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    • 1. 发明申请
    • Memory Cell and Magnetic Random Access Memory
    • 存储单元和磁性随机存取存储器
    • US20080089117A1
    • 2008-04-17
    • US11574121
    • 2005-08-19
    • Tadahiko SugibayashiTakeshi HondaNoboru SakimuraTetsuhiro Suzuki
    • Tadahiko SugibayashiTakeshi HondaNoboru SakimuraTetsuhiro Suzuki
    • G11C11/00G11C11/02G11C11/14
    • H01L27/228G11C11/15H01L43/08Y10S977/935
    • A memory cell is used which includes a plurality of magneto-resistive elements and a plurality of laminated ferrimagnetic structure substances. The plurality of the magneto-resistive elements are placed corresponding to respective positions where a plurality of first wirings extended in a first direction intersects with a plurality of second wirings extended in a second direction which is substantially perpendicular to the first direction. The plurality of the laminated ferrimagnetic structure substances corresponds to the plurality of the magneto-resistive elements, respectively, is placed to have a distance of a predetermined range from the respective plurality of the magneto-resistive elements, and has a laminated ferrimagnetic structure. The magneto-resistive element includes a free layer having a laminated ferrimagnetic structure, a fixed layer, and a nonmagnetic layer interposed between the free layer and the fixed layer.
    • 使用包括多个磁阻元件和多个叠层铁磁结构物质的存储单元。 多个磁阻元件对应于在第一方向上延伸的多个第一布线与基本上垂直于第一方向的第二方向延伸的多个第二布线相对应的相应位置放置。 多个叠层铁氧体结构物质分别对应于多个磁阻元件,放置成距离相应的多个磁阻元件具有预定范围的距离,并具有叠层铁磁结构。 磁阻元件包括层叠的铁磁结构,固定层和插入在自由层和固定层之间的非磁性层的自由层。
    • 2. 发明授权
    • Memory cell and magnetic random access memory
    • 存储单元和磁性随机存取存储器
    • US07916520B2
    • 2011-03-29
    • US11574121
    • 2005-08-19
    • Tadahiko SugibayashiTakeshi HondaNoboru SakimuraTetsuhiro Suzuki
    • Tadahiko SugibayashiTakeshi HondaNoboru SakimuraTetsuhiro Suzuki
    • G11C11/00
    • H01L27/228G11C11/15H01L43/08Y10S977/935
    • A memory cell is used which includes a plurality of magneto-resistive elements and a plurality of laminated ferrimagnetic structure substances. The plurality of the magneto-resistive elements are placed corresponding to respective positions where a plurality of first wirings extended in a first direction intersects with a plurality of second wirings extended in a second direction which is substantially perpendicular to the first direction. The plurality of the laminated ferrimagnetic structure substances corresponds to the plurality of the magneto-resistive elements, respectively, is placed to have a distance of a predetermined range from the respective plurality of the magneto-resistive elements, and has a laminated ferrimagnetic structure. The magneto-resistive element includes a free layer having a laminated ferrimagnetic structure, a fixed layer, and a nonmagnetic layer interposed between the free layer and the fixed layer.
    • 使用包括多个磁阻元件和多个叠层铁磁结构物质的存储单元。 多个磁阻元件对应于在第一方向上延伸的多个第一布线与基本上垂直于第一方向的第二方向延伸的多个第二布线相对应的相应位置放置。 多个叠层铁氧体结构物质分别对应于多个磁阻元件,放置成距离相应的多个磁阻元件具有预定范围的距离,并具有叠层铁磁结构。 磁阻元件包括层叠的铁磁结构,固定层和插入在自由层和固定层之间的非磁性层的自由层。
    • 6. 发明授权
    • Magnetic memory cell and magnetic random access memory using the same
    • 磁存储单元和磁性随机存取存储器使用相同
    • US07184301B2
    • 2007-02-27
    • US10702655
    • 2003-11-07
    • Tadahiko SugibayashiNoboru SakimuraTakeshi Honda
    • Tadahiko SugibayashiNoboru SakimuraTakeshi Honda
    • G11C11/00
    • G11C11/16G11C2213/74G11C2213/79
    • In a magnetic random access memory, a memory cell includes a magnetic field generating section having an extension wiring line, and connected with a first selected bit line, a conductive pattern, and a magnetic resistance element having a spontaneous magnetization, storing a data and connected between the extension wiring line and the conductive pattern. In a data write operation into the memory cell, a write data is written in the magnetic resistance element of the memory cell by a write electric current which flows through the extension wiring line of the magnetic field generating section of the memory cell, and a value of the write data is determined based on a direction of the write electric current. In a data read operation from the memory cell, a read electric current flows through the extension wiring line of the magnetic field generating section and the magnetic resistance element in the memory cell. A memory cell array section includes the memory cells arranged in a matrix, and each memory cell is connected with a first word line and a first bit line at least, the gate section.
    • 在磁性随机存取存储器中,存储单元包括具有扩展布线的磁场产生部分,并与第一选定的位线,导电图案和具有自发磁化的磁阻元件连接,存储数据并连接 在延伸布线和导电图案之间。 在对存储单元的数据写入操作中,通过流过存储单元的磁场产生部分的延长布线的写入电流将写数据写入存储单元的磁阻元件, 基于写入电流的方向来确定写入数据。 在来自存储单元的数据读取操作中,读取的电流流过存储单元中的磁场产生部分的延伸布线和磁阻元件。 存储单元阵列部分包括以矩阵形式布置的存储器单元,并且每个存储单元至少与第一字线和第一位线连接,栅极部分。
    • 7. 发明申请
    • Magnetic random access memory
    • US20060098477A1
    • 2006-05-11
    • US10523198
    • 2003-07-28
    • Tadahiko SugibayashiTakeshi HondaNoboru SakimuraHisao MatsuteraAtsushi KamijoKenichi Shimura
    • Tadahiko SugibayashiTakeshi HondaNoboru SakimuraHisao MatsuteraAtsushi KamijoKenichi Shimura
    • G11C11/00
    • G11C11/16
    • A magnetic random access memory is composed of a plurality of first signal lines provided to extend in a first direction, a plurality of second signal lines provided to extend in a second direction substantially perpendicular to the first direction, a plurality of memory cells respectively provided at the intersections of the plurality of first signal lines and the plurality of second signal lines, and a plurality of magnetic structures respectively provided to the plurality of memory cells. Each of the plurality of memory cells has a magneto-resistance element containing a spontaneous magnetization layer which has a first threshold function, and the direction of the spontaneous magnetization of the spontaneous magnetization layer is reversed when an element applied magnetic field having the intensity equal to or larger than a first threshold function value is applied. Each of the plurality of magnetic structures has a second threshold function, and generates a magnetic structure magnetic field in response to a structure-applied magnetic field. When the structure-applied magnetic field has the intensity equal to or larger than the second threshold function value, a third magnetic field is generated as the magnetic structure magnetic field. When the structure applied magnetic field has the intensity less than the second threshold function value, a fourth magnetic field is generated which is weaker than the third magnetic field as the magnetic structure magnetic field. A first write current supplied to one of the plurality of first signal lines as a first selected signal line, and a first magnetic field is generated. A second write current is supplied to one of the plurality of second signal lines as a second selected signal line, and a second magnetic field is generated. A first synthetic magnetic field of the first magnetic field and the second magnetic field is applied to the magnetic structure as the structure applied magnetic field. The element applied magnetic field having the intensity equal to or larger than the first threshold function value is applied to the selected memory cell provided at the intersection of the first selected signal line and the second selected signal line. A second synthetic magnetic field of the first synthetic magnetic field and the magnetic structure magnetic field is generated as the element applied magnetic field such that the element applied magnetic field having the intensity less than the first threshold function value is applied to each of non-selected memory cells other than the selected memory cell.