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1. 发明授权

US11699884B2 Electromagnetic shielding of heatsinks with spring press-fit pins 有权
公开(公告)号：US11699884B2
公开(公告)日：2023-07-11
申请号：US16939135
申请日：2020-07-27
申请人： INTERNATIONAL BUSINESS MACHINES CORPORATION
发明人： David J. Braun , John R. Dangler , Timothy P. Younger , James D. Bielick , Stephen Michael Hugo , Theron Lee Lewis , Jennifer I. Bennett , Timothy Jennings
IPC分类号： H01R13/00 , H01R13/6595 , H05K1/02 , H05K9/00 , H01R12/70 , H05K7/20 , H01R12/58 , H01R11/18
CPC分类号： H01R13/6595 , H01R12/7064 , H05K1/0209 , H05K7/20 , H05K9/0028 , H01R11/18 , H01R12/585 , Y10S439/948
摘要： An apparatus for grounding a heatsink utilizing an EMC spring press-fit pin includes a printed circuit board, a logic chip, a heatsink, and a grounding member, where the grounding member includes an integrated spring and a first terminal pin at a first end of the grounding member. The logic chip is electrically coupled to the printed circuit board and the heatsink is disposed on a top surface of the logic chip. The first terminal pin at the first end of the grounding member is disposed in a plated-through hole of the printed circuit, where the grounding member is configured to electrically couple the heatsink to the printed circuit board.

2. 发明申请

US20220336985A1 PIN TERMINAL, CONNECTOR, WIRING HARNESS WITH CONNECTOR AND CONTROL UNIT 有权
公开(公告)号：US20220336985A1
公开(公告)日：2022-10-20
申请号：US17760704
申请日：2020-08-31
申请人： AUTONETWORKS TECHNOLOGIES, LTD. , SUMITOMO WIRING SYSTEMS, LTD. , SUMITOMO ELECTRIC INDUSTRIES, LTD.
发明人： Michitake KAMAMOTO , Akihiro KATO , Mitsuhiro KUMONDAI , Yoshifumi SAKA
IPC分类号： H01R13/03 , H01R11/18 , H01B5/02 , C25D5/10 , H01B7/00
摘要： A pin terminal includes a bar-like base material and a plating layer covering a predetermined region of the base material. A constituent material of the base material is pure copper or a copper alloy. The plating layer includes a tin-based layer made of metal containing tin. One end side of the base material includes a tip covering portion covering an entire region in a circumferential direction of the base material. The tin-based layer includes the tip covering portion. The tip covering portion includes a thin film portion and a thick film portion at positions different in the circumferential direction of the base material. The thin film portion includes an outer layer and an inner layer provided in contact with the base material. A constituent material of the outer layer is pure tin, and that of the inner layer is an alloy containing tin and copper.

3. 发明授权

US09431731B2 Sensor and terminal member 有权
标题翻译：传感器和端子构件
公开(公告)号：US09431731B2
公开(公告)日：2016-08-30
申请号：US14246336
申请日：2014-04-07
申请人： NGK SPARK PLUG CO., LTD.
发明人： Takehiro Oba , Yuichi Yamada , Shingo Ito , Takeshi Nanbu , Hironari Furuta , Makoto Kume
IPC分类号： H01R11/18 , H01R11/01 , G01N27/406 , H01R13/24
CPC分类号： H01R11/18 , G01N27/4062 , H01R11/01 , H01R13/2442
摘要： A sensor includes a detection element; a plurality of terminal members, each of the terminal members including an elongated frame body portion extending along the axial direction, an element contact portion in elastic contact with an electrode terminal, and a folded portion connecting the frame body portion and the element contact portion; and a separator. The element contact portion of each of the terminal members has a turning portion which turns inward with respect to the width direction between the folded portion and a contact portion in contact with an electrode terminal. In those two of the terminal members which are adjacent to each other along the width direction, the distance along the width direction between the contact portions is smaller than the distance along the width direction between the frame body portions.
摘要翻译：传感器包括检测元件; 多个端子构件，每个端子构件包括沿轴向延伸的细长框架体部分，与电极端子弹性接触的元件接触部分和连接框架本体部分和元件接触部分的折叠部分; 和分隔符。每个端子构件的元件接触部分具有相对于折叠部分和与电极端子接触的接触部分之间的宽度方向向内倾斜的转动部分。在沿着宽度方向彼此相邻的那些端子构件中，接触部之间沿着宽度方向的距离小于框体部之间沿着宽度方向的距离。

4. 发明授权

US09261536B2 Test contactor for electrical testing of electronic components 有权
标题翻译：用于电子元件电气测试的测试接触器
公开(公告)号：US09261536B2
公开(公告)日：2016-02-16
申请号：US13584971
申请日：2012-08-14
申请人： Hing Suen Siu , Yu Sze Cheung , Chi Wah Cheng , Kai Fung Lau
发明人： Hing Suen Siu , Yu Sze Cheung , Chi Wah Cheng , Kai Fung Lau
IPC分类号： G01R31/20 , G01R31/02 , G01R31/26 , G01R31/302 , H01R11/18 , H01R13/00 , H05K1/00 , G01R1/067 , G01R1/04 , G01R1/073
CPC分类号： G01R1/06772 , G01R1/0416 , G01R1/07342
摘要： A testing apparatus for electronic components comprises a mounting block and a plurality of contact strips arranged on the mounting block. The contact strips are configured such that electrical leads of an electronic component are operative to press against and bend the contact strips in a biasing direction to ensure good contact between the electrical leads and the contact strips during testing of the electronic component. Further, a preload block located on the mounting block is operative to contact and apply a pre-stress force onto the contact strips in the biasing direction prior to contact between the electrical leads and the contact strips.
摘要翻译：一种用于电子部件的测试装置包括安装块和布置在安装块上的多个接触条。接触条被配置成使得电子部件的电引线可操作以在偏置方向上按压和弯曲接触片，以确保电子部件测试期间电引线和接触片之间的良好接触。此外，位于安装块上的预加载块可操作以在电引线和接触片之间接触之前在偏压方向上接触并施加预接触力。

5. 发明申请

US20150303616A1 ULTRASOUND PROBE AND ULTRASOUND PROBE CABLE 审中-公开
标题翻译：超声波探头和超声探头电缆
公开(公告)号：US20150303616A1
公开(公告)日：2015-10-22
申请号：US14389541
申请日：2013-03-14
申请人： HITACHI ALOKA MEDICAL, LTD.
发明人： Tomoyuki YAGI , Gen SHIINA , Hakaru MATSUI
IPC分类号： H01R13/58 , H01B3/46 , A61B8/00 , H01R11/18 , A61B8/12 , H02G3/04 , H01B3/44
CPC分类号： H01R13/5845 , A61B8/12 , A61B8/4444 , A61B8/4494 , A61B8/56 , A61B2562/222 , A61B2562/225 , H01B3/445 , H01B3/46 , H01R11/18 , H02G3/0462
摘要： An ultrasound probe according to the present invention includes: a main body section including a plurality of transducers configured to send and receive an ultrasonic wave to and from an inside of a diagnosing object; a cable including a plurality of signal lines connected to the plurality of transducers, and a sheath configured to cover the plurality of signal lines; a connector section configured to connect the cable to an ultrasound diagnostic apparatus; and a bush including a through hole where the cable is passed, configured to fix the cable passed through the through hole together with the sheath that is folded back, and including a fixed portion fixed, in place, to the connector section.
摘要翻译：根据本发明的超声波探头包括：主体部分，包括多个换能器，其构造成向诊断对象内部发送和接收超声波; 包括连接到所述多个换能器的多条信号线的电缆以及被配置为覆盖所述多条信号线的护套; 连接器部，被配置为将所述电缆连接到超声波诊断装置; 以及包括电缆通过的通孔的衬套，其构造成将与通过所述通孔一起穿过的电缆与被折回的护套一起固定，并且包括固定在适配器上的固定部分。

6. 发明申请

US20120139734A1 ELECTRICAL CONNECTOR CLIP FOR MEDICAL SENSORS 有权
标题翻译：医疗传感器电气连接器夹
公开(公告)号：US20120139734A1
公开(公告)日：2012-06-07
申请号：US13322984
申请日：2009-05-29
申请人： Bo Olde , Eddie Nilsson , Derek White , Thierry Court , Eric Roussi
发明人： Bo Olde , Eddie Nilsson , Derek White , Thierry Court , Eric Roussi
IPC分类号： G08B21/00 , A61B5/04 , H01R11/18
CPC分类号： A61B5/0416 , A61B2562/227 , H01R11/22 , H01R2201/12
摘要： A connector clip for medical sensors, including a first main body having two main tip contacts in electrical contact with electrical wires connectable to an instrument and a second main body mounted on the first main body and movable with respect to the first main body between an open position and a closed position. Two auxiliary tip contacts and an electric/electronic circuit provided with two connecting leads each electrically connected to one of the two auxiliary tip contacts are positioned in first or second main body. When a disposable sensor tab is correctly located and clamped each of two contacts is in contact with one of the main tip contacts and one of the auxiliary tip contacts and the electric circuit is connected in parallel with an electrical circuit defined by the sensor
摘要翻译：一种用于医疗传感器的连接器夹，包括第一主体，其具有与可连接到仪器的电线电接触的两个主尖端触点和安装在第一主体上的第二主体，并且可相对于第一主体在打开状态位置和关闭位置。两个辅助尖端触点和设置有两个连接引线的电气/电子电路，每个连接引线各自电连接到两个辅助尖端触点中的一个，其位于第一或第二主体中。当一次性传感器突片正确定位并夹紧时，两个触点中的每一个与主尖端触点中的一个接触，并且辅助尖端触点之一和电路与由传感器限定的电路并联连接

7. 发明授权

US07639026B2 Electronic device test set and contact used therein 有权
标题翻译：其中使用的电子设备测试装置和触点
公开(公告)号：US07639026B2
公开(公告)日：2009-12-29
申请号：US11677870
申请日：2007-02-22
申请人： Dennis B. Shell , Mathew L. Gilk , Jose E. Lopez
发明人： Dennis B. Shell , Mathew L. Gilk , Jose E. Lopez
IPC分类号： G01R31/02 , H01R11/18
CPC分类号： G01R1/0466
摘要： A contact for use in a test set which can be mounted to a load board of a tester apparatus. The contact, which serves to electrically connect at least one lead of a device being tested with a corresponding metallic trace on the load board, has a first end defining multiple contact points. As the contact is rotated about an axis generally perpendicular to a plane defined by the contact, successive contact points are sequentially engaged by a lead of the device being tested.
摘要翻译：用于可安装到测试仪装置的负载板的测试装置中的触点。用于将被测试设备的至少一个引线与负载板上的对应金属迹线电连接的接触件具有限定多个接触点的第一端。当接触件围绕大致垂直于由接触件限定的平面的轴线旋转时，连续的接触点依次被被测试设备的引线接合。

8. 发明授权

US07074072B2 Method of making contact with circuit units to be tested in a tester and contact-making apparatus for implementing the method 失效
标题翻译：在用于实施该方法的测试器和接触制造装置中与要测试的电路单元接触的方法
公开(公告)号：US07074072B2
公开(公告)日：2006-07-11
申请号：US10900664
申请日：2004-07-28
申请人： Michael Huebner
发明人： Michael Huebner
IPC分类号： H01R11/18
CPC分类号： G01R31/2889 , G01R1/0735
摘要： A contact-making apparatus for making contact with circuit units to be tested in a tester contains a printed circuit board device that has electrical connections to the tester, and a test module device. The test module device has first contact-making elements for making electrical contact between the test module device and the printed circuit board device, and second contact-making elements for making electrical contact between the test module device and the circuit unit to be tested. When the printed circuit board device and the circuit unit to be tested are pressed onto each other, a spring force of the first contact-making elements is lower than the spring force of the second contact-making elements under a low initial compression, and a spring force of the first contact-making elements are higher than the spring force of the second contact-making elements under a high final compression.
摘要翻译：用于在测试器中与要测试的电路单元接触的接触制造装置包含与测试器电连接的印刷电路板装置和测试模块装置。测试模块设备具有用于在测试模块设备和印刷电路板设备之间进行电接触的第一接触元件，以及用于在测试模块设备和要测试的电路单元之间进行电接触的第二接触元件。当印刷电路板装置和待测试的电路单元彼此压紧时，第一接触元件的弹簧力低于初始压缩低的第二接触元件的弹簧力，并且第一接触元件的弹簧力高于第二接触元件在高最终压缩下的弹簧力。

9. 发明申请

US20050035777A1 Probe holder for testing of a test device 失效
公开(公告)号：US20050035777A1
公开(公告)日：2005-02-17
申请号：US10954496
申请日：2004-09-29
申请人： Randy Schwindt
发明人： Randy Schwindt
IPC分类号： G01R1/073 , G01R1/067 , G01R19/00 , G01R31/28 , G01R35/00 , H01L21/66 , H01R11/18 , G01R31/02
CPC分类号： G01R1/067 , B82Y35/00 , G01R1/06705 , G01R1/06772 , G01R1/07342 , G01R1/18 , G01R19/0023 , G01R35/00 , H01R11/18
摘要： A system for low-current testing of a test device includes a probing device for probing a probing site on the test device. The probing device includes a dielectric substrate having first and second sides, an elongate conductive path on the first side of the substrate, an elongate probing element connected to the elongate conductive path so as to extend in a cantilevered manner beyond the substrate, and a conductive area on the second side of the substrate. The probe housing is matingly detachably engageable with the probing device.

10. 发明授权

US6053777A Coaxial contact assembly apparatus 失效
标题翻译：同轴接触装配装置
公开(公告)号：US6053777A
公开(公告)日：2000-04-25
申请号：US145914
申请日：1998-09-02
申请人： Stephen A. Boyle
发明人： Stephen A. Boyle
IPC分类号： H01R11/18 , G01R1/06 , G01R1/067 , G01R1/073 , H01R9/05 , H01R13/24 , H01R24/44 , H01R103/00
CPC分类号： G01R1/06722 , G01R1/06 , H01R13/2421 , G01R1/07328 , H01R2103/00 , H01R24/44 , H01R9/05
摘要： A coaxial contact assembly (10,10', 10") has a cylindrical ground plunger (30) which is fixedly attached to the ground conductor (1b) of a coaxial cable (1,1') through a ground sleeve (28) and mounted in a test head support (4) for sliding movement therein. An inner contact plunger barrel (18) is fixedly attached to the signal conductor (1a) of the coaxial cable either through a signal sleeve (16) for a replaceable inner contact assembly, or directly for a dedicated unit. An inner contact plunger (20) received in the plunger barrel has a contact portion (20c) biased outwardly to extend a selected amount beyond the ground plunger (30) in a given direction by a first spring member (24) while a second spring (36) biases the ground plunger outwardly in the given direction to a preset location. The spring force of the second spring is greater than that of the first spring so that initially plunger (20) will move inwardly independently of the ground plunger upon engagement with a test site until coplanarity occurs after which both the inner and outer contact portions will move together. Contact assemblies may be joined together through a flexible cable to form a double-ended configuration which can accommodate offset as well as in-line mounting. The ground plunger (30) and inner contact plunger barrel (18) are maintained in spaced coaxial relation by use of spaced members (32,34) in one embodiment and a single member having spaced apart portions (32',34') joined by a reduced diameter web (33) in a modified embodiment.
摘要翻译：同轴接触组件（10,10'，10“）具有通过接地套筒（28）固定地连接到同轴电缆（1,1'）的接地导体（1b）的圆柱形接地柱塞（30）并安装在用于在其中滑动的测试头支撑件（4）中。内部接触柱塞筒（18）通过信号套筒（16）固定地连接到同轴电缆的信号导体（1a），用于可更换的内部接触组件，或直接用于专用单元。容纳在柱塞筒中的内部接触柱塞（20）具有向外偏压的接触部分（20c），以通过第一弹簧构件（24）在给定方向上延伸超过接地柱塞（30）的选定量，而第二弹簧 36）将接地柱塞沿给定方向向外偏压到预设位置。第二弹簧的弹力大于第一弹簧的弹簧力，使得当与测试部位接合时，最初的柱塞（20）将独立于接地柱塞向内移动，直到共面性发生，之后内部和外部接触部分将移动一起。接触组件可以通过柔性电缆连接在一起以形成可以适应偏移以及在线安装的双端配置。在一个实施例中，接地柱塞（30）和内部接触柱塞筒（18）通过使用间隔开的构件（32,34）保持间隔开的同轴关系，并且具有间隔开的部分（32'，34'）的单个构件通过在改进的实施例中的直径减小的卷筒纸（33）。

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