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    • 23. 发明申请
    • アナログデジタル変換セル及びアナログデジタル変換器
    • 模拟/数字转换单元和模拟/数字转换器
    • WO2009019902A1
    • 2009-02-12
    • PCT/JP2008/053430
    • 2008-02-27
    • 富士通株式会社後藤 邦彦高山 武志
    • 後藤 邦彦高山 武志
    • H03M1/14
    • H03M1/0695H03M1/44
    •  Nビットアナログデジタル変換(Nは自然数)を行うアナログデジタル変換セルであって、複数の基準電圧を基にアナログ入力信号VIを比較し、前記アナログ入力信号VIの大きさに応じて2 N +1以上かつ2 N+1 -1以下であるQ値の第1のデジタルコードDAを出力する比較回路(202)と、定数KAが1<KA<2の条件を満たす小数であり、DB0が定数であり、前記第1のデジタルコードDAを基にDB=DA×KA+DB0で表されるQ値の第2のデジタルコードDBを出力する第1のロジック演算回路(203)と、A及びVRが定数であり、前記第1のデジタルコードDA及び前記アナログ入力信号VIを基に、VO=A×(VI-DA×KA×(VR/A))で表されるアナログ出力信号VOを出力するアナログ演算回路(201)とを有することを特徴とするアナログデジタル変換セルが提供される。
    • 执行N位模拟/数字转换(N是自然数)的模拟/数字转换单元包括比较器电路(202),其比较基于多个参考电压的模拟输入信号VI以输出第一数字码DA 取决于模拟输入信号VI的电平,Q值不小于2N + 1且不大于2N + 1-1,第一逻辑运算电路(203)输出表示的Q值的第二数字码DB 基于第一数字码DA,通过DB = DAxKA + DB0,其中常数KA是满足条件1
    • 24. 发明申请
    • SPACE EFFICIENT LOW POWER CYCLIC A/D CONVERTER
    • 空间高效低功耗循环A / D转换器
    • WO2005013495A3
    • 2005-06-09
    • PCT/US2004022511
    • 2004-07-15
    • FREESCALE SEMICONDUCTOR INCATRISS AHMAD HALLEN STEVEN P
    • ATRISS AHMAD HALLEN STEVEN P
    • H03M1/06H03M1/34H03M1/40H04B20060101
    • H03M1/0695H03M1/40
    • Methods and apparatus are provided for an analog converter (60). The apparatus comprises a first redundant signed digit (RSD) stage (62) and a configurable block (61). The configurable block (61) converts to a sample/hold circuit to sample a single ended analog signal. The sampled signal is then scaled, converted to a differential signal and provided to the first RSD stage (62). The first RSD stage (62) outputs a bit value corresponding to the magnitude of the digital signal. In a next half clock cycle the first RSD stage (62) calculates a residue that is provided to the configurable block (61). The configurable block (61) is converted to a second redundant signed digit stage and generates a bit value corresponding to the magnitude of the residue provided by the first RSD stage. The first and second RSD stages cycle back and forth generating logic value each half clock cycle until the desired bit resolution is achieved. The configurable block (61) is then converted back to a sample/hold circuit to start another conversion process.
    • 提供了用于模拟转换器(60)的方法和装置。 该装置包括第一冗余有符号数字(RSD)级(62)和可配置块(61)。 可配置模块(61)转换为采样/保持电路以采样单端模拟信号。 然后对采样的信号进行缩放,转换成差分信号并提供给第一RSD级(62)。 第一RSD级(62)输出对应于数字信号大小的比特值。 在下一个半时钟周期中,第一RSD级(62)计算提供给可配置块(61)的余量。 可配置块(61)被转换成第二冗余有符号数位级,并且生成与由第一RSD级提供的残留量相对应的比特值。 第一和第二RSD级每半个时钟周期前后循环产生逻辑值,直到达到期望的位分辨率。 然后可配置模块(61)被转换回采样/保持电路以开始另一个转换过程。
    • 25. 发明申请
    • SWITCHED-CURRENT ANALOGUE-TO-DIGITAL CONVERTER
    • 开关电流模拟数字转换器
    • WO2004010586A2
    • 2004-01-29
    • PCT/IB0303027
    • 2003-07-08
    • KONINKL PHILIPS ELECTRONICS NVHUGHES JOHN B
    • HUGHES JOHN B
    • H03M1/44H03M1/06H03M1/00
    • H03M1/0695H03M1/447
    • A current mode analogue-to-digital converter uses a conversion stage which operates using a two-phase clock and which requires the input signal to be present during only one of the phases. A sample-and-hold circuit (120, 130, 135) samples the input signal during the first clock phase and during the second clock phase a quantised bit value is generated from a mirror of the held input current by a kickback-free comparator circuit (140). Also during the second clock phase a residue is generated using the quantised value and a non-mirrored version of the held input current. Optionally, two comparator circuits (140, 140") may be used to provide two-level quantisation, enabling errors introduced by the current mirror to be corrected by a Redundant Signed Digit algorithm. Two pipelines of conversion stages (S
    • 电流模式模拟 - 数字转换器使用转换级,其使用两相时钟进行操作,并且需要在仅一个相位期间存在输入信号。 采样和保持电路(120,130,135)在第一时钟相位期间对输入信号进行采样,并且在第二时钟相位期间,通过无反冲比较器电路从保持的输入电流的反射镜产生量化位值 (140)。 同样在第二时钟阶段期间,使用量化值和保持的输入电流的非镜像版本来生成残差。 可选地,可以使用两个比较器电路(140,140“)来提供两级量化,使得由电流镜引入的误差能够通过冗余有符号数字算法来校正。转换级的两条管线(S
    • 27. 发明申请
    • PIPELINED SUCCESSIVE APPROXIMATION ANALOG-TO-DIGITAL CONVERTER
    • 管路连续逼近模拟数字转换器
    • WO2015041937A1
    • 2015-03-26
    • PCT/US2014/055312
    • 2014-09-12
    • QUALCOMM INCORPORATED
    • PARK, HyunsikLIMOTYRAKIS, Sotirios
    • H03M1/14H03M1/46
    • H03M1/38H03M1/00H03M1/0695H03M1/12H03M1/145H03M1/46H03M1/804
    • A multistage analog-to-digital data conversion, including: a first stage unit configured to process an analog input signal into a first number of most significant bits using a first reference signal, and to output a first stage residue signal; a second stage unit configured to receive and process the first stage residue signal into a second number of remaining least significant bits using a second reference signal; a sampling unit configured to sample the first stage residue signal received from the first stage unit onto the second stage unit with a passive element; and an output unit configured to output a digital value that is a combination of the first number of most significant bits and the second number of remaining least significant bits.
    • 一种多级模拟数字数据转换,包括:第一级单元,被配置为使用第一参考信号将模拟输入信号处理为第一数量的最高有效位,并输出第一级残差信号; 第二级单元,被配置为使用第二参考信号接收并处理所述第一级残差信号为第二数量的剩余最低有效位; 采样单元,被配置为用无源元件将从第一级单元接收的第一级残差信号采样到第二级单元; 以及输出单元,被配置为输出作为第一数目的最高有效位和第二数目的剩余最低有效位的组合的数字值。
    • 28. 发明申请
    • 멀티플라잉 디지털 아날로그 컨버터 및 그 동작 방법
    • 用于数字模拟转换器和操作方法
    • WO2015002478A1
    • 2015-01-08
    • PCT/KR2014/005948
    • 2014-07-03
    • 고려대학교 산학협력단
    • 김철우이호규.아으렁거젭박세진
    • H03M1/12
    • H03M1/167H03M1/0695
    • 파이프라인 아날로그 디지털 컨버터에 포함되는 멀티플라잉 디지털 아날로그 컨버터의 구조 및 동작 방법에 연관된다. 샘플링 페이즈에서 입력 전압을 샘플하여 홀드 하고, 증폭 페이즈에서 상기 입력 전압과 레퍼런스 전압 차이를 증폭하여 출력 단자에 전달하는 제1 커패시터부; 및 상기 샘플링 페이즈에서 상기 입력 전압을 샘플하여 홀드하고, 상기 증폭 페이즈에서 상기 입력 전압에서 상기 레퍼런스 전압을 감산한 상기 전압 차이를 상기 제1 커패시터부에 전달하는 제2 커패시터부를 포함할 수 있고, 상기 제1 커패시터부는 Y형 연결된 세 개의 커패시터들을 포함할 수 있다.
    • 本发明涉及包括在流水线模拟数字转换器中的倍增数字模拟转换器及其操作方法。 所述乘法数字模拟转换器包括:第一电容器单元,其对采样相位中的输入电压进行采样并保持其相同,并且在放大阶段放大输入电压和参考电压之间的差,并将其发送到输出端子; 以及第二电容器单元,其在采样相位中对输入电压进行采样并保持相同,并且将从已经从放大阶段的输入电压中减去的参考电压得到的电压差发送到第一电容器单元。 第一电容器单元可以包括三个Y形连接的电容器。
    • 29. 发明申请
    • SYSTEM, APPARATUS AND METHOD TO IMPROVE ANALOG-TO-DIGITAL CONVERTER OUTPUT
    • 系统,装置和方法来改进模拟数字转换器输出
    • WO2013158104A1
    • 2013-10-24
    • PCT/US2012/034237
    • 2012-04-19
    • INTEL CORPORATIONCOWLEY, Nicholas P.ALI, Isaac
    • COWLEY, Nicholas P.ALI, Isaac
    • H03M1/12
    • H03M1/08H03M1/00H03M1/0695H03M1/1028H03M1/12H03M1/1215
    • According to various embodiments, a system, an apparatus and a method are presented that relate to determining and correcting signal imbalances between output samples of an analog-to-digital (A-D) converter array (that may be implemented as part of a wideband ADC). A statistic module and correction module are associated with the A-D converter array. The statistic module is configured to receive digital samples from the plurality of A-D converters, and generate a statistical sample value for each A-D converter using a set of digital samples received therefrom. The correction module is configured to, for at least one of the plurality of A-D converters, determine an offset value by comparing the statistical sample value for the at least one of the plurality of A-D converters with a reference value, and apply the offset value to a digital sample from that at least one A-D converter to generate a corrected digital sample.
    • 根据各种实施例,提出了一种涉及确定和校正模数(AD)转换器阵列(可被实现为宽带ADC的一部分)的输出采样之间的信号不平衡的系统,装置和方法, 。 统计模块和校正模块与A-D转换器阵列相关联。 统计模块被配置为从多个A-D转换器接收数字样本,并且使用从其接收的一组数字样本为每个A-D转换器生成统计采样值。 校正模块被配置为,对于多个AD转换器中的至少一个,通过将多个AD转换器中的至少一个AD转换器的统计采样值与参考值进行比较来确定偏移值,并将偏移值应用于 来自该至少一个AD转换器的数字样本以产生经校正的数字样本。