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    • 1. 发明授权
    • Optimizing heat transfer in 3-D chip-stacks
    • 优化3-D芯片堆叠中的热传递
    • US09189037B2
    • 2015-11-17
    • US13494047
    • 2012-06-12
    • Thomas BrunschwilerEren KursunGary W Maier
    • Thomas BrunschwilerEren KursunGary W Maier
    • G06F1/20H01L25/065
    • G06F1/20H01L25/0657H01L2924/0002H01L2924/00
    • A computer-implemented method, system, and article of manufacture for optimizing heat transfer in a 3-D chip-stack. The method includes the steps of: receiving a heat-removal effectiveness parameter for a plurality of channel-region areas in the chip-stack, receiving at least one of a flow value and temperature value for at least two of the channel-region areas, comparing the received values for different channel-region areas, and adjusting a flow rate of a liquid flowing to at least one of the two channel-region areas based on the heat-removal effectiveness parameter of the channel-region area receiving the adjustment and the results of the comparison step, where at least one step is carried out using a computer device.
    • 用于优化3-D芯片堆叠中的热传递的计算机实现的方法,系统和制品。 该方法包括以下步骤:接收码片堆叠中的多个信道区域区域的散热有效性参数,接收至少两个信道区域区域的流量值和温度值中的至少一个, 比较不同通道区域的接收值,并且基于接收调整的通道区域区域的散热效率参数来调节流入两个通道区域区域中的至少一个的液体的流量, 比较步骤的结果,其中使用计算机设备执行至少一个步骤。
    • 3. 发明申请
    • THREE-DIMENSIONAL (3D) STACKED INTEGRATED CIRCUIT TESTING
    • 三维(3D)堆叠集成电路测试
    • US20120112776A1
    • 2012-05-10
    • US12942662
    • 2010-11-09
    • Chen-Yong CherEren KursunGary W. MaierRaphael P. Robertazzi
    • Chen-Yong CherEren KursunGary W. MaierRaphael P. Robertazzi
    • G01R31/10
    • G01R31/2817G01R31/287
    • Testing of a three-dimensional (3D) integrated circuit includes defining a first group of parts by a region and/or layer on the 3D integrated circuit. The testing further includes applying a first intensity of stress test conditions to the first group of parts. The testing also includes defining a second group of parts by a region and/or layer on the 3D integrated circuit that is different from the first group of parts. The testing further includes and applying a second intensity of stress test conditions to the second group of parts. The second intensity of stress test conditions is greater than the first intensity and is determined by sensitivities identified for each of the first and second group of parts. A determination is made whether the 3D integrated circuit passed the testing based upon results of application of the first and second intensities of stress test conditions.
    • 三维(3D)集成电路的测试包括通过3D集成电路上的区域和/或层定义第一组部分。 测试还包括将第一强度的应力测试条件应用于第一组零件。 测试还包括通过与第一组部件不同的3D集成电路上的区域和/或层定义第二组部件。 测试进一步包括并将第二强度的应力测试条件应用于第二组零件。 应力测试条件的第二强度大于第一强度,并且由针对第一组和第二组部件确定的灵敏度确定。 根据第一和第二强度应力测试条件的应用结果,确定3D集成电路是否通过了测试。
    • 4. 发明授权
    • Three-dimensional (3D) stacked integrated circuit testing
    • 三维(3D)堆叠集成电路测试
    • US08542030B2
    • 2013-09-24
    • US12942662
    • 2010-11-09
    • Chen-Yong CherEren KursunGary W. MaierRaphael Peter Robertazzi
    • Chen-Yong CherEren KursunGary W. MaierRaphael Peter Robertazzi
    • G01R31/26
    • G01R31/2817G01R31/287
    • Testing of a three-dimensional (3D) integrated circuit includes defining a first group of parts by a region and/or layer on the 3D integrated circuit. The testing further includes applying a first intensity of stress test conditions to the first group of parts. The testing also includes defining a second group of parts by a region and/or layer on the 3D integrated circuit that is different from the first group of parts. The testing further includes and applying a second intensity of stress test conditions to the second group of parts. The second intensity of stress test conditions is greater than the first intensity and is determined by sensitivities identified for each of the first and second group of parts. A determination is made whether the 3D integrated circuit passed the testing based upon results of application of the first and second intensities of stress test conditions.
    • 三维(3D)集成电路的测试包括通过3D集成电路上的区域和/或层定义第一组部分。 测试还包括将第一强度的应力测试条件应用于第一组零件。 测试还包括通过与第一组部件不同的3D集成电路上的区域和/或层定义第二组部件。 测试进一步包括并将第二强度的应力测试条件应用于第二组零件。 应力测试条件的第二强度大于第一强度,并且由针对第一组和第二组部件确定的灵敏度确定。 根据第一和第二强度应力测试条件的应用结果,确定3D集成电路是否通过了测试。
    • 6. 发明授权
    • Efficiency of static core turn-off in a system-on-a-chip with variation
    • 在具有变化的片上系统中静态磁芯关断的效率
    • US08571847B2
    • 2013-10-29
    • US12727984
    • 2010-03-19
    • Chen-Yong CherPaul W. CoteusAlan GaraEren KursunDavid P. PaulsenBrian A. SchuelkeJohn E. Sheets, IIShurong Tian
    • Chen-Yong CherPaul W. CoteusAlan GaraEren KursunDavid P. PaulsenBrian A. SchuelkeJohn E. Sheets, IIShurong Tian
    • G06G7/75
    • G06F1/3203G06F1/206G06F1/3237G06F11/24Y02D10/128Y02D10/16
    • A processor-implemented method for improving efficiency of a static core turn-off in a multi-core processor with variation, the method comprising: conducting via a simulation a turn-off analysis of the multi-core processor at the multi-core processor's design stage, wherein the turn-off analysis of the multi-core processor at the multi-core processor's design stage includes a first output corresponding to a first multi-core processor core to turn off; conducting a turn-off analysis of the multi-core processor at the multi-core processor's testing stage, wherein the turn-off analysis of the multi-core processor at the multi-core processor's testing stage includes a second output corresponding to a second multi-core processor core to turn off; comparing the first output and the second output to determine if the first output is referring to the same core to turn off as the second output; outputting a third output corresponding to the first multi-core processor core if the first output and the second output are both referring to the same core to turn off.
    • 一种用于提高多核处理器中的静态核心关断的效率的处理器实现的方法,所述方法包括:通过模拟在多核处理器的设计处进行多核处理器的关断分析 其中所述多核处理器的设计阶段的所述多核处理器的关断分析包括对应于第一多核处理器核的第一输出关闭; 在多核处理器的测试阶段对多核处理器进行关断分析,其中多核处理器的测试阶段的多核处理器的关断分析包括对应于第二多核处理器的第二多输出 核心处理器核心关闭; 比较第一输出和第二输出以确定第一输出是否指相同的磁芯作为第二输出关闭; 如果第一输出和第二输出均指向相同的核来关闭,则输出对应于第一多核处理器核心的第三输出。