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    • 2. 发明申请
    • ATOM PROBE EVAPORATION PROCESSES
    • 原子探针蒸发过程
    • WO2007016299A3
    • 2008-01-31
    • PCT/US2006029324
    • 2006-07-28
    • IMAGO SCIENT INSTR CORPOLSON JESSE DLENZ DANIEL RPAYNE TIMOTHY R
    • OLSON JESSE DLENZ DANIEL RPAYNE TIMOTHY R
    • G01Q10/00G01Q60/00H01J37/305
    • G01Q60/00
    • The present invention relates to atom probe evaporation processes. For example, certain aspects are directed toward methods for controlling an evaporation process in an atom probe that includes initiating the atom probe evaporation process and monitoring a parameter associated with material being evaporated from a specimen. The method can further include controlling at least one characteristic of the atom probe evaporation process to attain a desired evaporation rate or characteristic. In selected embodiments, monitoring a parameter associated with material being evaporated can include monitoring an evaporation rate, mass-to- charge ratios of evaporated ions, a mass resolution, a composition of material being evaporated, and/or the like. In certain embodiments, controlling at least one characteristic can include controlling a pulse energy, a pulse frequency, a bias energy, and/or the like. In other embodiments, various portions of the above process can be computer implemented.
    • 本发明涉及原子探针蒸发方法。 例如,某些方面涉及用于控制原子探针中的蒸发过程的方法,其包括引发原子探针蒸发过程并监测与样品蒸发的材料相关的参数。 该方法还可以包括控制原子探针蒸发过程的至少一个特征以获得所需的蒸发速率或特性。 在选择的实施例中,监测与被蒸发的材料相关联的参数可以包括监测蒸发速率,蒸发离子的质荷比,质量分辨率,被蒸发的材料的组成和/或类似物。 在某些实施例中,控制至少一个特性可包括控制脉冲能量,脉冲频率,偏置能量等。 在其他实施例中,可以计算机实现上述过程的各个部分。
    • 3. 发明申请
    • ATOM PROBE
    • ATOM探索
    • WO2006134380A3
    • 2007-11-29
    • PCT/GB2006002209
    • 2006-06-16
    • IMAGO SCIENT INSTR CORPPANAYI PETER
    • PANAYI PETER
    • H01J49/40
    • H01J49/405H01J49/0004
    • Aspects of the present invention are directed generally toward atom probe and three-dimensional atom probe microscopes. For example, certain aspects of the invention are directed -toward an atom probe or a three-dimensional atom probe that includes a sub-nanosecond laser to evaporate ions from a specimen under analysis and a reflectron for reflecting the ions. In further aspects of the invention, the reflectron can include a front electrode and a back electrode. At least one of the front and back electrodes can be capable of generating a curved electric field. Additionally, the front electrode and back electrodes can be configured to perform time focusing and resolve an image of a specimen.
    • 本发明的方面通常涉及原子探针和三维原子探针显微镜。 例如,本发明的某些方面涉及原子探针或三维原子探针,该原子探针或三维原子探针包括用于蒸发分析中的样品的离子的亚纳秒激光和用于反射离子的反射器。 在本发明的其它方面,反射器可以包括前电极和后电极。 前电极和后电极中的至少一个能够产生弯曲的电场。 此外,前电极和背电极可以被配置为执行时间聚焦并且解析样本的图像。
    • 4. 发明申请
    • ATOM PROBE PULSE ENERGY
    • ATOM探头脉冲能量
    • WO2007053721A2
    • 2007-05-10
    • PCT/US2006042742
    • 2006-10-31
    • IMAGO SCIENT INSTR CORPBUNTON JOSEPH HALE
    • BUNTON JOSEPH HALE
    • G01N23/00
    • H01J37/285B82Y15/00H01J2237/2852H01J2237/2855
    • The present invention relates to atom probe pulse energy. One aspect of the invention is directed toward a method that includes establishing a data relationship between pulse energy and bias energy for a target evaporation rate. In selected embodiments, establishing a data relationship can include determining an equivalent pulse fraction for a selected pulse energy and bias energy combination based on a local change in bias energy compared to a local change in pulse energy associated with the selected pulse energy and bias energy combination. Another aspect of the invention is directed toward a method that includes determining an equivalent pulse fraction for a first bias energy and pulse energy combination and/or a second bias energy and pulse energy combination based on the difference between the first bias energy and the second bias energy compared to the difference between the first pulse energy and the second pulse energy.
    • 本发明涉及原子探针脉冲能量。 本发明的一个方面涉及一种方法,其包括针对目标蒸发速率建立脉冲能量和偏压能量之间的数据关系。 在选择的实施例中,建立数据关系可以包括基于与所选择的脉冲能量和偏置能量组合相关联的脉冲能量的局部变化,基于偏置能量的局部变化来确定所选择的脉冲能量和偏置能量组合的等效脉冲分数 。 本发明的另一方面涉及一种方法,其包括基于第一偏置能量和第二偏压之间的差异来确定第一偏置能量和脉冲能量组合的等效脉冲分数和/或第二偏置能量和脉冲能量组合 与第一脉冲能量和第二脉冲能量之间的差相比。
    • 7. 发明申请
    • SPECIMENS FOR MICROANALYSIS PROCESSES
    • 微量分析过程的样本
    • WO2008057066A9
    • 2009-07-02
    • PCT/US2006029323
    • 2006-07-28
    • IMAGO SCIENT INSTR CORPGOODMAN STEVEN LKELLY TOMAS FTOMICKI TERRI J
    • GOODMAN STEVEN LKELLY TOMAS FTOMICKI TERRI J
    • G01N1/00
    • G01N1/36Y10T436/2525
    • The present invention relates to specimens for use in microanalysis processes. One aspect of the invention is directed toward using a mold to form specimens for a microanalysis process (e.g., including an atom probe and/or transmission electron microscope processes). Other aspects of the invention are directed towards embedding specimen material (e.g., including nanoparticles) in an embedment material to produce a specimen suitable for use in a microanalysis process. Still other aspects include combining specimen material with an embedment material to enhance a microanalysis process. Yet other embodiments of the invention are directed toward combining a specimen material with multiple embedment materials to produce specimens suitable for a microanalysis process. Further aspects of the invention are directed toward analyzing at least a portion of a specimen produced by one or more of the processes discussed above.
    • 本发明涉及用于微量分析过程的样本。 本发明的一个方面涉及使用模具来形成用于微量分析过程(例如包括原子探针和/或透射电子显微镜过程)的样本。 本发明的其他方面涉及将试样材料(例如,包括纳米颗粒)嵌入嵌入材料中以产生适用于微量分析过程的试样。 其他方面还包括将样本材料与嵌入材料组合以增强微量分析过程。 本发明的又一些实施例涉及将样本材料与多种嵌入材料组合以产生适用于微量分析过程的样本。 本发明的其他方面涉及分析由上述一个或多个过程产生的样本的至少一部分。