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1. 发明申请

US20180279972A1 X-RAY IMAGING DEVICE 审中-公开
公开(公告)号：US20180279972A1
公开(公告)日：2018-10-04
申请号：US15562777
申请日：2016-03-01
申请人： SHIMADZU CORPORATION
发明人： Koichi TANABE , Shingo FURUI , Toshinori YOSHIMUTA , Kenji KIMURA , Akihiro NISHIMURA , Taro SHIRAI , Takahiro DOKI , Satoshi SANO , Akira HORIBA , Toshiyuki SATO
IPC分类号： A61B6/10 , G01T1/20 , A61B6/00
CPC分类号： G01T1/2018 , A61B6/4208 , A61B6/4233 , A61B6/484
摘要： In an X-ray imaging device according to a first embodiment, an X-ray detector has a configuration in which scintillator elements are defined by light-shielding walls in a lattice shape. Among X-rays incident on the X-ray detector, X-rays incident on the light-shielding walls are not converted into scintillator light and are transmitted by the X-ray detector. Accordingly, by causing X-rays to be incident on the X-ray detector in which the scintillator elements are defined by the light-shielding walls in a lattice shape, an area in which X-rays 3a transmitted by a subject M are incident on the X-ray detector can be limited to an arbitrary range. Accordingly, since a detection mask can be omitted in the X-ray imaging device which is used for EI-XPCi, it is possible to reduce a manufacturing cost of the X-ray imaging device.

2. 发明申请

US20170034402A1 CONTROL APPARATUS FOR IMAGE PICKUP APPARATUS 审中-公开
标题翻译：图像拾取装置的控制装置
公开(公告)号：US20170034402A1
公开(公告)日：2017-02-02
申请号：US15302225
申请日：2015-03-02
申请人： Shimadzu Corporation
发明人： Kenji KIMURA
IPC分类号： H04N5/073 , H04N5/3745 , H04N5/77
CPC分类号： H04N5/0736 , H04N5/232 , H04N5/37455 , H04N5/3765 , H04N5/77
摘要： Provided is a control apparatus for an image pickup apparatus that can synchronize an image sensor with a frame period from an external device, such as a display apparatus, without use of any frame buffer, while optimizing the frequency of a clock signal used for the operation of the image sensor. An image sensor (11) receives a trigger signal from an external device (2), such as a display apparatus, and image data from an image sensor (11); calculates, for each frame, information of a time difference from the trigger signal to a time at which to start the output of the image data; and establishes, on the basis of the information of the time difference, a frame period of the image sensor (11) such that the time difference is accommodated within a given range, thereby allowing the image data to be supplied to the external device (2) within a given time difference relative to the trigger signal, though some degree of variation occurring in each frame.
摘要翻译：本发明提供一种用于摄像装置的控制装置，其可以在不使用任何帧缓冲器的情况下使图像传感器与诸如显示装置的外部装置的帧周期同步，同时优化用于操作的时钟信号的频率的图像传感器。图像传感器（11）从诸如显示装置的外部设备（2）和来自图像传感器（11）的图像数据接收触发信号; 对于每个帧计算与触发信号的时间差的信息到开始输出图像数据的时间的信息; 并根据时差的信息建立图像传感器（11）的帧周期，使得时间差被容纳在给定范围内，从而允许将图像数据提供给外部设备（2 ）在相对于触发信号的给定时间差内，尽管在每个帧中出现某种程度的变化。

3. 发明申请

US20200158662A1 X-ray Phase Contrast Imaging Apparatus 审中-公开
公开(公告)号：US20200158662A1
公开(公告)日：2020-05-21
申请号：US16319574
申请日：2017-07-10
申请人： Shimadzu Corporation , OSAKA UNIVERSITY
发明人： Akira HORIBA , Koichi TANABE , Toshinori YOSHIMUTA , Kenji KIMURA , Hiroyuki KISHIHARA , Yukihisa WADA , Takuro IZUMI , Taro SHIRAI , Takahiro DOKI , Satoshi SANO , Takayoshi SHIMURA , Heiji WATANABE , Takuji HOSOI
IPC分类号： G01N23/041 , A61B6/00
摘要： This X-ray phase contrast imaging apparatus (100) includes an X-ray source (1), a first grating (3) that forms a self-image, a second grating (4), a detector (5) that detects X-rays, an adjustment mechanism (6), and a controller (7) that controls the adjustment mechanism (6) to adjust a misalignment of the first grating (3) or a misalignment of the second grating (4) based on Moire fringes detected by the detector (5).

4. 发明申请

US20190056336A1 Radiation Phase Contrast Imaging Device 审中-公开
公开(公告)号：US20190056336A1
公开(公告)日：2019-02-21
申请号：US16081249
申请日：2017-02-22
申请人： SHIMADZU CORPORATION , OSAKA UNIVERSITY
发明人： Takahiro DOKI , Koichi TANABE , Toshinori YOSHIMUTA , Kenji KIMURA , Akihiro NISHIMURA , Taro SHIRAI , Satoshi SANO , Akira HORIBA , Takayoshi SHIMURA , Heiji WATANABE , Takuji HOSOI
IPC分类号： G01N23/041 , G01N23/20 , A61B6/00
摘要： [PROBLEM TO BE SOLVED] To provide a radiation phase contrast imaging device having a small device configuration[SOLVING MEANS] The present invention focused on the findings that the distance between the phase grating 5 and the FPD 4 does not need to be the Talbot distance. The distance between the phase grating 5 and the FPD 4 can be more freely set. However, a self-image cannot be detected unless the self-image is sufficiently magnified with respect to the phase grating 5. The degree on how much the self-image is magnified on the FPD 4 with respect to the original phase grating 5 is determined by a magnification ratio X2/X1. Therefore, in the present invention, the magnification ratio is set to be the same as the magnification ratio in a conventional configuration. With this, even if the distance X2 between the radiation source 3 and the FPD 4 is reduced, a situation in which the self-image cannot be detected by the FPD 4 due to the excessively small size thereof does not occur.

5. 发明申请

US20190072501A1 RADIATION PHASE CONTRAST IMAGING APPARATUS 审中-公开
公开(公告)号：US20190072501A1
公开(公告)日：2019-03-07
申请号：US16115875
申请日：2018-08-29
申请人： Shimadzu Corporation
发明人： Takahiro DOKI , Kenji KIMURA , Taro SHIRAI , Satoshi SANO , Akira HORIBA , Naoki MORIMOTO
IPC分类号： G01N23/041
CPC分类号： G01N23/041 , A61B6/0407 , A61B6/4291 , A61B6/44 , A61B6/484 , A61B6/508 , A61B6/589 , G01N2223/3308 , G01N2223/40
摘要： The radiation phase contrast imaging apparatus includes an X-ray source, a first grating, a second grating arranged between the X-ray source and the first grating, and a moving mechanism for moving an object stage for holding an object. The moving mechanism is configured to more the object stage to an X-ray source side of the first grating and a second grating side of the first grating opposite to the source side of the first grating.

6. 发明申请

US20170343486A1 RADIATION PHASE-CONTRAST IMAGING DEVICE 审中-公开
公开(公告)号：US20170343486A1
公开(公告)日：2017-11-30
申请号：US15538622
申请日：2015-11-20
申请人： Shimadzu Corporation
发明人： Koichi TANABE , Shingo FURUI , Hiroyuki KISHIHARA , Kenji KIMURA , Taro SHIRAI , Takahiro DOKI , Satoshi SANO , Akira HORIBA
IPC分类号： G01N23/04 , G21K1/06 , G21K1/10
CPC分类号： G01N23/04 , A61B6/4291 , A61B6/4429 , A61B6/4476 , A61B6/484 , A61B6/487 , A61B6/5235 , G01N2223/1016 , G01N2223/501 , G21K1/067 , G21K1/10 , G21K2207/005
摘要： Provided is a radiation phase-contrast imaging device capable of assuredly detecting a self-image and precisely imaging the internal structure of an object. According to the configuration of the present invention, the longitudinal direction of a detection surface of a flat panel detector is inclined with respect to the extending direction of an absorber in a phase grating. This causes variations in the position (phase) of a projected stripe pattern of a self-image at different positions on the detection surface. This is therefore expected to produce the same effects as those obtainable when a plurality of self-images are obtained by performing imaging a plurality of times in such a manner that the position of the projected self-images on the detection surface varies. This alone, however, results in a single self-image phase for a specific region of the object. Therefore, according to the present invention, it is configured such that imaging is performed while changing the relative position of the imaging system and the object.

7. 发明公开

US20230384244A1 X-RAY PHASE IMAGING APPARATUS 审中-公开
公开(公告)号：US20230384244A1
公开(公告)日：2023-11-30
申请号：US18249870
申请日：2021-07-07
申请人： Shimadzu Corporation
发明人： Takahiro DOKI , Kenji KIMURA , Taro SHIRAI , Naoki MORIMOTO
IPC分类号： G01N23/041
CPC分类号： G01N23/041 , G01N2223/401
摘要： An X-ray phase imaging apparatus includes an X-ray source; an X-ray detector; a plurality of gratings; a subject holder arranged in an X-ray irradiation area and configured to hold the subject; and an image processor configured to generate an X-ray phase contrast image based on an intensity distribution of the X-rays detected by the X-ray detector. The subject holder is formed of a first material having an X-ray transmittance greater than metal and a scattering degree smaller than the metal.

8. 发明申请

US20210027472A1 X-RAY IMAGING APPARATUS AND X-RAY IMAGING METHOD 有权
公开(公告)号：US20210027472A1
公开(公告)日：2021-01-28
申请号：US16885524
申请日：2020-05-28
申请人： Shimadzu Corporation
发明人： Naoki MORIMOTO , Kenji KIMURA , Taro SHIRAI , Takahiro DOKI
IPC分类号： G06T7/13 , G01F22/00 , G06T11/00
摘要： An X-ray imaging apparatus is configured to acquire a plurality of pieces of slice image data from volume data, acquire a plurality of pieces of first processed image data by performing first processing, acquire a plurality of pieces of second processed image data by performing second processing, detect edges of the subject based on the acquired plurality of pieces of the second processed image data, and acquire edge image data including detected edges of the subject.

9. 发明申请

US20200249178A1 PHASE CONTRAST X-RAY IMAGING SYSTEM 审中-公开
公开(公告)号：US20200249178A1
公开(公告)日：2020-08-06
申请号：US16636492
申请日：2018-09-19
申请人： Shimadzu Corporation
发明人： Naoki MORIMOTO , Kenji KIMURA , Taro SHIRAI , Takahiro DOKI , Satoshi SANO , Akira HORIBA
IPC分类号： G01N23/041 , A61B6/00
摘要： A phase contrast X-ray imaging system includes an X-ray source; a plurality of gratings; a detector; a grating movement mechanism; and an image processor that generates a phase contrast image. The image processor generates the phase contrast image by using a pitch of an intensity change and a function which has the pitch as a variable and expresses the intensity change in a pixel value as a grating moves.

10. 发明申请

US20200205761A1 RADIATION PHASE CONTRAST IMAGING DEVICE 审中-公开
公开(公告)号：US20200205761A1
公开(公告)日：2020-07-02
申请号：US16643701
申请日：2018-10-12
申请人： Shimadzu Corporation
发明人： Kenji KIMURA , Taro SHIRAI , Takahiro DOKI , Satoshi SANO , Akira HORIBA , Naoki MORIMOTO
IPC分类号： A61B6/00 , G06T7/00
摘要： A radiation phase contrast imaging device includes an X-ray source, an X-ray detector configured to detect radiated X-rays, a plurality of gratings, an image processor configured to generate a reconstructed image from an X-ray image acquired from the X-ray detector, a display, and a controller configured or programmed to perform control to display, on the display, the X-ray image before reconstruction and the reconstructed image generated by the image processor.

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