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    • 7. 发明申请
    • DETECTION OF MAGNETIC PARTICLES AND THEIR CLUSTERING
    • 检测磁性颗粒及其聚集
    • WO2011161499A1
    • 2011-12-29
    • PCT/IB2010/055495
    • 2010-11-30
    • KONINKLIJKE PHILIPS ELECTRONICS N.V.VAN ZON, Joannes Baptist Adrianus DionisiusOVSYANKO, Mikhail MikhaylovichEVERS, Toon HendrikSIJBERS, Mara Johanna Jacoba
    • VAN ZON, Joannes Baptist Adrianus DionisiusOVSYANKO, Mikhail MikhaylovichEVERS, Toon HendrikSIJBERS, Mara Johanna Jacoba
    • H01F1/00H01F1/44
    • G01N27/72B01L3/502761B82Y25/00G01N15/06G01N15/0656G01N2015/0693G01R33/1276H01F1/0036
    • The invention relates to a method and associated apparatuses (100) for the detection of magnetic particles (MP) in a sample chamber (111). The method comprises the determination of a "particle-parameter" that is related to the amount of magnetic particles (MP) in a first detection region (P, C), the determination of a "cluster-parameter" that is related to the degree of clustering of magnetic particles (MP) in a second detection region (P, C), and the evaluation of the particle-parameter based on the cluster-parameter. Various apparatuses are disclosed that can be applied in said method. In one apparatus (100), a magnetic field (B) is generated in the sample chamber (111) in such a way that it has different inclinations in a first and second field region (P, C) and/or that it is oblique to the binding surface (112) in at least one field region. Magnetic particles (MP) are then detected in said first and second field region and/or in said at least one field region before and after a permanent switch-off of the inclined magnetic field. The resulting detection signals are related to each other to determine a cluster-parameter. In other embodiments, a cluster- parameter may be determined from light transmission measurements during the application of a magnetic field that is switched on and off.
    • 本发明涉及一种用于检测样品室(111)中的磁性颗粒(MP)的方法和相关装置(100)。 该方法包括确定与第一检测区域(P,C)中的磁性粒子(MP)的量相关的“粒子参数”,确定与该程度相关的“聚类参数” 在第二检测区域(P,C)中的磁性粒子(MP)的聚类,以及基于聚类参数的粒子参数的评估。 公开了可以应用于所述方法的各种装置。 在一个装置(100)中,在样品室(111)中产生磁场(B),使得其在第一和第二场区域(P,C)中具有不同的倾斜度和/或倾斜 到达至少一个场区域中的结合表面(112)。 然后在永久关闭倾斜磁场之前和之后,在所述第一和第二场区和/或所述至少一个场区中检测磁性颗粒(MP)。 所得到的检测信号彼此相关,以确定簇参数。 在其他实施例中,可以在施加接通和关断的磁场期间的光透射测量来确定簇参数。