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    • 3. 发明授权
    • Method and apparatus for processing surface of semiconductor layer
    • 半导体层表面处理方法及装置
    • US5308791A
    • 1994-05-03
    • US848357
    • 1992-03-09
    • Yasuhiro HoriikeKohei Kawamura
    • Yasuhiro HoriikeKohei Kawamura
    • C23F4/00H01L21/00H01L21/302H01L21/304H01L21/306H01L21/3065
    • H01L21/02046H01L21/67028Y10S438/906Y10S438/974
    • An apparatus for processing the surface of an Si wafer includes a vacuum cleaning chamber in which said Si wafer is housed. He gas is supplied into the cleaning chamber and micro-wave and magnetic field are applied to the He gas to generate excited species which emit vacuum ultraviolet. The vacuum ultraviolet is radiated onto the wafer surface to enable its energy to cut bonds between Si atoms of said wafer and O atoms and forming a natural oxide film on the wafer surface. Ar gas is also supplied into the cleaning chamber to create ions of said Ar gas due to energy added from said excited species. Said ions are supplied onto the wafer surface to form floating potential above said wafer surface. Said ions collide against said wafer surface to eliminate O atoms from said wafer surface. A process chamber is connected to the cleaning chamber through a load lock chamber. Al film is formed on the wafer surface, from which the natural oxide film has been eliminated, in the process chamber.
    • 一种用于处理Si晶片表面的设备包括其中容纳有所述Si晶片的真空清洁室。 将He气供应到清洗室中,并将微波和磁场施加到He气体以产生发射真空紫外线的激发物质。 将真空紫外线辐射到晶片表面上,使其能量切割所述晶片的Si原子和O原子之间的键,并在晶片表面上形成天然氧化物膜。 由于从所述激发物质添加的能量,也将Ar气体供应到清洁室中以产生所述Ar气体的离子。 所述离子被提供到晶片表面上以在所述晶片表面上方形成浮动电位。 所述离子与所述晶片表面碰撞以从所述晶片表面消除O原子。 处理室通过负载锁定室连接到清洁室。 在处理室中在晶片表面上形成Al膜,其中已经除去了自然氧化膜。
    • 8. 发明申请
    • Plasma processing method and plasma processing apparatus
    • 等离子体处理方法和等离子体处理装置
    • US20070077737A1
    • 2007-04-05
    • US10580036
    • 2004-11-19
    • Yasuo KobayashiKohei Kawamura
    • Yasuo KobayashiKohei Kawamura
    • H01L21/26H01L21/42H05H1/24
    • C23C16/511C23C16/26C23C16/4404C23C16/4405H01J37/32192H01J37/3222H01J37/32238H01J37/3244
    • A microwave is radiated into a processing chamber (1) from a planar antenna member of an antenna (7) through a dielectric plate (6). With this, a C5F8 gas supplied into the processing chamber (1) from a gas supply member (3) is changed (activated) into a plasma so as to form a fluorine-containing carbon film of a certain thickness on a semiconductor wafer (W). Each time a film forming process of forming a film on one wafer is carried out, a cleaning process and a pre-coating process are carried out. In the cleaning process, the inside of the processing chamber is cleaned with a plasma of an oxygen gas and a hydrogen gas. In the pre-coating process, the C5F8 gas is changed into a plasma, and a pre-coat film of fluorine-containing carbon thinner than the fluorine-containing carbon film formed in the film forming process is formed.
    • 通过电介质板(6)将微波从天线(7)的平面天线部件辐射到处理室(1)中。 由此,从气体供给构件(3)供给到处理室(1)中的C 5 C 8 C 8气体被变更(激活)为等离子体,从而 在半导体晶片(W)上形成一定厚度的含氟碳膜。 每次进行在一个晶片上形成膜的成膜工艺时,进行清洗处理和预涂工序。 在清洁过程中,用氧气和氢气的等离子体清洁处理室的内部。 在预涂布过程中,将C 5 F 8 N气体变成等离子体,并且含氟碳的预涂膜比含氟 形成在成膜工艺中形成的碳膜。