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    • 2. 发明申请
    • PROBE CARD
    • 探针卡
    • WO2011004956A1
    • 2011-01-13
    • PCT/KR2010/002540
    • 2010-04-22
    • AMST CO., LTD.SHIM, yun heeYOON, sung heeYOO, seung hoSONG, byung changCHUNG, in buhmKIM, dong il
    • SHIM, yun heeYOON, sung heeYOO, seung hoSONG, byung changCHUNG, in buhmKIM, dong il
    • H01L21/66
    • G01R31/2889G01R1/06727G01R1/07342
    • Provided is a probe card which has a space transformer which may be effectively changed to correspond to a change in wafer chip structure and is capable of maximizing acceptable channels of the space transformer. The probe card for testing a semiconductor chip on a wafer includes: a space transformer body in which a plurality of unit probe modules are arranged at intervals; a main circuit board to which an electrical signal is applied from an external test device; a reinforcement plate for supporting the main circuit board such that the unit probe modules become stable against an external effect; a standing conductive medium which is inserted into a penetration portion provided in the space transformer body; a lower surface circuit board in which the standing conductive medium is electrically connected to the unit probe module as a flexible conductive medium and the standing conductive media are mounted; and a mutual connection member for electrically connecting the lower surface circuit board to the main circuit board.
    • 提供了一种具有可以有效地改变以对应于晶片芯片结构的变化并且能够使空间变压器的可接受的通道最大化的空间变压器的探针卡。 用于测试晶片上的半导体芯片的探针卡包括:空间变换器主体,多个单元探针模块间隔排列; 主电路板,从外部测试装置向其施加电信号; 用于支撑主电路板的加强板,使得单元探针模块抵抗外部效应变得稳定; 插入到设置在所述空间变换器主体中的贯通部的立体导电介质; 其中,所述立体导电介质与所述单元探针模块电连接为柔性导电介质并且所述直立导电介质安装在其中; 以及用于将下表面电路板电连接到主电路板的相互连接构件。
    • 3. 发明申请
    • RECLINER FOR VEHICLE SEATS
    • 车辆座椅支架
    • WO2010107160A1
    • 2010-09-23
    • PCT/KR2009/003245
    • 2009-06-17
    • DAEWON PRECISION INDUSTRIAL CO.,LTD.KIM, Dong-IlSIM, Jae-Won
    • KIM, Dong-IlSIM, Jae-Won
    • B60N2/22
    • B60N2/236
    • The present invention provides a recliner for vehicle seats. The recliner includes a gear rim, a guide plate, a lever rotating shaft, a cam, elastic members, a main control disk, locking gears and locking gear support members. The gear rim has internal gear teeth. The guide plate is coupled to the gear rim and has guide blocks thereon. The lever rotating shaft is inserted through the gear rim and the guide plate. The cam has support protrusions on both ends thereof. The elastic members are provided on the inner surface of the guide plate, and each elastic member elastically supports a first end of the corresponding support protrusion. The main control disk is coupled to the cam. Inner and outer guide holes are formed through the main control disk. The locking gears are slidably provided between the facing guide blocks, and each locking gear has a support depression. The support depression has a concave curved surface and a convex curved surface. External gear teeth are formed in each locking gear. Each locking gear support member has a first contact surface which is in close contact with the concave curved surface of the support depression, a second contact surface which is in close contact with the corresponding guide block, and an inner surface which is supported on both ends thereof by the cam.
    • 本发明提供一种用于车辆座椅的躺椅。 该斜倚器包括齿轮边缘,引导板,杆旋转轴,凸轮,弹性构件,主控制盘,锁定齿轮和锁定齿轮支撑构件。 齿轮齿轮具有内齿轮齿。 引导板联接到齿轮边缘并且在其上具有引导块。 杠杆旋转轴通过齿轮边缘和引导板插入。 凸轮在其两端具有支撑突起。 弹性构件设置在导向板的内表面上,并且每个弹性构件弹性地支撑相应的支撑突起的第一端。 主控制盘联接到凸轮。 通过主控制盘形成内,外引导孔。 锁定齿轮可滑动地设置在相对的导向块之间,并且每个锁定齿轮具有支撑凹陷。 支撑凹陷具有凹曲面和凸曲面。 在每个锁定齿轮中形成外齿轮齿。 每个锁定齿轮支撑构件具有与支撑凹陷的凹曲面紧密接触的第一接触表面,与相应引导块紧密接触的第二接触表面和支撑在两端的内表面 由凸轮。
    • 7. 发明申请
    • METHOD FOR WAFER TEST AND PROBE CARD FOR THE SAME
    • 用于其测试和探针卡的方法
    • WO2009048255A2
    • 2009-04-16
    • PCT/KR2008/005900
    • 2008-10-08
    • AMST CO., LTD.CHUNG, In BuhmSONG, Byung ChangKIM, Dong Il
    • CHUNG, In BuhmSONG, Byung ChangKIM, Dong Il
    • H01L21/66
    • G01R31/2887G01R1/0491
    • A method of testing a wafer capable of minimizing the asymmetrical thermal deformation of a probe card when a wafer is tested using a probe card and of minimizing the number of times of tests to effectively test a large area wafer and a probe card for the same is presented. For the wafer test method for testing semiconductor chips on a wafer using a probe card, the method includes creating virtual repeating units corresponding to N semiconductor chips, wherein the N is natural number larger than or equal to 2, arranging the plurality of repeating units on the wafer and moving the probe card or the wafer N times and testing the semiconductor chips on a wafer, wherein the semiconductor chips in the repeating units are sequentially tested one by one per each touchdown. Also, the probe cards to realize above mentioned method have been described.
    • 当使用探针卡测试晶片并且最小化有效测试大面积晶片和探针卡的测试次数的最小化时,测试能够最小化探针卡的不对称热变形的晶片的方法是 呈现。 对于使用探针卡对晶片上的半导体芯片进行测试的晶片测试方法,该方法包括创建对应于N个半导体芯片的虚拟重复单元,其中N是大于或等于2的自然数,将多个重复单元设置在 晶片并移动探针卡或晶片N次并测试晶片上的半导体芯片,其中重复单元中的半导体芯片每次触地一个接一个地依次测试。 另外,已经描述了用于实现上述方法的探针卡。
    • 9. 发明申请
    • SALIVA STORING CONTAINER FOR ASPIRATOR
    • SALIVA存储容器的ASPIRATOR
    • WO2012124962A3
    • 2012-12-27
    • PCT/KR2012001796
    • 2012-03-13
    • KIM DONG IL
    • KIM DONG IL
    • A61M1/00A61J1/05A61M27/00G01N1/10
    • A61M1/0001A61B10/0051A61B10/0096A61M1/005A61M2202/0466
    • The present invention relates to a saliva storing container for an aspirator for storing the saliva of the human body, the saliva storing container which is connected to an inflow tube for transporting saliva from the human body, and in addition, is connected, by a vacuum tube, to an aspirator for generating a vacuum pressure so that the saliva of the human body is transported to the inflow tube, and in particular, comprises: a main body having a storage portion for storing the saliva of the human body, and having an installed step formed on the upper end thereof, and an expansion portion formed in extension from the edge of the installed step of the storage portion to the upper side thereof; a sponge attached to the upper surface of a lower perforation plate, the lower perforation plate which is mounted on the installed step of the main body and has a plurality of lower perforation holes formed thereon; a floating member attached to the upper surface of the sponge and made up of an upper perforation plate having a plurality of upper perforation holes formed thereon; and a lid, which is placed on the upper end of the expansion portion of the main body for opening/closing the main body, and in addition to being connected to the inflow tube, is equipped with a saliva guiding tube in the center thereof for penetrating the center of the floating member and guiding the saliva of the human body to the storage portion of the main body, and which is equipped with a vacuum connection tube connected to the vacuum tube on one side thereof, and the present invention prevents the failure of an aspirator by blocking the inflow of the saliva of the human body towards the aspirator using a floating member even when spattering or scattering in all directions inside the storage portion due to the influence of the strong vacuum pressure of the aspirator.
    • 本发明涉及一种用于吸收人体唾液的吸液器的唾液储存容器,唾液储存容器连接到用于从人体输送唾液的流入管,并且还通过真空连接 管,产生真空压力的吸气器,使得人体的唾液被输送到流入管,特别地包括:主体,具有用于储存人体唾液的储存部分,并具有 安装台阶形成在其上端,以及膨胀部,其形成为从所述收纳部的安装台阶的边缘延伸到其上侧; 附着在下穿孔板的上表面的海绵,下穿孔板安装在主体的安装台阶上,并且在其上形成有多个下穿孔; 附着在海绵的上表面上并由上穿孔板构成的浮动件,上穿孔板上形成有多个上穿孔; 以及盖体,其设置在主体的膨胀部的上端,用于打开/关闭主体,并且除了连接到流入管之外,还在其中心配备有唾液引导管,用于 穿过浮动构件的中心并将人体的唾液引导到主体的存储部分,并且在其一侧配备有连接到真空管的真空连接管,并且本发明防止了故障 即使是由于抽吸器强大的真空压力的影响,即使在储存部分内的所有方向飞溅或散射时,通过使用浮动部件阻止人体的唾液向抽吸器的流入。
    • 10. 发明申请
    • METHOD FOR WAFER TEST AND PROBE CARD FOR THE SAME
    • 用于晶片测试和探针卡的方法
    • WO2009048255A3
    • 2009-05-28
    • PCT/KR2008005900
    • 2008-10-08
    • AMST CO LTDCHUNG IN BUHMSONG BYUNG CHANGKIM DONG IL
    • CHUNG IN BUHMSONG BYUNG CHANGKIM DONG IL
    • H01L21/66
    • G01R31/2887G01R1/0491
    • A method of testing a wafer capable of minimizing the asymmetrical thermal deformation of a probe card when a wafer is tested using a probe card and of minimizing the number of times of tests to effectively test a large area wafer and a probe card for the same is presented. For the wafer test method for testing semiconductor chips on a wafer using a probe card, the method includes creating virtual repeating units corresponding to N semiconductor chips, wherein the N is natural number larger than or equal to 2, arranging the plurality of repeating units on the wafer and moving the probe card or the wafer N times and testing the semiconductor chips on a wafer, wherein the semiconductor chips in the repeating units are sequentially tested one by one per each touchdown. Also, the probe cards to realize above mentioned method have been described.
    • 一种测试晶片的方法,当使用探针卡测试晶片时,能够最小化探针卡的非对称热变形,并且最小化有效地测试大面积晶片和探针卡的测试次数的方法是 呈现。 对于使用探针卡在晶片上测试半导体芯片的晶片测试方法,该方法包括创建对应于N个半导体芯片的虚拟重复单元,其中N是大于或等于2的自然数,将多个重复单元布置在 晶片并将探针卡或晶片移动N次,并测试晶片上的半导体芯片,其中重复单元中的半导体芯片按照每次着地顺序依次测试。 而且,已经描述了实现上述方法的探针卡。