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    • 1. 发明申请
    • MEMORY DEVICE AND METHOD FOR OPERATING THEREOF
    • 存储器件及其操作方法
    • WO2016114718A1
    • 2016-07-21
    • PCT/SG2015/050520
    • 2015-12-31
    • AGENCY FOR SCIENCE,TECHNOLOGY AND RESEARCH
    • FOONG, Huey ChianLI, Fei
    • H01L27/105H01L27/24G11C11/02G11C11/15G11C11/16
    • G11C11/1673G11C5/025G11C11/161G11C11/1653G11C11/1655G11C11/1675G11C11/1693H01L27/222H01L27/228
    • According to various embodiments, there is provided a memory device including at least one sense amplifier having a first side and a second side, wherein the second side opposes the first side; a first array including a plurality of memory cells arranged at the first side; a second array including a plurality of memory cells arranged at the second side; a first row including a plurality of mid-point reference units arranged at the first side; and a second row including a plurality of mid-point reference units arranged at the second side, wherein each mid-point reference unit of the first row is configured to generate a first reference voltage, and wherein each mid-point reference unit of the second row is configured to generate a second reference voltage; wherein the sense amplifier is configured to determine a resistance state of a memory cell of the first array based on the second reference voltage; wherein the sense amplifier is configured to determine a resistance state of a memory cell of the second array based on the first reference voltage.
    • 根据各种实施例,提供了一种存储器件,其包括具有第一侧和第二侧的至少一个读出放大器,其中第二侧与第一侧相对; 包括布置在第一侧的多个存储单元的第一阵列; 包括布置在第二侧的多个存储单元的第二阵列; 第一行,包括布置在第一侧的多个中点参考单元; 以及第二排,包括布置在第二侧的多个中点参考单元,其中第一行的每个中点参考单元被配置为产生第一参考电压,并且其中第二行的每个中点参考单元 行被配置为产生第二参考电压; 其中所述读出放大器被配置为基于所述第二参考电压来确定所述第一阵列的存储单元的电阻状态; 其中所述读出放大器被配置为基于所述第一参考电压来确定所述第二阵列的存储单元的电阻状态。