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    • 1. 发明申请
    • JFET WITH DRAIN AND/OR SOURCE MODIFICATION IMPLANT
    • 具有漏极和/或源修改植入物的JFET
    • WO2007075759A2
    • 2007-07-05
    • PCT/US2006048559
    • 2006-12-18
    • ANALOG DEVICES INCWILSON CRAIGBOWERS DEREKCESTRA GREGORY K
    • WILSON CRAIGBOWERS DEREKCESTRA GREGORY K
    • H01L29/808H01L29/0843
    • The present invention provides a JFET which receives an additional implant during fabrication, which extends its drain region towards its source region, and/or its source region towards its drain region. The implant reduces the magnitude of the e-field that would otherwise arise at the drain/channel (and/or source/channel) junction for a given drain and/or source voltage, thereby reducing the severity of the gate current and breakdown problems associated with the e- field. The JFET' s gate layer is preferably sized to have a width which provides respective gaps between the gate, layer' s lateral boundaries and the drain and/or source regions for each implant, with each implant implanted in a respective gap.
    • 本发明提供一种在制造期间接收附加注入的JFET,其将其漏极区域朝其源极区域和/或其源极区域延伸至其漏极区域。 对于给定的漏极和/或源极电压,注入减少了否则在漏极/沟道(和/或源极/沟道)结处出现的电场的幅度,从而降低了栅极电流的严重性以及相关的击穿问题 与电子领域。 JFET的栅极层的尺寸优选地具有这样的宽度,其为每个注入在栅极层的横向边界和漏极和/或源极区域之间提供相应的间隙,其中每个注入被注入到相应的间隙中。
    • 6. 发明申请
    • DUAL OP AMP IC WITH SINGLE LOW NOISE OP AMP CONFIGURATION
    • 具有单个低噪声放大器配置的双OP AMP IC
    • WO2007133416A1
    • 2007-11-22
    • PCT/US2007/010147
    • 2007-04-24
    • ANALOG DEVICES, INC.BOWERS, Derek, F.
    • BOWERS, Derek, F.
    • H03F1/26H03F3/21H03F3/30H03F3/45H03F3/60
    • H03F3/45192H03F1/26H03F3/211H03F3/3069H03F3/3083H03F3/4521H03F3/45475H03F3/602H03F2200/372H03F2203/45138H03F2203/45366H03F2203/45371
    • A multiple op amp IC with a single low noise op amp configuration comprises at least two op amp circuits (40, 42) fabricated on a common substrate. The IC can be configured such that the multiple op amps (40, 42) are connected in parallel to form a single op amp having output drive and input-referred noise characteristics which are superior to those of the constituent op amps. The IC can be fabricated with, either first or second metallization patterns, with the first pattern providing multiple op amps with separate inputs (INA, INB) and outputs (OUTA, OUTB), and the second pattern interconnecting (44, 46, 48) the amplifiers (40, 42) to form a single op amp. The second pattern also preferably interconnects (50) at least one set of correspondin high impedance nodes (52, 54) to prevent a difference voltage which might otherwise arise between the nodes due to componen mismatches between the multiple op amps (40, 42).
    • 具有单个低噪声运算放大器配置的多运算放大器IC包括在公共衬底上制造的至少两个运算放大器电路(40,42)。 IC可以被配置成使得多个运算放大器(40,42)并联连接以形成具有优于组成运算放大器的输出驱动和输入参考噪声特性的单个运算放大器。 IC可以用第一或第二金属化图案制造,第一图案提供具有单独输入(INA,INB)和输出(OUTA,OUTB)的多个运算放大器,以及第二图案互连(44,46,48) 放大器(40,42)以形成单个运算放大器。 第二图案还优选地互连(50)至少一组相应的高阻抗节点(52,54),以防止由于多个运算放大器(40,42)之间的组件不匹配而在节点之间可能出现的差异电压。