the substrate, thereby generating reflection signals. The processor (680) is configured to determine, based on the reflection signals, positions of the spots on or within the substrate (240).
    • 系统(700A,700B,800)确定半导体衬底(240)中的多个激光束斑点和半导体衬底(240)内的多个激光束斑点在机器中的相对位置,用于使用多个 的激光束。 系统(700A,700B,800)包括激光源(220,720),第一和第二激光束传播路径,第一和第二反射传感器(798,853)以及处理器(680)。 所述激光源(220,720)至少产生所述第一和第二激光束,所述第一和第二激光束分别沿着所述第一和第二传播路径传播到所述衬底,所述第一和第二激光束具有相应的第一和第二轴线,所述第一和第二轴线在相应的第一和第二点 。 当反射传感器(798,853)相对于基板移动时,反射传感器(798,853)被定位成检测光斑的反射,从而产生反射信号。 处理器(680)被配置为基于反射信号确定衬底(240)上或衬底(240)内的点的位置。