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    • 1. 发明申请
    • MICROLITHOGRAPHIC PROJECTION EXPOSURE APPARATUS
    • 微波投影曝光装置
    • WO2006084479A1
    • 2006-08-17
    • PCT/EP2005/001435
    • 2005-02-12
    • CARL ZEISS SMT AGGRUNER, ToralfEPPLE, AlexanderDEGÜNTHER, Markus
    • GRUNER, ToralfEPPLE, AlexanderDEGÜNTHER, Markus
    • G03F7/20
    • G03F7/70108G03F7/70141G03F7/70191
    • A projection exposure apparatus has a projection lens (10) with an object plane (34), an image plane, an opti­cal axis (28) and a non-telecentric entrance pupil (32). The apparatus further comprises an illumination system (12) having an intermediate field plane (80) and a field stop (36; 36'). The field stop is positioned in or in close proximity to the intermediate field plane (80) and defines an illuminated field (14) in the object plane (34) that does not contain the optical axis (28) of the projection lens (24). The illumination system (12) is configured such that, in the object plane (34), a mean of the angles formed between all principal rays (42) emanat­ing from the intermediate field plane (80) on the one hand and the optical axis (28) of the projection lens (24) on the other hand differs from 0 ° .
    • 投影曝光装置具有具有物平面(34),像平面,光轴(28)和非远心入射光瞳(32)的投影透镜(10)。 该装置还包括具有中间场平面(80)和场停止(36; 36')的照明系统(12)。 场停止件位于中间场平面(80)中或紧邻中间场平面(80),并且在物平面(34)中限定不包含投影透镜(24)的光轴(28)的照明场(14) 。 照明系统(12)被配置为使得在物平面(34)中,一方面从中间场平面(80)发射的所有主光线(42)和光轴(42)之间形成的平均角 另一方面,投影透镜(24)的光束(28)不同于0°。
    • 2. 发明申请
    • DEVICE FOR ADJUSTING THE ILLUMINATION DOSE ON A PHOTOSENSITIVE LAYER AND METHOD FOR THE MICROLITHOGRAPHIC PRODUCTION OF MICROSTRUCTURED COMPONENTS
    • 用于调节感光层上的照射剂量的装置和用于微结构化组分的微观制造的方法
    • WO2005040927A2
    • 2005-05-06
    • PCT/EP2004/010554
    • 2004-09-21
    • CARL ZEISS SMT AGGRUNER, ToralfDEGÜNTHER, Markus
    • GRUNER, ToralfDEGÜNTHER, Markus
    • G03F7/20
    • G03F7/70066G03F7/70558
    • A device for adjusting the illumination dose on a photosensitive layer (26), which is applied to a support (28) that can be displaced in a microlithographic projection exposure system (10) in a scanning direction (22) relative to a projection lens (16) of the projection exposure system (10), comprises an arrangement of a plurality of stop elements (52, 52') which are arranged next to one another perpendicularly to the scanning direction (22) and can respectively be displaced individually in the scanning direction (22) into a light field (60) produced by the projection exposure system (10). At least one stop element (52) is partially transparent for the projection light (14) being used in the projection exposure system (10), at least inside a subregion (69). This procedure substantially avoids pulse quantisation effects, which occur when using pulsed light sources (30) and can lead to inhomogeneous illumination of the reticle (20).
    • 一种用于调节感光层(26)上的照射剂量的装置,其被施加到在微光刻投影曝光系统(10)中相对于投影透镜在扫描方向(22)上移位的支撑件(28) 投影曝光系统(10)的图16(16)包括沿垂直于扫描方向(22)彼此相邻布置的多个停止元件(52,52')的布置,并且可以分别在扫描 方向(22)投射到由投影曝光系统(10)产生的光场(60)中。 至少一个止动元件(52)对于在投影曝光系统(10)中使用的至少在子区域(69)内的投影光(14)是部分透明的。 该过程基本上避免了当使用脉冲光源(30)时发生的脉冲量化效应并且可能导致光罩(20)的不均匀照明。
    • 3. 发明申请
    • ABBILDUNGSSYSTEM FÜR EINE MIKROLITHOGRAPHISCHE PROJEKTIONSBELICHTUNGSANLAGE
    • PICTURE SYSTEM FOR A微光刻投射曝光设备
    • WO2005081068A2
    • 2005-09-01
    • PCT/EP2005/000277
    • 2005-01-13
    • CARL ZEISS SMT AGGRUNER, ToralfEPPLE, AlexanderKNEER, BernhardWABRA, NorbertBEDER, SusanneDORSEL, Andreas
    • GRUNER, ToralfEPPLE, AlexanderKNEER, BernhardWABRA, NorbertBEDER, SusanneDORSEL, Andreas
    • G03F7/20
    • G03F7/70225G03F7/70241G03F7/70341G03F7/70958G03F7/70966
    • Abbildungssystem einer mikrolithographischen Projektionsbelichtungsanlage, mit einem Projektionsobjektiv (200, 300, 500, 600) zur Abbildung einer in einer Objektebene positionierbaren Maske auf eine in einer Bildebene positionierbare lichtempfindliche Schicht; und einer Flüssigkeitszufuhr (205) zum Füllen eines Zwischenraums zwischen der Bildebene und einem bildebenenseitig letzten optischen Element (201, 309, 506) des Projektionsobjektivs mit Immersionsflüssigkeit (202, 310, 507, 601); wobei das bildebenenseitig letzte optische Element des Projektionsobjektivs in Schwerkraftrichtung nachfolgend zur Bildebene angeordnet ist; und wobei das Projektionsobjektiv derart ausgelegt ist, dass im Immersionsbetrieb die Immersionsflüssigkeit in zur Bildebene abgewandter Richtung wenigstens bereichsweise konvex gekrümmt ist. Es wird auch vorgesehen, dass das bildebenenseitig letzte optische Element (201, 309, 506) des Projektionsobjektivs unter der Bildebene derart angeordnet ist, dass die Immersionsflüssigkeit (202, 310, 507, 601) zumindest teilweise in einem im wesentlichen wannenförmigen Bereich auf dem bildebenenseitig letzten optischen Element angeordnet wird. Auch kann ein Rotator zum Drehen eines die lichtempfindliche Schicht (401) aufweisenden Substrats zwischen einer Transportorientierung, in der die lichtempfindliche Schicht auf einer entgegengesetzt zur Schwerkraftrichtung liegenden Substratoberfläche angeordnet ist, und einer Belichtungsorientierung, in welcher die lichtempfindliche Schicht (401) auf einer in Schwerkraftrichtung liegenden Substratoberfläche angeordnet ist, vorgesehen sein.
    • 具有用于在光敏感层的图像平面上的定位在物平面掩模成像可定位的投影透镜(200,300,500,600)的微光刻投射曝光设备的成像系统; 和用于填充所述投射物镜的像平面和图像平面侧最后的光学元件(201,309,506)之间的间隙与浸没液体(202,310,507,601)的液体供给(205); 其中所述投射物镜的像面侧最后光学元件被布置在图像平面下方的重力方向; 并且其中,所述投射物镜被设计成使得在浸液操作中,浸没液体在背离图像面方向至少部分地凸形弯曲远离。 还可以预期的是,投影透镜的像面侧最后的光学元件(201,309,506)设置在图像平面下方,使得浸没液体(202,310,507,601)至少部分地基于所述像面侧的大致槽形区域部分地 最后的光学元件被布置。 用于旋转具有输送方向之间的衬底的感光层(401)旋转器罐,被布置在位于一个相对的衬底表面的重力方向上的感光层,和一个曝光取向,其中在重力的方向上的感光层(401) 布置,可以提供下面的基底表面。
    • 5. 发明申请
    • METHOD OF MANUFACTURING A PROJECTION OBJECTIVE AND PROJECTION OBJECTIVE MANUFACTURED BY THAT METHOD
    • 通过该方法制造投影目标和投影目标的方法
    • WO2008064845A1
    • 2008-06-05
    • PCT/EP2007/010244
    • 2007-11-26
    • CARL ZEISS SMT AGFELDMANN, HeikoGRUNER, ToralfEPPLE, Alexander
    • FELDMANN, HeikoGRUNER, ToralfEPPLE, Alexander
    • G03F7/20
    • G03F7/70891G03F7/70225G03F7/70275G03F7/705G03F7/70983
    • A method of manufacturing a projection objective including the steps of defining an initial design for a projection objective and optimizing the design using a merit function having a plurality of merit function components AB, IRRAD EFP, each of which reflects a particular quality parameter. One of that merit function components defines a maximum irradiance requirement requiring that a normalized effective irradiance value representing an effective irradiance AB, IRRAD EFF normalized to an effective irradiance in an image surface of the projection objective does not exceed a predefined irradiance threshold value IRR TV on each optical surface of the projection objective except for a last optical surface directly adjacent to an image surface of the projective objective. Optical surfaces positioned within caustic regions and/or critically small effective sub-apertures on optical surfaces are thereby systematically avoided.
    • 一种制造投影物镜的方法,包括以下步骤:定义投影物镜的初始设计,并使用具有多个优点函数分量AB,IRRAD EFP的优值函数优化设计,每个优点函数分量反映了特定的质量参数。 其中一个优点功能组件定义了最大辐照度要求,要求表示在投影物镜的图像表面中归一化为有效辐照度的有效辐照度AB,IRRAD EFF的归一化有效辐照度值不超过预定的辐照度阈值IRR TV 投影物镜的每个光学表面除了与投影物镜的图像表面直接相邻的最后光学表面之外。 因此系统地避免了位于苛性区域内的光学表面和/或光学表面上的临界小的有效子孔。
    • 7. 发明申请
    • OPTICAL SYSTEM
    • 光学系统
    • WO2009065819A2
    • 2009-05-28
    • PCT/EP2008/065733
    • 2008-11-18
    • CARL ZEISS SMT AGMÜLLER, RalfGRUNER, Toralf
    • MÜLLER, RalfGRUNER, Toralf
    • G02B5/30G02B1/08G03F7/20
    • G02B5/3083G02B1/08G03F7/70141G03F7/70191G03F7/70258G03F7/70308G03F7/70566G03F7/70966
    • The invention concerns, according to one aspect, an optical system having an optical axis OA (OA) and comprising at least one polarization manipulator (100, 200) having a first subelement (110, 210) which has a non-planar, optically effective surface and for light passing therethrough causes a change in the polarization state, wherein a maximum effective retardation introduced by the first subelement along the optical axis (OA) is less than a quarter of the working wavelength of the optical system, and a second subelement (120, 220), wherein said first subelement and said second subelement have mutually facing surfaces (110a, 120a; 210a, 220a) which are mutually complementary, and a position manipulator (150, 250) for manipulation of the relative position of said first subelement (110, 210) and said second subelement (120, 220).
    • 根据一个方面,本发明涉及一种具有光轴OA(OA)并且包括至少一个具有第一子元件(110,210)的偏振操纵器(100,200)的光学系统,该第一子元件具有非平面的,光学有效的 表面和穿过其的光引起偏振状态的变化,其中由第一子元件沿着光轴(OA)引入的最大有效延迟小于光学系统的工作波长的四分之一,以及第二子元件 120,220),其中所述第一子元件和所述第二子元件具有相互互补的相互面对的表面(110a,120a; 210a,220a)和用于操纵所述第一子元件的相对位置的位置操纵器(150,250) (110,210)和所述第二子元件(120,220)。
    • 8. 发明申请
    • PROJECTION EXPOSURE SYSTEM FOR MICROLITHOGRAPHY
    • 投影曝光系统
    • WO2008152087A1
    • 2008-12-18
    • PCT/EP2008/057369
    • 2008-06-12
    • CARL ZEISS SMT AGHETZLER, JochenGRUNER, Toralf
    • HETZLER, JochenGRUNER, Toralf
    • G03F7/20
    • G03F7/70825G03F7/70258G03F7/70308
    • A projection exposure system for microlithography comprises at least one optical system, for example a lithography lens comprising at least one bi-asphere (1) with two aspheres (2,3). In accordance with the invention, the projection exposure system has a manipulator which compensates tilting of the aspherical axes A2, A3 of the two aspheres (2,3) by tilting bi-asphere (1) about two mutually perpendicular axes RX and RY such that the projection properties of the optical system are optimized. In addition, a centering manipulator can be provided that executes translations TX and TY for the purpose of aligning the axes A2 and A3 with respect to the optical axis OA. With the aid of the inventive system, it is possible, with the bi-asphere (1) already mounted at the lens, using the projection parameters from the system itself, to perform an alignment of the lens (1), in particular tilting, for the purpose of optimizing the projection parameters of the lithography lens.
    • 用于微光刻的投影曝光系统包括至少一个光学系统,例如包括至少一个具有两个非球面(2,3)的双 - 非球面(1)的光刻透镜。 根据本发明,投影曝光系统具有通过围绕两个相互垂直的轴线RX和RY倾斜双非球面(1)来补偿两个非球面(2,3)的非球面轴线A2,A3的倾斜的操纵器,使得 优化了光学系统的投影特性。 此外,可以提供定心操纵器,其执行平移TX和TY以便相对于光轴OA对准轴A2和A3。 借助于本发明的系统,借助于系统本身的投影参数,双透镜(1)已经安装在透镜上,可以执行透镜(1)的对准,特别是倾斜, 为了优化光刻透镜的投影参数。