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    • 9. 发明授权
    • Integrated multi-step gap fill and all feature planarization for conductive materials
    • 集成的多步间隙填充和导电材料的所有特征平面化
    • US07323095B2
    • 2008-01-29
    • US10792069
    • 2004-03-03
    • Wei-Yung HsuLiang-Yuh ChenRatson MoradDaniel A. CarlSasson Somekh
    • Wei-Yung HsuLiang-Yuh ChenRatson MoradDaniel A. CarlSasson Somekh
    • C25D21/00C25D7/12
    • C25D7/123C25D5/06C25D5/22C25D17/001C25D17/008H01L21/288H01L21/2885H01L21/3212H01L21/7684H01L21/76877
    • A method and apparatus is provided for depositing and planarizing a material layer on a substrate. In one embodiment, an apparatus is provided which includes a partial enclosure, a permeable disc, a diffuser plate and optionally an anode. A substrate carrier is positionable above the partial enclosure and is adapted to move a substrate into and out of contact or close proximity with the permeable disc. The partial enclosure and the substrate carrier are rotatable to provide relative motion between a substrate and the permeable disc. In another aspect, a method is provided in which a substrate is positioned in a partial enclosure having an electrolyte therein at a first distance from a permeable disc. A current is optionally applied to the surface of the substrate and a first thickness is deposited on the substrate. Next, the substrate is positioned closer to the permeable disc. During the deposition, the partial enclosure and the substrate are rotated relative one another.
    • 提供了一种用于沉积和平坦化衬底上的材料层的方法和装置。 在一个实施例中,提供了一种装置,其包括部分外壳,可渗透盘,漫射板和任选的阳极。 衬底载体可定位在部分外壳上方,并且适于将衬底移动到与可渗透盘接触或接近的位置。 部分外壳和基板载体可旋转以提供基板和可渗透盘之间的相对运动。 在另一方面,提供了一种方法,其中将基底定位在其中具有电解质的部分封闭体中,其中离开可渗透盘的第一距离处。 任选地将电流施加到衬底的表面,并且在衬底上沉积第一厚度。 接下来,将基板定位成更靠近可渗透盘。 在沉积期间,部分封闭物和基底相对彼此旋转。
    • 10. 发明申请
    • Method for dishing reduction and feature passivation in polishing processes
    • 抛光过程中凹陷减少和特征钝化的方法
    • US20050202677A1
    • 2005-09-15
    • US11114936
    • 2005-04-25
    • Wei-Yung HsuLiang-Yuh ChenRatson MoradDaniel Carl
    • Wei-Yung HsuLiang-Yuh ChenRatson MoradDaniel Carl
    • H01L21/288H01L21/321C25C3/00
    • H01L21/7684H01L21/3212
    • Methods and apparatus for planarizing a substrate surface are provided. In one aspect, a method is provided for planarizing a substrate surface including polishing a first conductive material to a barrier layer material, depositing a second conductive material on the first conductive material by an electrochemical deposition technique, and polishing the second conductive material and the barrier layer material to a dielectric layer. In another aspect, a processing system is provided for forming a planarized layer on a substrate, the processing system including a computer based controller configured to cause the system to polish a first conductive material to a barrier layer material, deposit a second conductive material on the first conductive material by an electrochemical deposition technique, and polish the second conductive material and the barrier layer material to a dielectric layer.
    • 提供了用于平坦化基板表面的方法和装置。 在一个方面,提供了一种用于平坦化衬底表面的方法,包括将第一导电材料抛光到阻挡层材料,通过电化学沉积技术在第一导电材料上沉积第二导电材料,以及抛光第二导电材料和屏障 层材料到介电层。 在另一方面,提供一种用于在衬底上形成平坦化层的处理系统,所述处理系统包括基于计算机的控制器,所述计算机控制器被配置为使所述系统将第一导电材料抛光至阻挡层材料,将第二导电材料沉积在所述第二导电材料上 通过电化学沉积技术的第一导电材料,并将第二导电材料和阻挡层材料抛光到介电层。