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1. 发明授权

US07460462B2 Contact probe storage fet sensor and write heater arrangements 失效
标题翻译：接触探头存储fet传感器和写加热器布置
公开(公告)号：US07460462B2
公开(公告)日：2008-12-02
申请号：US10736600
申请日：2003-12-17
申请人： Robert G. Mejia , Richard Lee Hilton
发明人： Robert G. Mejia , Richard Lee Hilton
IPC分类号： G11B11/00
CPC分类号： G11B9/14 , B82Y10/00 , G11B9/1409 , G11B11/08 , G11B11/16
摘要： A read/write arrangement for a contact probe storage arrangement or the like, has a cantilever disposed with a medium which is movable relative to the cantilever; a device associated with one of the cantilever and the medium which is configured to be responsive to changes in electrical field between the medium and the cantilever caused by a change in distance between the medium and the cantilever; a heater disposed on the cantilever for heating the medium and for inducing localized topographical changes which represent bits of data; and a circuit which electrically interconnects both of the device and the heater.
摘要翻译：用于接触探针存储装置等的读/写装置具有悬臂，其布置有可相对于悬臂运动的介质; 与所述悬臂和所述介质中的一个相关联的装置，其被配置为响应于由所述介质和所述悬臂之间的距离的变化引起的所述介质和所述悬臂之间的电场的变化; 设置在所述悬臂上用于加热所述介质并且用于引起表示数据位的局部地形变化的加热器; 以及将装置和加热器两者电连接的电路。

2. 发明申请

US20080121028A1 Scanning Probe Microscopy Inspection and Modification System 失效
标题翻译：扫描探针显微镜检查和修改系统
公开(公告)号：US20080121028A1
公开(公告)日：2008-05-29
申请号：US11841698
申请日：2007-08-20
申请人： Victor B. Kley
发明人： Victor B. Kley
IPC分类号： G01B5/28 , G06T15/00
CPC分类号： G01Q60/58 , G01B7/31 , G01N23/225 , G01Q10/02 , G01Q10/04 , G01Q10/06 , G01Q20/00 , G01Q20/02 , G01Q30/04 , G01Q40/00 , G01Q60/04 , G01Q60/16 , G01Q60/22 , G01Q60/38 , G01Q70/02 , G01Q70/06 , G01Q80/00 , G02B21/002 , G03F1/72 , G03F1/84 , G03F7/2049 , G03F7/704 , G03F7/70616 , G11B5/232 , G11B5/3116 , G11B5/3163 , G11B5/3166 , G11B9/14 , G11B9/1409 , G11B9/1418 , G11B9/1427 , G11B9/1436 , G11B9/1445 , G11B9/1454 , G11B9/149 , G11B11/12 , G11B11/16 , G11B2005/0002 , G11B2005/0021 , H02N1/006 , Y10S977/855 , Y10S977/871
摘要： A scanning probe microscopy (SPM) inspection and/or modification system which uses SPM technology and techniques. The system includes various types of microstructured SPM probes for inspection and/or modification of the object. The components of the SPM system include microstructured calibration structures. A probe may be defective because of wear or because of fabrication errors. Various types of reference measurements of the calibration structure are made with the probe or vice versa to calibrate it. The components of the SPM system further include one or more tip machining structures. At these structures, material of the tips of the SPM probes may be machined by abrasively lapping and chemically lapping the material of the tip with the tip machining structures.
摘要翻译：使用SPM技术和技术的扫描探针显微镜（SPM）检查和/或修改系统。该系统包括用于检查和/或修改物体的各种类型的微结构化SPM探针。 SPM系统的组件包括微结构校准结构。由于磨损或由于制造错误，探头可能有缺陷。校准结构的各种参考测量用探针进行，反之亦然，以校准它。 SPM系统的部件还包括一个或多个尖端加工结构。在这些结构中，SPM探针的尖端的材料可以通过用尖端加工结构进行研磨研磨和化学研磨尖端的材料来加工。

3. 发明授权

US07184388B2 Heating elements for a storage device 失效
标题翻译：用于存储设备的加热元件
公开(公告)号：US07184388B2
公开(公告)日：2007-02-27
申请号：US10796606
申请日：2004-03-09
申请人： Corbin L. Champion , Sarah M. Brandenberger
发明人： Corbin L. Champion , Sarah M. Brandenberger
IPC分类号： G11B7/00
CPC分类号： G11B9/14 , B82Y10/00 , G11B11/007 , G11B11/16 , G11C11/14 , G11C13/0014 , G11C13/0069 , G11C13/025 , G11C23/00 , G11C2013/008
摘要： A storage device includes a probe, and a substrate comprising a storage medium and heating elements. The heating elements area adapted to heat respective regions of the storage medium to form perturbations in the respective regions of the storage medium, and the probe is adapted to detect the perturbations.
摘要翻译：存储装置包括探针和包括存储介质和加热元件的基板。加热元件区域适于加热存储介质的相应区域以在存储介质的相应区域中形成扰动，并且探针适于检测扰动。

4. 发明授权

US07068582B2 Read head for ultra-high-density information storage media and method for making the same 失效
标题翻译：用于超高密度信息存储介质的读取头和制作相同的方法
公开(公告)号：US07068582B2
公开(公告)日：2006-06-27
申请号：US10261217
申请日：2002-09-30
申请人： Sungho Jin
发明人： Sungho Jin
IPC分类号： G11B7/00
CPC分类号： B82Y10/00 , G11B5/00 , G11B5/127 , G11B5/1272 , G11B5/1278 , G11B5/17 , G11B5/3106 , G11B5/3116 , G11B5/313 , G11B9/10 , G11B9/1409 , G11B9/1418 , G11B11/005 , G11B11/007 , G11B11/16
摘要： A micro-electro-mechanical systems (MEMS) device is presented that can read very high density magnetic media and very high density CD ROMs. Both the magnetic and optical read heads comprise one or more cold cathode MEMS e-beam cells. The e-beams are deflected according to the data bit being interrogated and the state of that bit is determined by a detector. Large arrays of such cells can simultaneously read large areas of the memory media. Arrays of such MEMs detectors can comprise a plurality of “steerable” e-beam emitters that can be directed to interrogate specific data sites on the magnetic media. Thus, in some cases, the media can remain stationary. Densities of 200 gigabits per square inch or more and read speeds greater than 1000 times faster can be achieved.
摘要翻译：提出了一种可以读取非常高密度的磁性介质和非常高密度的CD ROM的微电子机械系统（MEMS）装置。磁读取头和光学读取头都包括一个或多个冷阴极MEMS电子束单元。电子束根据询问的数据位而偏转，并且该位的状态由检测器确定。这种单元的大阵列可以同时读取存储介质的大面积。这样的MEM检测器的阵列可以包括多个“可转向”电子束发射器，其可以被引导以询问磁介质上的特定数据位置。因此，在某些情况下，介质可以保持静止。可以实现200吉比特每平方英寸或更高的读取速度，大于1000倍的读取速度。

5. 发明申请

US20050201255A1 Heating elements for a storage device 失效
标题翻译：用于存储设备的加热元件
公开(公告)号：US20050201255A1
公开(公告)日：2005-09-15
申请号：US10796606
申请日：2004-03-09
申请人： Corbin Champion , Sarah Brandenberger
发明人： Corbin Champion , Sarah Brandenberger
IPC分类号： G11B9/00 , G11C11/00
CPC分类号： G11B9/14 , B82Y10/00 , G11B11/007 , G11B11/16 , G11C11/14 , G11C13/0014 , G11C13/0069 , G11C13/025 , G11C23/00 , G11C2013/008
摘要： A storage device includes a probe, and a substrate comprising a storage medium and heating elements. The heating elements area adapted to heat respective regions of the storage medium to form perturbations in the respective regions of the storage medium, and the probe is adapted to detect the perturbations.
摘要翻译：存储装置包括探针和包括存储介质和加热元件的基板。加热元件区域适于加热存储介质的相应区域以在存储介质的相应区域中形成扰动，并且探针适于检测扰动。

6. 发明申请

US20050190684A1 Nanometer scale data storage device and associated positioning system 失效
公开(公告)号：US20050190684A1
公开(公告)日：2005-09-01
申请号：US10630350
申请日：2003-07-29
申请人： Victor Kley
发明人： Victor Kley
IPC分类号： G01B7/31 , G01Q30/00 , G01Q60/10 , G01Q60/18 , G01Q60/58 , G01Q70/00 , G03F1/84 , G03F7/20 , G11B5/00 , G11B5/23 , G11B5/31 , G11B7/00 , G11B9/00 , G11B11/12 , G11B11/16 , H02N1/00
CPC分类号： G03F1/84 , G01B7/31 , G01Q80/00 , G03F7/70375 , G03F7/70483 , G11B5/232 , G11B5/3116 , G11B9/06 , G11B9/08 , G11B9/14 , G11B9/1409 , G11B9/1418 , G11B9/1427 , G11B9/1436 , G11B9/1445 , G11B9/1454 , G11B9/149 , G11B11/007 , G11B11/05 , G11B11/12 , G11B11/16 , G11B2005/0002 , G11B2005/0021 , H02N1/006 , Y10S977/851 , Y10S977/86 , Y10S977/875 , Y10S977/877
摘要： A data storage system that includes a positioning system for positioning the write/read mechanism and the storage medium of the data storage device with respect to each other in first and second predefined directions. The positioning system comprises a positioning apparatus comprising microfabricated first and second positioning assemblies. The positioning system further comprises a controller to position a positionable support structure of the first positioning assembly in a first predefined direction within a range of positioning that is larger, than the range of movement of a moveable support structure of the first positioning assembly by controlling (A) a stationary support structure clamp in clamping and unclamping the positionable structure to and from the support structure, (B) a moveable structure clamp in clamping and unclamping the positionable support structure to and from the moveable support structure, and (C) the movement of the moveable support structure. In one embodiment, one of the write/read mechanism and the storage medium is carried by the positionable support structure so that it is positioned with the first positioning assembly. The other one of the write/read mechanism and the storage medium is positioned with the second positioning assembly. In another embodiment, the positionable support structure carries the second positioning assembly and one of the write/read mechanism and the storage medium is positioned with the second positioning assembly while the other is held stationary. In several embodiments, the read/write mechanism is used:to mechanically write data to and electrically read data from the storage medium. In still another embodiment, the read/write mechanism is used to optically write data to and electrically read data from the storage medium. In yet another embodiment, the read/write mechanism is acoustically aided in electrically writing data to and reading data from the storage medium.

7. 发明申请

US20050172703A1 Scanning probe microscopy inspection and modification system 失效
标题翻译：扫描探针显微镜检查和修改系统
公开(公告)号：US20050172703A1
公开(公告)日：2005-08-11
申请号：US10616453
申请日：2003-07-08
申请人： Victor Kley
发明人： Victor Kley
IPC分类号： G01B7/31 , G01B7/34 , G01Q10/00 , G01Q10/02 , G01Q10/04 , G01Q20/00 , G01Q20/02 , G01Q30/00 , G01Q30/02 , G01Q40/00 , G01Q40/02 , G01Q60/04 , G01Q60/10 , G01Q60/18 , G01Q60/24 , G01Q60/58 , G01Q70/02 , G01Q70/16 , G01Q80/00 , G02B21/00 , G03F1/72 , G03F1/84 , G03F7/20 , G11B5/00 , G11B5/23 , G11B5/31 , G11B9/00 , G11B11/12 , G11B11/16 , H02N1/00 , G01B5/28 , H01J5/16
CPC分类号： G01Q60/58 , G01B7/31 , G01N23/225 , G01Q10/02 , G01Q10/04 , G01Q10/06 , G01Q20/00 , G01Q20/02 , G01Q30/04 , G01Q40/00 , G01Q60/04 , G01Q60/16 , G01Q60/22 , G01Q60/38 , G01Q70/02 , G01Q70/06 , G01Q80/00 , G02B21/002 , G03F1/72 , G03F1/84 , G03F7/2049 , G03F7/704 , G03F7/70616 , G11B5/232 , G11B5/3116 , G11B5/3163 , G11B5/3166 , G11B9/14 , G11B9/1409 , G11B9/1418 , G11B9/1427 , G11B9/1436 , G11B9/1445 , G11B9/1454 , G11B9/149 , G11B11/12 , G11B11/16 , G11B2005/0002 , G11B2005/0021 , H02N1/006 , Y10S977/855 , Y10S977/871
摘要： A scanning probe microscopy (SPM) inspection and/or modification system which uses SPM technology and techniques. The system includes various types of microstructured SPM probes for inspection and/or modification of the object. The components of the SPM system include microstructured calibration structures. A probe may be defective because of wear or because of fabrication errors. Various types of reference measurements of the calibration structure are made with the probe or vice versa to calibrate it. The components of the SPM system further include one or more tip machining structures. At these structures, material of the tips of the SPM probes may be machined by abrasively lapping and chemically lapping the material of the tip with the tip machining structures.
摘要翻译：使用SPM技术和技术的扫描探针显微镜（SPM）检查和/或修改系统。该系统包括用于检查和/或修改物体的各种类型的微结构化SPM探针。 SPM系统的组件包括微结构校准结构。由于磨损或由于制造错误，探头可能有缺陷。校准结构的各种参考测量用探针进行，反之亦然，以校准它。 SPM系统的部件还包括一个或多个尖端加工结构。在这些结构中，SPM探针的尖端的材料可以通过用尖端加工结构进行研磨研磨和化学研磨尖端的材料来加工。

8. 发明授权

US06724712B2 Nanometer scale data storage device and associated positioning system 失效
公开(公告)号：US06724712B2
公开(公告)日：2004-04-20
申请号：US08955031
申请日：1997-10-21
申请人： Victor B. Kley
发明人： Victor B. Kley
IPC分类号： G11B700
CPC分类号： G03F1/84 , G01B7/31 , G01Q80/00 , G03F7/70375 , G03F7/70483 , G11B5/232 , G11B5/3116 , G11B9/06 , G11B9/08 , G11B9/14 , G11B9/1409 , G11B9/1418 , G11B9/1427 , G11B9/1436 , G11B9/1445 , G11B9/1454 , G11B9/149 , G11B11/007 , G11B11/05 , G11B11/12 , G11B11/16 , G11B2005/0002 , G11B2005/0021 , H02N1/006 , Y10S977/851 , Y10S977/86 , Y10S977/875 , Y10S977/877
摘要： A data storage system that includes a positioning system for positioning the write/read mechanism and the storage medium of the data storage device with respect to each other in first and second predefined directions. The positioning system comprises a positioning apparatus comprising microfabricated first and second positioning assemblies. The positioning system further comprises a controller to position a positionable support structure of the first positioning assembly in a first predefined direction within a range of positioning that is larger than the range of movement of a moveable support structure of the first positioning assembly by controlling (A) a stationary support structure clamp in clamping and unclamping the positionable structure to and from the support structure, (B) a moveable structure clamp in clamping and unclamping the positionable support structure to and from the moveable support structure, and (C) the movement of the moveable support structure. In one embodiment, one of the write/read mechanism and the storage medium is carried by the positionable support structure so that it is positioned with the first positioning assembly. The other one of the write/read mechanism and the storage medium is positioned with the second positioning assembly. In another embodiment, the positionable support structure carries the second positioning assembly and one of the write/read mechanism and the storage medium is positioned with the second positioning assembly while the other is held stationary. In several embodiments, the read/write mechanism is used to mechanically write data to and electrically read data from the storage medium. In still another embodiment, the read/write mechanism is used to optically write data to and electrically read data from the storage medium. In yet another embodiment, the read/write mechanism is acoustically aided in electrically writing data to and reading data from the storage medium.

9. 发明授权

US06353219B1 Object inspection and/or modification system and method 有权
标题翻译：对象检查和/或修改系统和方法
公开(公告)号：US06353219B1
公开(公告)日：2002-03-05
申请号：US09441033
申请日：1999-11-16
申请人： Victor B. Kley
发明人： Victor B. Kley
IPC分类号： G01N2300
CPC分类号： G01Q70/16 , G01B7/31 , G01Q20/02 , G01Q40/00 , G01Q60/16 , G01Q60/22 , G01Q60/38 , G01Q60/58 , G01Q70/02 , G02B21/002 , G03F1/84 , G03F7/0002 , G03F7/2049 , G03F7/704 , G03F7/70616 , G11B5/232 , G11B5/3116 , G11B5/3163 , G11B5/3166 , G11B9/14 , G11B9/1409 , G11B9/1418 , G11B9/1427 , G11B9/1436 , G11B9/1445 , G11B9/1454 , G11B9/149 , G11B11/12 , G11B11/16 , G11B2005/0002 , G11B2005/0021 , H02N1/006
摘要： A SPM (scanning probe microscopy) system for modifying an object includes producing measurements indicative of modifications to be made to the object. In accordance with the measurements, one or more SPM probes are manipulated to effect the modifications.
摘要翻译：用于修改对象的SPM（扫描探针显微镜）系统包括产生指示对物体进行修改的测量。根据测量，操纵一个或多个SPM探针以进行修改。

10. 发明授权

US06337479B1 Object inspection and/or modification system and method 失效
标题翻译：对象检查和/或修改系统和方法
公开(公告)号：US06337479B1
公开(公告)日：2002-01-08
申请号：US09355072
申请日：1999-07-21
申请人： Victor B. Kley
发明人： Victor B. Kley
IPC分类号： G01N2300
CPC分类号： G01Q60/58 , G01B7/31 , G01N23/225 , G01Q10/02 , G01Q10/04 , G01Q10/06 , G01Q20/00 , G01Q20/02 , G01Q30/04 , G01Q40/00 , G01Q60/04 , G01Q60/16 , G01Q60/22 , G01Q60/38 , G01Q70/02 , G01Q70/06 , G01Q80/00 , G02B21/002 , G03F1/72 , G03F1/84 , G03F7/2049 , G03F7/704 , G03F7/70616 , G11B5/232 , G11B5/3116 , G11B5/3163 , G11B5/3166 , G11B9/14 , G11B9/1409 , G11B9/1418 , G11B9/1427 , G11B9/1436 , G11B9/1445 , G11B9/1454 , G11B9/149 , G11B11/12 , G11B11/16 , G11B2005/0002 , G11B2005/0021 , H02N1/006 , Y10S977/855 , Y10S977/871
摘要： A SPM (scanning probe microscopy) inspection and/or modification system which uses SPM technology and techniques in new and novel ways to inspect and/or modify an object. The system includes various types of microstructured SPM (scanning probe microscopy) probes for inspection and/or modification of the object. The components of the SPM system include microstructured calibration structures. A probe may be defective because of wear or because of fabrication errors. Various types of reference measurements of the calibration structure are made with the probe or vice versa to calibrate it. The components of the SPM system further include one or more tip machining structures. At these structures, material of the tips of the SPM probes may be machined by abrasively lapping and chemically lapping the material of the tip with the tip machining structures.
摘要翻译：使用SPM技术和新技术的SPM（扫描探针显微镜）检查和/或修改系统来检查和/或修改物体。该系统包括用于检查和/或修改物体的各种类型的微结构化SPM（扫描探针显微镜）探针。 SPM系统的组件包括微结构校准结构。由于磨损或由于制造错误，探头可能有缺陷。校准结构的各种参考测量用探针进行，反之亦然，以校准它。 SPM系统的部件还包括一个或多个尖端加工结构。在这些结构中，SPM探针的尖端的材料可以通过用尖端加工结构进行研磨研磨和化学研磨尖端的材料来加工。

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