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    • 1. 发明申请
    • Magnetic random access memory
    • US20060098477A1
    • 2006-05-11
    • US10523198
    • 2003-07-28
    • Tadahiko SugibayashiTakeshi HondaNoboru SakimuraHisao MatsuteraAtsushi KamijoKenichi Shimura
    • Tadahiko SugibayashiTakeshi HondaNoboru SakimuraHisao MatsuteraAtsushi KamijoKenichi Shimura
    • G11C11/00
    • G11C11/16
    • A magnetic random access memory is composed of a plurality of first signal lines provided to extend in a first direction, a plurality of second signal lines provided to extend in a second direction substantially perpendicular to the first direction, a plurality of memory cells respectively provided at the intersections of the plurality of first signal lines and the plurality of second signal lines, and a plurality of magnetic structures respectively provided to the plurality of memory cells. Each of the plurality of memory cells has a magneto-resistance element containing a spontaneous magnetization layer which has a first threshold function, and the direction of the spontaneous magnetization of the spontaneous magnetization layer is reversed when an element applied magnetic field having the intensity equal to or larger than a first threshold function value is applied. Each of the plurality of magnetic structures has a second threshold function, and generates a magnetic structure magnetic field in response to a structure-applied magnetic field. When the structure-applied magnetic field has the intensity equal to or larger than the second threshold function value, a third magnetic field is generated as the magnetic structure magnetic field. When the structure applied magnetic field has the intensity less than the second threshold function value, a fourth magnetic field is generated which is weaker than the third magnetic field as the magnetic structure magnetic field. A first write current supplied to one of the plurality of first signal lines as a first selected signal line, and a first magnetic field is generated. A second write current is supplied to one of the plurality of second signal lines as a second selected signal line, and a second magnetic field is generated. A first synthetic magnetic field of the first magnetic field and the second magnetic field is applied to the magnetic structure as the structure applied magnetic field. The element applied magnetic field having the intensity equal to or larger than the first threshold function value is applied to the selected memory cell provided at the intersection of the first selected signal line and the second selected signal line. A second synthetic magnetic field of the first synthetic magnetic field and the magnetic structure magnetic field is generated as the element applied magnetic field such that the element applied magnetic field having the intensity less than the first threshold function value is applied to each of non-selected memory cells other than the selected memory cell.
    • 3. 发明授权
    • Magneto-resistance effect type composite head and production method thereof
    • 磁阻效应型复合头及其制造方法
    • US06333842B1
    • 2001-12-25
    • US09204222
    • 1998-12-03
    • Ishiwata NobuyukiHisanao TsugeHisao MatsuteraYuji TsukamotoMasafumi NakadaAtsushi Kamijo
    • Ishiwata NobuyukiHisanao TsugeHisao MatsuteraYuji TsukamotoMasafumi NakadaAtsushi Kamijo
    • G11B539
    • B82Y25/00B82Y10/00G11B5/3109G11B5/3903G11B5/3909G11B5/3967G11B2005/3996Y10T29/49044Y10T29/49046
    • The present invention provides a magneto-resistance effect (hereinafter, referred to as MR) type composite head. The head includes a reproduction head including an MR element arranged between a first and a second magnetic shield; and a recording head arranged next to the reproduction head so as to use the second magnetic shield as a first magnetic pole film and having a second magnetic pole film opposing to the first magnetic pole via a magnetic gap; the MR element including: a center region including a ferromagnetic tunnel junction magneto-resistance effect film (hereinafter, referred to as a TMR film) having: a first ferromagnetic layer and a second ferromagnetic layer for generating a magneto-resistance effect using the first and the second magnetic shields as electrodes so that a current flows in a an almost vertical direction between the first and the second magnetic shields; and a tunnel barrier layer provided between the first and the second ferromagnetic layer; and an end region arranged to sandwich the center region from both sides for applying a bias magnetic field to the center region.
    • 本发明提供磁阻效应(以下称为MR)型复合头。 头部包括:再现头,包括布置在第一和第二磁屏蔽之间的MR元件; 以及记录头,其布置在再现头旁边,以便使用第二磁屏蔽作为第一磁极膜,并具有通过磁隙与第一磁极相对的第二磁极膜; MR元件包括:包括铁磁隧道结磁阻效应膜(以下称为TMR膜)的中心区域,其具有:第一铁磁层和第二铁磁层,用于产生使用第一和/ 第二磁屏蔽作为电极,使得电流在第一和第二磁屏蔽之间沿几乎垂直的方向流动; 以及设置在所述第一和第二铁磁层之间的隧道势垒层; 以及端部区域,布置成从两侧夹着中心区域,以向中心区域施加偏置磁场。
    • 10. 发明授权
    • Magneto-resistive element and magnetic head for data writing/reading
    • 用于数据写入/读取的磁阻元件和磁头
    • US06490139B1
    • 2002-12-03
    • US09492229
    • 2000-01-27
    • Kazuhiko HayashiKeishi OhashiNobuyuki IshiwataMasafumi NakadaHisao MatsuteraHisanao TsugeAtsushi Kamijo
    • Kazuhiko HayashiKeishi OhashiNobuyuki IshiwataMasafumi NakadaHisao MatsuteraHisanao TsugeAtsushi Kamijo
    • G11B5127
    • B82Y25/00G01R33/093G11B5/3903G11B5/3967
    • A magneto-resistive element comprises a first electrode, a magneto-resistive layer formed on the first electrode in which resistance is changed in accordance with magnetic field, and a second electrode layer formed on the magneto-resistive layer. The magneto-resistive layer has a first magnetic layer formed on the first electrode, a non-magnetic layer formed on the first magnetic layer, and a second magnetic layer formed on the non-magnetic layer. The average surface roughness of the first electrode is equal to or smaller than 0.3 nm. Since the first electrode has such the small average surface roughness, the non-magnetic layer formed on the first electrode layer is flattened, thus, current leakage is prevented. The first electrode is made of at least one of Ta, Zr, Ti, Hf, W, Mo, Y, V, Nb, Au, Ag, Pd, and Pt which has strong bond strength. Since the first electrode has strong bond strength, exfoliation of the first electrode from the layers contacting the first electrode does not occur.
    • 磁阻元件包括第一电极,形成在电阻根据磁场改变的第一电极上的磁阻层和形成在磁阻层上的第二电极层。 磁阻层具有形成在第一电极上的第一磁性层,形成在第一磁性层上的非磁性层和形成在非磁性层上的第二磁性层。 第一电极的平均表面粗糙度等于或小于0.3nm。 由于第一电极具有如此小的平均表面粗糙度,所以形成在第一电极层上的非磁性层变扁平化,从而防止了电流泄漏。 第一电极由具有强粘合强度的Ta,Zr,Ti,Hf,W,Mo,Y,V,Nb,Au,Ag,Pd和Pt中的至少一种制成。 由于第一电极具有强的结合强度,所以不会发生第一电极与接触第一电极的层的剥离。