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    • 1. 发明申请
    • NOISE SUPPRESSION FOR OPEN BIT LINE DRAM ARCHITECTURES
    • 用于打开位线DRAM架构的噪声抑制
    • WO0233706A3
    • 2003-04-17
    • PCT/US0131159
    • 2001-10-03
    • INTEL CORPLU SHIH-LIENSOMASEKHAR DINESHDE VIVEK
    • LU SHIH-LIENSOMASEKHAR DINESHDE VIVEK
    • G11C20060101G11C7/02G11C11/4094G11C11/4097H01L20060101G11C7/12G11C7/14G11C7/18G11C11/4099H01L27/108
    • G11C11/4097G11C7/02G11C11/4094
    • An open bit line dynamic random access memory (DRAM) architecture uses a multiple layer bit line configuration to reduce coupling between switching bit lines in the device. In one approach, each successive cell within a row of DRAM cells is coupled to a bit line segment that is on a different metallization layer than a previous cell in the row. Shielding members are also provided between adjacent bit lines on a common metallization layer to further reduce noise coupling. Functionality is also provided for reducing the effect of word line to bit line coupling in the DRAM device using dummy signal injection techniques. In this manner, common mode noise that could otherwise saturate one or more sense amplifiers within the DRAM device is reduced or eliminated before such saturation can take place. In one approach, dummy cells and reference cells are provided for use in performing the signal injection. The principles of the present invention are particularly well suited for use within embedded DRAM structures where low charge storage capacity within individual cells reduces the signal voltage levels that are achievable.
    • 开放式位线动态随机存取存储器(DRAM)架构使用多层位线配置来减少器件中的开关位线之间的耦合。 在一种方法中,DRAM单元行内的每个连续单元被耦合到位于与行中的先前单元格不同的金属化层上的位线段。 屏蔽构件也设置在公共金属化层上的相邻位线之间,以进一步减少噪声耦合。 还提供了功能,用于使用虚拟信号注入技术来减少DRAM设备中字线对位线耦合的影响。 以这种方式,在这种饱和可能发生之前,可以减少或消除在DRAM装置内可以饱和一个或多个感测放大器的共模噪声。 在一种方法中,提供虚拟单元和参考单元用于执行信号注入。 本发明的原理特别适合于在嵌入式DRAM结构中使用,其中各个单元内的低电荷存储容量降低可实现的信号电压电平。