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    • 2. 发明申请
    • ADAPTIVE ERASE AND SOFT PROGRAMMING FOR MEMORY
    • 自适应删除和软件编程存储器
    • WO2010068323A1
    • 2010-06-17
    • PCT/US2009/058002
    • 2009-09-23
    • SANDISK CORPORATIONLEE, Shih-ChungHEMINK, Gerrit, Jan
    • LEE, Shih-ChungHEMINK, Gerrit, Jan
    • G11C11/56G11C16/04G11C16/16G11C16/34
    • G11C16/0483G11C11/5635G11C16/16G11C16/3404
    • An erase sequence of a non-volatile storage device includes an erase operation (910) followed by a soft programming operation (930). The erase operation applies one or more erase pulses to the storage elements (920), e.g. via a substrate until an erase level is satisfied (924) The number of erase pulses is tracked and recorded ( (926) as an indicia of the number of programming-erase cycles which the storage device has experienced. The soft programming operation (930) applies soft programming pulses (944) to the storage elements until a soft programming verify level is satisfied (950). Based on the number of erase pulses, the soft programming operation time is shortened by skipping verify operations (946) for a specific number of initial soft programming pulses which is a function of the number of erase pulses. Also, a characteristic of the soft programming operation can be optimized, such as staring amplitude, step size or pulse duration.
    • 非易失性存储设备的擦除序列包括随后进行软编程操作的擦除操作(910)(930)。 擦除操作将一个或多个擦除脉冲施加到存储元件(920)。 通过衬底直到擦除电平满足(924)擦除和记录擦除脉冲数((926)作为存储设备经历的编程擦除周期数的标记,软编程操作(930) 将软编程脉冲(944)应用于存储元件,直到满足软编程验证电平(950)为止,基于擦除脉冲数,通过跳过验证操作(946)来缩短软编程操作时间, 作为擦除脉冲数的函数的初始软编程脉冲,此外,可以优化软编程操作的特性,例如振幅,步长或脉冲持续时间。