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    • 1. 发明申请
    • 半導体ウェーハ保護部材及び半導体ウェーハの研削方法
    • SEMICONDUCTOR WAFER PROTECTION MEMORY AND SEMICONDUCTOR WAFER GRINDING METHOD
    • WO2003060974A1
    • 2003-07-24
    • PCT/JP2003/000126
    • 2003-01-09
    • 株式会社ディスコ矢嶋 興一木村 祐輔
    • 矢嶋 興一木村 祐輔
    • H01L21/304
    • B24B7/228B24B41/06H01L21/6838
    • A grinder composed of at least a chuck table (17) having a suction region (1) and a frame (2) and grinding means (30) for grinding a semiconductor wafer (W) held on the chuck table (17) is used. When a semiconductor wafer (W) having an outside diameter D1 smaller than tat of the suction region (1) is ground, a semiconductor wafer (W) protective member (3) having an outside diameter D3 larger than the outside diameter D1 of the semiconductor wafer and larger than the diameter D2 of the suction region (1) is stuck on the side not to be ground of the semiconductor wafer (W). The whole surface of the semiconductor wafer (W) is held on the suction region (1), with the semiconductor wafer protective member (3) down. The exposed surface of the held semiconductor wafer (W) is ground by the grinding means (30). Thus the edge of the semiconductor wafer (W) is prevented from breaking, chipping and cracking.
    • 使用由至少具有吸引区域(1)和框架(2)的卡盘台(17)和用于研磨保持在卡盘台(17)上的半导体晶片(W))的研磨装置(30)构成的研磨机。 当研磨具有比吸引区域(1)的tat小的外径D1的半导体晶片(W)时,具有比半导体的外径D1大的外径D3的半导体晶片(W)保护部件(3) 晶片并且大于吸引区域(1)的直径D2被粘附在半导体晶片(W)的不被研磨的一侧。 半导体晶片保护构件(3)向下,半导体晶片(W)的整个表面保持在吸入区域(1)上。 被保持的半导体晶片(W)的露出表面被研磨装置(30)研磨。 因此,防止半导体晶片(W)的边缘破裂,碎裂和破裂。