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    • 1. 发明申请
    • DETECTION SYSTEM FOR DETECTING MAGNETIC PARTICLES
    • 用于检测磁性颗粒的检测系统
    • WO2011128808A1
    • 2011-10-20
    • PCT/IB2011/051454
    • 2011-04-05
    • KONINKLIJKE PHILIPS ELECTRONICS N.V.NIEUWENHUIS, Jeroen HansLEENAARS, Adriaan
    • NIEUWENHUIS, Jeroen HansLEENAARS, Adriaan
    • G01R33/12
    • G01R33/1269
    • The invention relates to a detection system (54) for detecting magnetic particles (25) on a detection surface (90) of the detection system (54). A magnetic unit (19) generates a magnetic field for arranging the magnetic particles on the detection surface (90), and a sensing unit (20, 21, 22, 23) generates a sensing signal depending on the arrangement of magnetic particles (25) on the detection surface (90). Characteristics of the magnetic field on the detection surface (90) are provided by a magnetic field characteristics providing unit (42), and a sensing signal correction unit (43) corrects the generated sensing signal depending on the provided characteristics of the magnetic field. This allows correcting the sensing signal for variations of the characteristics of the magnetic field on the detection surface.
    • 本发明涉及一种用于检测检测系统(54)的检测表面(90)上的磁性颗粒(25)的检测系统(54)。 磁性单元(19)产生用于将磁性颗粒布置在检测表面(90)上的磁场,并且感测单元(20,21,22,23)根据磁性颗粒(25)的布置产生感测信号, 在检测表面(90)上。 检测表面(90)上的磁场的特性由磁场特性提供单元(42)提供,并且感测信号校正单元(43)根据所提供的磁场特性校正产生的感测信号。 这允许校正感测信号用于检测表面上的磁场特性的变化。
    • 2. 发明申请
    • METHOD FOR DETECTING LABEL PARTICLES
    • 检测标签颗粒的方法
    • WO2008142492A1
    • 2008-11-27
    • PCT/IB2007/052938
    • 2007-07-24
    • KONINKLIJKE PHILIPS ELECTRONICS N.V.NIEUWENHUIS, Jeroen Hans
    • NIEUWENHUIS, Jeroen Hans
    • G01N33/543G01N33/58G01N15/06
    • G01N33/54373B01L3/502761B01L2200/0668B01L2400/0415B01L2400/043G01N15/0656G01N21/11G01N21/552G01N21/648G01N27/745G01N33/54326G01N33/58G01N33/585G01N35/0098G01R33/1269
    • The invention relates to a method and a microelectronic sensor device for the detection of target components comprising label particles, for example magnetic nano-particles (1). The method comprises the determination of at least one "reference value" (S bg , S sat ) before and/or after target components have been admitted to a binding surface (12), and the measurement of a "signal value" (S sig ) after unbound target components have been removed from the binding surface (12). The reference values may particularly comprise a background reference value (S bg ) measured while no target components are at the binding surface (12), and a saturation reference value (S sat ) measured while a maximal amount of target components is attracted to the binding surface (12). The reference values (S bg , S sat ) can be used to correct the signal value (S sig ), to determine a reliability measure, and/or to detect error states. A movement of the target components is preferably achieved by electrical or magnetic fields (B) acting on their labels (1), while the measurement of target components at the binding surface (12) is done with an independent, for example optical measurement principle.
    • 本发明涉及用于检测包含标记颗粒(例如磁性纳米颗粒(1))的靶组分的方法和微电子传感器装置。 该方法包括在目标组分已经进入结合表面之前和/或之后确定至少一个“参考值”(S B B S S S S S S SAT)(12 ),并且在未结合的目标成分已经从结合表面(12)移除之后,测量“信号值”(S SUB sig )。 参考值可以特别地包括在没有目标分量处于结合表面(12)时测量的背景参考值(S BAT),并且饱和基准值(S SUB> ),而最大量的目标组分被吸引到结合表面(12)。 可以使用参考值(S S B B S S S S S T S T S T S T S T S T S T S T S T S S T S S T S T S T S T S T S S S T S T S T S T S T S T S S T S T S T S T S T S T S T S T S T S T S T S T S T S T S T S T S T H S T S T H S T 和/或检测错误状态。 目标部件的移动优选通过作用在其标签(1)上的电场或磁场(B)来实现,而在绑定表面(12)处的目标部件的测量是用独立的例如光学测量原理完成的。