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    • 2. 发明授权
    • Test fixture for matched impedance testing
    • 测试夹具用于匹配阻抗测试
    • US06191601B1
    • 2001-02-20
    • US09255385
    • 1999-02-22
    • Mark A. Swart
    • Mark A. Swart
    • G01R3102
    • G01R31/2805G01R1/07328G01R31/2808
    • A test fixture for matched impedance testing of a printed circuit board having a top plate for supporting the printed circuit board having matched impedance circuit traces extending from test site locations on the printed circuit board requiring matched impedance testing. Spring probes extend through holes in the top plate for transmission of test signals from the test sites on the printed circuit board to the matched impedance circuit traces. A TDR meter is wired to the top plate by coaxial connectors attached to the circuit traces to read the test signals.
    • 一种用于印刷电路板的匹配阻抗测试的测试夹具,其具有用于支撑印刷电路板的顶板,该印刷电路板具有从印刷电路板上的测试位置位置延伸的匹配的阻抗电路迹线,需要匹配的阻抗测试。 弹簧探针延伸穿过顶板中的孔,用于将测试信号从印刷电路板上的测试点传输到匹配的阻抗电路迹线。 TDR仪表通过连接到电路迹线的同轴连接器连接到顶板,以读取测试信号。
    • 3. 发明授权
    • Translator fixture with module for expanding test points
    • 翻译夹具具有用于扩展测试点的模块
    • US5798654A
    • 1998-08-25
    • US758911
    • 1996-12-02
    • David R. Van LoanMark A. Swart
    • David R. Van LoanMark A. Swart
    • G01R1/073G01R31/28
    • G01R1/07328G01R1/07378G01R1/07371G01R31/2805
    • A translator fixture for a grid-type test fixture for testing circuit boards. In regions of the circuit board where test point density exceeds the grid spacing of probes in a grid base the test points are reached by a test module that plugs into the translator fixture and includes a grid pattern of feed-through probes for contacting special tilt pins connected to certain test points in the high density region of the board. Additional test probes, located between the rows and columns of feed-through probes, support special tilt pins for translating the remaining test points in the high density region of the board to contacts on flex circuit-type cables sandwiched on the module and extending to the periphery of the fixture for coupling to contacts on the grid base to communicate with test circuits in the test analyzer. A translator module providing an interface between the bottom of the translator fixture and the grid base includes a translator board overlying the grid base and translating test signals from a high density set of contacts on one side of the board to a standard pattern of contacts on the other side aligned with the test probes on the grid base. A receiver plate overlying the translator board receives tilt pins with a high density spacing and provides compliant connections to the high density pattern of contacts on the translator board.
    • 用于测试电路板的网格型测试夹具的翻译夹具。 在电路板的测试点密度超过网格中的探头的网格间距的区域中,测试模块通过插入转换器固定装置的测试模块达到测试点,并且包括用于接触特殊倾斜引脚的馈通探针的格栅图案 连接到板的高密度区域中的某些测试点。 位于馈通探针的行和列之间的附加测试探针支持特殊的倾斜销,用于将板的高密度区域中的剩余测试点转换为夹在模块上的柔性电路型电缆上的触点,并延伸到 固定装置的周边,用于耦合到电网基座上的触点,以与测试分析仪中的测试电路通信。 翻译器模块提供翻译器固定装置的底部和网格之间的界面,包括翻转板,覆盖网格基底,并将来自板的一侧的高密度触点组的测试信号转换成板上的标准接触模式 另一侧与网格上的测试探针对齐。 覆盖翻译板的接收器板接收具有高密度间隔的倾斜销,并提供与转换器板上的高密度接触图案的兼容连接。
    • 4. 发明授权
    • Rotationally actuated compliant electrical connector
    • 旋转驱动兼容电连接器
    • US5772459A
    • 1998-06-30
    • US622317
    • 1996-03-15
    • Mark A. Swart
    • Mark A. Swart
    • H01R12/83H01R13/193H01R9/09
    • H01R13/193H01R12/83
    • A rotationally actuated compliant electrical connector includes a male connector member having an elongated body with a head at one body end, and a female connector member having a generally hollow body with an internal cavity. The male connector member includes at least one electrical contact disposed within the head adjacent a tip. The head is positioned perpendicular to the male connector member body. The female connector member includes at least one electrical contact disposed within the cavity and adapted to connect with respective electrical contacts of the male connector member when the head of the male connector member is rotatably displaced within the cavity. The male and female connector members are each adapted to accommodate pivoting rotational movement of the head within the cavity to produce electrical connection between respective electrical contacts. The male and female connector members each include a complementary mechanism to provide releasable locking attachment between the male and female connector members, when electrical connection between respective electrical contacts is achieved, that is independent of the electrical contacts.
    • 旋转驱动的柔性电连接器包括具有在一个主体端具有头部的细长主体的阳连接器构件和具有具有内部空腔的大致中空主体的阴连接器构件。 阳连接器构件包括设置在头部内的至少一个电触头,邻近尖端。 头部垂直于阳连接器构件体定位。 阴连接器构件包括设置在空腔内的至少一个电触点,并且当阳连接器构件的头部在空腔内可旋转地移位时,该至少一个电触头适于与阳连接器构件的相应的电触点连接。 阳连接器构件和阴连接器构件各自适于容纳头部在空腔内的枢转旋转运动,以在相应的电触头之间产生电连接。 阳和阴连接器构件各自包括互补机构,以在实现相应的电触点之间的电连接时,提供在阳连接器构件和阴连接器构件之间的可释放的锁定附接,其独立于电触点。
    • 5. 发明授权
    • Pneumatic test fixture with springless test probes
    • 气动试验夹具,带无弹簧试验探头
    • US5252916A
    • 1993-10-12
    • US827023
    • 1992-01-27
    • Mark A. Swart
    • Mark A. Swart
    • G01R1/073H01R11/18G01R31/02
    • G01R1/07307G01R1/07314H01R11/18H01R12/62
    • A fluid actuated test fixture with springless contacts for use in the automatic testing of printed circuit boards is connected to an electronic circuit tester for performing high-speed testing of circuits on the board. The fixture includes a housing, an inner chamber formed by covering the opening of an air chamber housing with an elastomeric diaphragm, a support plate with a flex circuit laminated along one side, and an array of solid (springless) test probes disposed in the support plate for access to a surface of the circuit board. When the circuit board to be tested is placed on the fixture, a vacuum drawn between the circuit board and support plate urges the circuit board to contact the test probes. When the pressure within the inner chamber is increased, the probes move into the diaphragm to stretch the diaphragm and the diaphragm applies a resilient spring-like counter-force against the test probes in unison, which transfers the spring force to the test points on the board under test. A set of electrical test signals is communicated from the test probes through printed circuits on the flex circuit and through an array of interface pins connected to the circuit traces on the flex circuit.
    • 具有用于印刷电路板自动测试的无弹簧触点的流体致动测试夹具连接到用于对板上的电路进行高速测试的电子电路测试器。 固定装置包括壳体,通过用弹性体隔膜覆盖气室壳体的开口形成的内室,具有沿着一侧层叠的柔性电路的支撑板和布置在支撑件中的固体(无弹性)测试探针阵列 用于访问电路板表面的板。 当要测试的电路板放置在固定装置上时,在电路板和支撑板之间抽吸的真空度促使电路板与测试探针接触。 当内腔内的压力增加时,探头移动到隔膜中以拉伸隔膜,隔膜对测试探针一致地施加弹性的弹簧式反作用力,将弹簧力传递到测试点上 测试板。 一组电气测试信号通过柔性电路上的印刷电路从测试探头传送,并通过连接到柔性电路上的电路迹线的接口引脚阵列传送。
    • 6. 发明授权
    • Switch probe
    • 开关探头
    • US5233290A
    • 1993-08-03
    • US787936
    • 1991-11-05
    • Mark A. Swart
    • Mark A. Swart
    • G01R1/067G01R31/02
    • G01R1/067
    • A switch probe includes an electrically conductive tubular outer receptacle and a tubular barrel in the receptacle. The barrel has a conductive inside surface and an insulative coating on its outside surface in contact with the inside of the receptacle to isolate the barrel from the receptacle. A terminal disposed in the receptacle has a conductive bearing affixed to the conductive inside of the barrel and a conductive terminal pin extending through the receptacle. An insulative coating on the surface of the terminal contacting the inside of the receptacle electrically isolates the terminal from the receptacle. A conductive plunger travels axially in the barrel against a biasing spring which retains the plunger in a normally open position. A stop in the wall of the barrel engages the plunger to retain it at a critical distance travel spaced from the receptacle. Two parallel electrically conductive paths, electrically isolated from each other, are formed axially. One conductive path extends along the plunger, the electrically conductive inside of the barrel, a conductive portion of the terminal, and to the exterior terminal pin. the other conductive path extends along the receptacle so that travel of the plunger against the bias of the spring, from the normally open position through its closure travel distance, causes the plunger to contact the receptacle and conduct along the inside diameter of the receptacle and complete a circuit through the other conductive path.
    • 开关探头包括导电管状外部容器和容器中的管状筒体。 枪管具有导电内表面和在其外表面上的与插座内部接触的绝缘涂层,以将枪管与插座隔离。 设置在容器中的端子具有固定到筒的导电内部的导电轴承和延伸穿过容器的导电端子销。 在接触插座内部的端子表面上的绝缘涂层将端子与插座电隔离。 一个导电柱塞抵靠一个将柱塞保持在常开位置的偏置弹簧在筒体内轴向移动。 在桶的壁中的止动件与柱塞接合以将其保持在与容器间隔开的临界距离处。 轴向形成两个彼此电隔离的平行导电路径。 一个导电路径沿柱塞延伸,筒的导电内部,端子的导电部分和外部端子销。 另一个导电路径沿着插座延伸,使得柱塞抵抗弹簧的偏压从常开位置到其闭合行程距离的偏移导致柱塞接触插座并沿着插座的内径传导并完成 通过另一导电路径的电路。
    • 7. 发明授权
    • Integrated circuit carrier having built-in circuit verification
    • 集成电路载体内置电路验证
    • US5180976A
    • 1993-01-19
    • US757006
    • 1991-09-09
    • David R. Van LoanCharles J. JohnstonMark A. Swart
    • David R. Van LoanCharles J. JohnstonMark A. Swart
    • G01R1/04G01R31/316
    • G01R1/0425G01R31/316
    • Integrated circuit (IC) packages mounted on a loaded printed circuit board (PCB) are tested by a translator module by first placing a corresponding module over each package. Each module has rows of spring contacts for releasably contacting corresponding electrical leads adjacent opposite sides of the IC package. An upper surface of the module has an array of electrically conductive test pads internally connected to corresponding contacts on the module. The test pads match an array of spring probes in the test unit. The module can be a molded plastic housing with metal leaf spring contacts, or it can comprise a composite flex-circuit material with individual contacts comprising flexible spring-like metalized plastic fingers. Contacts on the test module can releasably engage the leads on the IC package directly, or they can contact separate conductive leads on the PCB adjacent the leads on the IC package. During testing, the spring probes contact the test pads on the test modules and circuit continuity is established via the electrical connections from the spring probes through the modules to the leads adjacent the IC packages. The modules translate dense in-line spacing of leads adjacent the IC packages to the oversized in-line spacing of test pads on the module. In another embodiment, the translator module is attached to a flex-circuit cable coupled to the test system electronics. The translator module is manually placed over each IC package during testing. In a further embodiment, an integrated circuit package contains a built-in test verifier system so that standard test probes can be used to test the package without use of a separate translator module.
    • 安装在加载印刷电路板(PCB)上的集成电路(IC)封装由转换器模块测试,首先在每个封装上放置相应的模块。 每个模块具有一排弹簧触点,用于可释放地接触与IC封装相对侧相对应的电引线。 模块的上表面具有内部连接到模块上的相应触点的导电测试焊盘阵列。 测试垫与测试单元中的一组弹簧探针相匹配。 模块可以是具有金属板弹簧触点的模制塑料壳体,或者其可以包括具有包括柔性弹簧状金属化塑料指状物的单独触头的复合柔性电路材料。 测试模块上的触点可以直接可释放地接合IC封装上的引线,或者它们可以接触与IC封装上引线相邻的PCB上分开的导电引线。 在测试期间,弹簧探头接触测试模块上的测试焊盘,并通过从弹簧探头通过模块到邻近IC封装的引线的电气连接建立电路连续性。 这些模块将紧邻IC封装的引线的密集在线间距转换为模块上测试焊盘的过大的在线间距。 在另一个实施例中,翻译器模块连接到耦合到测试系统电子装置的柔性电路电缆。 翻译器模块在测试期间手动放置在每个IC封装上。 在另一实施例中,集成电路封装包含内置的测试验证器系统,使得可以使用标准测试探针来测试封装而不使用单独的转换器模块。
    • 8. 发明授权
    • Optical fiber test probe having a sleeve-like plunger movable in a barrel
    • 光纤测试探针,其具有可在筒中移动的套筒状柱塞
    • US5134280A
    • 1992-07-28
    • US715025
    • 1991-06-13
    • Charles J. JohnstonMark A. Swart
    • Charles J. JohnstonMark A. Swart
    • G02B6/36G02B6/38G02B6/42
    • G02B6/3616G02B6/3873G02B6/4202G02B6/3821
    • Optical fiber test probes test the optical functions of light-emitting circuit elements or displays, or are used in optical test fixtures. In one embodiment, an optical fiber test probe comprises an optical fiber in two sections in which both are movable with a receptacle against the bias of a compression spring during testing. One fiber is contained within a removable barrel so it can be replaced by removing it from the receptacle independently of the compression spring. In their operative test position, the two optical fibers are mounted in the receptacle to maintain light-tight optical continuity during testing. In another embodiment, an optical fiber test probe comprises a barrel and an optical fiber contained within a plunger movable in the barrel, in which a free end portion of the optical fiber extends unsupported through a compression spring which applies a spring bias to an internal end of the plunger. The fiber optic probe is isolated from loads imposed on the plunger during repetitive testing with the probe. A further embodiment comprises a fiber optic test having a low compliance, one-piece, spring loaded, molded plastic optical fiber retainer.
    • 光纤测试探头测试发光电路元件或显示器的光学功能,或用于光学测试夹具。 在一个实施例中,光纤测试探头包括在两个部分中的光纤,其中两个部分在测试期间可抵抗压缩弹簧的偏压与插座一起移动。 一个纤维被容纳在可移除的桶内,因此可以独立于压缩弹簧将其从容器中取出来进行更换。 在其操作测试位置,两个光纤安装在插座中,以在测试期间保持不透光的光学连续性。 在另一个实施例中,光纤测试探针包括筒体和容纳在可在筒体内移动的柱塞内的光纤,其中光纤的自由端部分通过压缩弹簧而不支撑,该弹簧将弹簧偏压施加到内部端 的柱塞。 光纤探头与使用探头进行重复测试时与施加在柱塞上的负载隔离。 另一实施例包括具有低顺应性,单件式,弹簧加载的模制塑料光纤保持器的光纤测试。
    • 10. 发明授权
    • Translator fixture with force applying blind pins
    • 转换器夹具用力施加盲针
    • US5898314A
    • 1999-04-27
    • US606593
    • 1996-02-26
    • Mark A. Swart
    • Mark A. Swart
    • G01R1/06G01R1/073G01R31/02H05K3/00H05K10/00
    • G01R1/07371
    • A translator fixture for a printed circuit board tester has a pattern of test probes on a base upon which the translator fixture is mounted. The translator fixture includes a plurality of essentially parallel and vertically spaced apart rigid translator plates supported in a fixed position in the translator fixture. Selected patterns of holes are aligned in the translator plates for containing and supporting translator pins extending through the translator plates and for positioning the translator pins for contacting test points under pressure on a printed circuit board supported in an essentially horizontal position between the translator plates. The pins translate electrical test signals between the test points on the printed circuit board and the test probes on the base of the tester. The fixture includes a plurality of blind pins positioned in a top plate of the fixture for non-electrically applying a balancing force to the printed circuit board. The blind pins are positioned in blind holes in the top plate adjacent a surface of the printed circuit board at locations where no test points are located and opposite to a surface on the printed circuit board having the translator pins applying pressure to the test points.
    • 用于印刷电路板测试器的翻译夹具具有安装转换器夹具的底座上的测试探针的图案。 翻译器固定装置包括多个基本上平行和垂直间隔开的刚性平移板,其被支撑在转动夹具中的固定位置。 孔的选定图案在平移板中对准,用于容纳和支撑延伸穿过平移板的平移销,并且用于定位用于在支撑在平移板之间的基本水平位置的印刷电路板上的压力下接触测试点的平移销。 引脚在印刷电路板上的测试点和测试仪基座上的测试探针之间转换电气测试信号。 固定装置包括定位在固定装置的顶板中的多个盲针,用于对印刷电路板不施加平衡力。 盲引脚定位在邻近印刷电路板的表面的顶板中的盲孔中,在没有测试点的位置处并且与印刷电路板上具有向测试点施加压力的印刷电路板上的表面相对的位置。