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    • 3. 发明授权
    • High purity silica crucible by electrolytic refining, and its production method and pulling method
    • 高纯度二氧化硅坩埚通过电解精炼及其制备方法和拉拔方法
    • US07160387B2
    • 2007-01-09
    • US10781682
    • 2004-02-20
    • Hiroshi KishiMasanori FukuiYoshiyuki Tsuji
    • Hiroshi KishiMasanori FukuiYoshiyuki Tsuji
    • C30B13/06
    • C03C3/06C03B19/095C03B2201/03C30B15/10C30B29/06Y10S117/90Y10T117/1032Y10T117/1052
    • This invention provides a high purity silica crucible having low impurity concentration in its inner portion, and its production method. The crucible, in which at least each content of Na and Li being contained in the depth of 1 mm from the inside surface is less than 0.05 ppm, is given by a production method of a high purity silica glass crucible, wherein a purity of the melted silica powder layer is increased by applying a voltage between a mold and an arc electrode to move impurity metals being contained in the melted silica glass layer to the outside, when the silica crucible is produced by arc plasma heating a raw material powder of silica in an inside surface of a hollow rotary mold. The method comprises, keeping an arc electrode potential of within ±500 V during an arc melting, applying a voltage of from −1000 V to −20000 V to a mold being insulated to the ground, and applying a high voltage to the un-melted silica powder layer of the outside.
    • 本发明提供了内部杂质浓度低的高纯度二氧化硅坩埚及其制造方法。 通过高纯度二氧化硅玻璃坩埚的制造方法给出至少含有内表面1mm以内的Na和Li的含量小于0.05ppm的坩埚,其中,纯度为 通过在模具和电弧电极之间施加电压来增加熔融二氧化硅粉末层,以将熔融石英玻璃层中所含的杂质金属移动到外部,当通过电弧等离子体加热二氧化硅原料粉末 中空旋转模具的内表面。 该方法包括:在电弧熔化期间将电弧电极电位保持在±500V以内,向-1000V至-20000V施加电压至与地绝缘的模具,并将高电压施加到未熔化 二氧化硅粉末层外面。
    • 6. 发明授权
    • Method of manufacturing silicon single crystal, apparatus for pulling silicon single crystal and vitreous silica crucible
    • 硅单晶的制造方法,硅单晶拉丝装置和玻璃状石英坩埚
    • US08696813B2
    • 2014-04-15
    • US12786911
    • 2010-05-25
    • Masanori FukuiHideki WatanabeNobumitsu Takase
    • Masanori FukuiHideki WatanabeNobumitsu Takase
    • C30B15/04
    • C30B15/20C30B15/10C30B29/06
    • Leakage of silicon melt is monitored and touch of a seed crystal at the silicon melt is detected, and in addition, reinforcement of a vitreous silica crucible to be endurable during pulling for a long time and decrease of impurity concentration of a silicon single crystal can be expected. A method for manufacturing a silicon single crystal is provided. The method includes: detecting touching status of a seed crystal at silicon melt by supplying voltage V1 using a crucible side as a negative electrode and a wire side as a positive electrode and by monitoring change of the voltage, when the seed crystal provided at a front end of the wire touches the silicon melt inside a vitreous silica crucible; devitrifying an inner surface of the vitreous silica crucible as supplying voltage V2 using the crucible side as a positive electrode and the wire side as a negative electrode during a temperature control period; and growing a silicon single crystal by slowly pulling the seed crystal as supplying voltage V3 using the crucible side as a negative electrode and the wire side as a positive electrode after the temperature control period.
    • 监测硅熔体的泄漏,并检测硅熔体中的晶种的接触,此外,长时间拉伸和降低硅单晶的杂质浓度可以耐久的石英玻璃坩埚的增强可以是 预期。 提供了制造硅单晶的方法。 该方法包括:通过使用坩埚侧作为负极并且线侧作为正极​​来提供电压V1,并通过监视电压的变化来检测硅熔体处的晶种的触摸状态 导线的末端触及石英玻璃坩埚内的硅熔体; 在温度控制期间,使用坩埚侧作为正极​​而将作为负极的线侧作为供给电压V2而使玻璃状石英坩埚的内表面失透; 并且通过在坩埚侧作为负极并且在温度控制周期之后将线侧作为正极​​,通过缓慢地拉晶晶体作为供给电压V3来生长硅单晶。
    • 9. 发明申请
    • Vitreous silica crucible manufacturing apparatus
    • 硅玻璃坩埚制造设备
    • US20100170298A1
    • 2010-07-08
    • US12684178
    • 2010-01-08
    • Masanori FukuiHiroshi KishiMasaki Morikawa
    • Masanori FukuiHiroshi KishiMasaki Morikawa
    • C03B19/06
    • C03B19/095H05B7/085
    • A vitreous silica crucible manufacturing apparatus includes a plurality of carbon electrodes configured to heat and melt raw material powder by arc discharge, and a value of a ratio R2/R1 of a diameter R2 of a front end of each of the carbon electrodes to a diameter R1 of a base end is set in a range of 0.6 to 0.8. Each carbon electrode has a diameter reduction portion formed at a front end position and reduced in diameter from a diameter R3 of a base end side to the diameter R2 of the front end. When a length of the diameter reduction portion is L1, the diameter of the front end is R2, the diameter of the base end is R1, an angle between the axis lines of the carbon electrodes is θ1, and X=(R1−R2)/2, a value of L1−(X/tan(θ1/2)) is set in a range of 50 to 150 mm.
    • 玻璃状石英玻璃坩埚的制造装置具有多个碳电极,其通过电弧放电来加热和熔化原料粉末,并且每个碳电极的前端的直径R2的比R2 / R1的值与直径 基端的R1设定在0.6〜0.8的范围内。 每个碳电极具有形成在前端位置并且从基端侧的直径R3到前端的直径R2的直径减小的直径减小部分。 当直径减小部分的长度为L1时,前端的直径为R2,基端的直径为R1,碳电极的轴线之间的角度为1; X =(R1- R2)/ 2,将L1-(X / tan(& 1/2))的值设定在50〜150mm的范围内。