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1. 发明申请

US20170356860A1 INSPECTION APPARATUS 审中-公开
公开(公告)号：US20170356860A1
公开(公告)日：2017-12-14
申请号：US15603583
申请日：2017-05-24
申请人： OMRON Corporation
发明人： Shinji SUGITA , Takako ONISHI , Yoshihide OTA
IPC分类号： G01N23/04 , G01N23/18 , B65G15/00 , G21K1/04
CPC分类号： G01N23/046 , B65G15/00 , G01N23/04 , G01N23/18 , G01N2223/3307 , G01N2223/3308 , G01N2223/419 , G01N2223/643 , G01N2223/646 , G01V5/0016 , G21K1/04
摘要： An inspection apparatus includes a feed-in preparation chamber, an imaging chamber, and a feed-out preparation chamber. Each preparation chamber includes a feed-in unit that receives an inspection object through a first opening, a traverser that translates the received object to a second opening in a direction different from the receiving direction of the object, and a feed-out unit that moves the object in a direction different from a moving direction of the traverser and discharges the object through the second opening. The imaging chamber includes an imaging unit that images the object fed from the feed-in preparation chamber. The traverser includes a mount for the object, and a shield that moves together with the mount and prevents radioactive rays entering one of the first and second openings and propagating in the moving direction of the traverser from reaching the other opening.

2. 发明授权

US09500600B2 Radiation image acquisition system 有权
标题翻译：辐射图像采集系统
公开(公告)号：US09500600B2
公开(公告)日：2016-11-22
申请号：US14415273
申请日：2013-06-18
申请人： HAMAMATSU PHOTONICS K.K.
发明人： Mototsugu Sugiyama , Toshiyasu Suyama
IPC分类号： G01N23/04 , G01T1/20
CPC分类号： G01N23/04 , G01N2223/33 , G01N2223/3306 , G01N2223/3308 , G01N2223/424 , G01N2223/505 , G01N2223/6113 , G01N2223/6116 , G01T1/20
摘要： A radiation image acquisition system of an aspect of the present invention includes a radiation source emitting radiation toward an object, a holding unit holding the object, a wavelength conversion member generating scintillation light in response to incidence of the radiation emitted from the radiation source and transmitted through the object, a first imaging means condensing and imaging scintillation light emitted from an incidence surface of the radiation of the wavelength conversion member, a second imaging means condensing and imaging scintillation light emitted from a surface opposite to the incidence surface of the wavelength conversion member, a holding unit position adjusting means adjusting the position of the holding unit between the radiation source and the wavelength conversion member, and an imaging position adjusting means adjusting the position of the first imaging means.
摘要翻译：本发明的一个方面的放射线图像采集系统包括：朝向物体发射辐射的辐射源，保持物体的保持单元，响应于从辐射源发射的辐射的入射产生闪烁光的波长转换部件，通过该目的，第一成像装置冷凝并成像从波长转换部件的辐射的入射表面发射的闪烁光，第二成像装置，将从与波长转换部件的入射面相反的表面发射的闪烁光成像，调节所述保持单元在所述辐射源与所述波长转换构件之间的位置的保持单元位置调整装置，以及调整所述第一成像装置的位置的成像位置调节装置。

3. 发明申请

US20190072501A1 RADIATION PHASE CONTRAST IMAGING APPARATUS 审中-公开
公开(公告)号：US20190072501A1
公开(公告)日：2019-03-07
申请号：US16115875
申请日：2018-08-29
申请人： Shimadzu Corporation
发明人： Takahiro DOKI , Kenji KIMURA , Taro SHIRAI , Satoshi SANO , Akira HORIBA , Naoki MORIMOTO
IPC分类号： G01N23/041
CPC分类号： G01N23/041 , A61B6/0407 , A61B6/4291 , A61B6/44 , A61B6/484 , A61B6/508 , A61B6/589 , G01N2223/3308 , G01N2223/40
摘要： The radiation phase contrast imaging apparatus includes an X-ray source, a first grating, a second grating arranged between the X-ray source and the first grating, and a moving mechanism for moving an object stage for holding an object. The moving mechanism is configured to more the object stage to an X-ray source side of the first grating and a second grating side of the first grating opposite to the source side of the first grating.

4. 发明申请

US20160274042A1 NON-HOMOGENEOUS SAMPLE SCANNING APPARATUS, AND X-RAY ANALYZER APPLICATIONS THEREOF 审中-公开
标题翻译：非均质样品扫描仪及其X射线分析仪应用
公开(公告)号：US20160274042A1
公开(公告)日：2016-09-22
申请号：US15036131
申请日：2014-11-11
申请人： X-RAY OPTICAL SYSTEMS, INC.
发明人： Zewu CHEN , George ALLEN , Peng LU , Joseph SPINAZOLA
IPC分类号： G01N23/223
CPC分类号： G01N23/223 , G01N2223/3306 , G01N2223/3307 , G01N2223/3308
摘要： A sample scanning apparatus/technique/method for a material analyzer, including moving a sample cell containing a sample over a measurement focal area of the analyzer according to a scan pattern, thereby scanning the sample over the measurement focal area in the scan pattern, and exposing multiple areas of the sample to the focal area. A sample cell rotator for rotating a sample cell is provided; along with a linear motion stage. The combined rotation and linear movement results in scanning the sample over the focal area in a scan pattern, thereby exposing multiple areas of the sample to the focal area. The sample scanning apparatus may be used in combination with an optic-enabled x-ray analyzer, the x-ray analyzer including an x-ray engine with an x-ray excitation path and an x-ray detection path, wherein the x-ray excitation and/or the x-ray detection path define the sample focal area.
摘要翻译：一种用于材料分析仪的样品扫描装置/技术/方法，包括根据扫描图案在分析仪的测量焦点区域上移动含有样品的样品池，从而在扫描图案中的测量焦点区域上扫描样品，以及将样品的多个区域暴露于焦点区域。提供了用于旋转样品池的样品池旋转器; 以及线性运动阶段。组合的旋转和线性运动导致以扫描图案在焦点区域上扫描样本，从而将样品的多个区域暴露于焦点区域。样本扫描装置可以与光学启用的X射线分析仪结合使用，该X射线分析仪包括具有x射线激发路径和x射线检测路径的x射线引擎，其中x射线激发和/或x射线检测路径限定样本焦点区域。

5. 发明申请

US20160305894A1 METHOD AND DEVICE FOR CONTROLLING ROTARY TABLE 审中-公开
标题翻译：用于控制旋转表的方法和装置
公开(公告)号：US20160305894A1
公开(公告)日：2016-10-20
申请号：US15093134
申请日：2016-04-07
申请人： MITUTOYO CORPORATION
发明人： Sadayuki MATSUMIYA , Hidemitsu ASANO , Masato KON
IPC分类号： G01N23/04
CPC分类号： G01N23/046 , G01N2223/309 , G01N2223/3306 , G01N2223/3308
摘要： An XY shift mechanism can shift a rotary table in a two-dimensional direction (XY direction) orthogonal to a rotation axis of the rotary table. By collaborative control of the shift position of the rotary table in the two-dimensional direction in synchronization with the rotation of the rotary table, rotation is made possible about a virtual rotation center that is set at an arbitrary position on the rotary table. The collaborative control of the shift position of the rotary table in the two-dimensional direction also corrects rotation eccentricity owing to the eccentricity of the rotary table. Thus, the virtual rotation center can be set at an arbitrary position on the rotary table, thus enabling obtainment of high resolution tomographic images of a plurality of regions of interest of an object, without the need for repositioning of the object.
摘要翻译： XY移动机构可以使与旋转台的旋转轴正交的二维方向（XY方向）的旋转台移动。通过与旋转台的旋转同步地与二维方向的旋转台的换档位置协同控制，可以围绕设置在旋转台上的任意位置的虚拟旋转中心进行旋转。旋转台在二维方向的换档位置的协同控制也由于旋转台的偏心而校正旋转偏心。因此，可以将虚拟旋转中心设置在旋转台上的任意位置，从而能够获得对象的多个感兴趣区域的高分辨率断层图像，而不需要重新定位对象。

6. 发明申请

US20120089349A1 Method for Measuring the Orientation and the Elastic Strain of Grains in Polycrystalline Materials 审中-公开
标题翻译：测量多晶材料晶粒取向和弹性应变的方法
公开(公告)号：US20120089349A1
公开(公告)日：2012-04-12
申请号：US13270097
申请日：2011-10-10
申请人： Pierre BLEUET , Patrice GERGAUD , Romain QUEY
发明人： Pierre BLEUET , Patrice GERGAUD , Romain QUEY
IPC分类号： G01L1/25 , G06F19/00
CPC分类号： G01N23/20 , G01N23/20091 , G01N2223/3308 , G01N2223/606
摘要： A method for measuring the orientation and deviatoric elastic strain of the crystal lattice of grains contained in a sample of polycrystalline material comprising a set of grains (G1, . . . Gi, . . . , Gn) comprises recording a series of Laue patterns and an operation for deinterlacing said Laue patterns, which deinterlacing operation may advantageously be combined with a tomography operation so as to furthermore identify the spatial extent of said grains.
摘要翻译：用于测量包含一组晶粒（G1，...，...，Gn）的多晶材料样品中晶粒晶格的取向和偏移弹性应变的方法包括记录一系列Laue图案和用于去隔行所述Laue图案的操作，该去隔行扫描操作可以有利地与断层摄影操作组合，以便进一步识别所述颗粒的空间范围。

7. 发明授权

US07221732B1 Method and apparatus for producing laminography images using a fixed x-ray source 有权
标题翻译：用于使用固定的x射线源产生氨基化图像的方法和装置
公开(公告)号：US07221732B1
公开(公告)日：2007-05-22
申请号：US11394406
申请日：2006-03-31
申请人： Martin Annis
发明人： Martin Annis
IPC分类号： G01N23/04 , H05G1/64 , H05G1/00
CPC分类号： G01N23/04 , G01N2223/3307 , G01N2223/3308
摘要： An imaging system and method for taking an image of an object. The imaging system comprises a mechanism that propels the object linearly in a direction of motion through an imaging region that has a top, bottom, front, and rear; an x-ray source located below the bottom, aligned with the front, and emitting an x-ray cone beam to the imaging region; and a plurality of x-ray detector assemblies, each of the detector assemblies including a linear row of detectors above and parallel to the top and perpendicular to the direction of motion, and a linear column of detectors outside of and parallel to the rear right side and extending at an angle to the direction of motion, wherein each of the detector assemblies defines an x-ray fan beam within the x-ray cone beam. A second system embodiment duplicates the x-ray source/detector assemblage and rotates the second assemblage by 90° around the object. In the method, a number of x-ray fan beams are emitted from a single location at different angles and the object is propelled linearly through the fan beams. The x-ray intensity of each fan beam passing through a voxel is read and those x-ray intensities are combined in accordance to standard laminography practice to generate an image for the voxel. In this way, images for all voxels are generated and used to produce an image of the entire object. With the second system embodiment, two sets of voxel images are generated, which allows views from a full 180° for all voxels in the object. Applying computer tomography reconstruction algorithms can produce CT images.
摘要翻译：一种用于拍摄物体的图像的成像系统和方法。成像系统包括通过具有顶部，底部，前部和后部的成像区域在运动方向上线性推进物体的机构; 位于底部下方的与前部对准的x射线源，并将X射线锥束发射到成像区域; 和多个X射线检测器组件，每个检测器组件包括在顶部并且平行于运动方向的上方并平行的线性行的检测器，以及在后右侧并且平行于右后侧的线性列检测器并且以与运动方向成一定角度延伸，其中每个检测器组件在X射线锥形束内限定X射线扇形束。第二系统实施例复制x射线源/检测器组合并使第二组合围绕对象旋转90°。在该方法中，多个x射线扇形光束以不同的角度从单个位置发射，并且物体通过扇形光束线性地推进。读取通过体素的每个扇形光束的x射线强度，并根据标准层析实践组合这些X射线强度，以生成体素的图像。以这种方式，生成所有体素的图像并用于产生整个对象的图像。利用第二系统实施例，生成两组体素图像，其允许对象中的所有体素的完整180°的视图。应用计算机断层扫描重建算法可以生成CT图像。

8. 发明申请

US20170307547A1 DETERMINING THE LEACHING PROFILE OF A CUTTER ON A DRILLING TOOL 审中-公开
公开(公告)号：US20170307547A1
公开(公告)日：2017-10-26
申请号：US15521342
申请日：2014-11-24
申请人： Halliburton Energy Services, Inc.
发明人： Qi LIANG , Gagan SAINI
IPC分类号： G01N23/18
CPC分类号： G01N23/18 , G01N23/083 , G01N2223/33 , G01N2223/3308 , G01N2223/61 , G01N2223/652
摘要： In accordance with some embodiments of the present disclosure, systems and methods for determining the leaching profile of cutter on a drilling tool are disclosed. The method includes applying an X-ray impermeable layer to a surface of a leached PCD element with residual infiltrant. The method also includes moving the element through an X-ray beam. The method further includes detecting an X-ray intensity received by an X-ray detector. The method further includes generating a leaching profile of the leached PCD element based on the X-ray intensity.

9. 发明申请

US20170122886A1 RADIATION IMAGE ACQUISITION SYSTEM 审中-公开
公开(公告)号：US20170122886A1
公开(公告)日：2017-05-04
申请号：US15337256
申请日：2016-10-28
申请人： HAMAMATSU PHOTONICS K.K.
发明人： Mototsugu SUGIYAMA , Toshiyasu SUYAMA
IPC分类号： G01N23/04
CPC分类号： G01N23/04 , G01N2223/33 , G01N2223/3306 , G01N2223/3308 , G01N2223/424 , G01N2223/505 , G01N2223/6113 , G01N2223/6116 , G01T1/20
摘要： A radiation image acquisition system of an aspect of the present invention includes a radiation source emitting radiation toward an object, a holding unit holding the object, a wavelength conversion member generating scintillation light in response to incidence of the radiation emitted from the radiation source and transmitted through the object, a first imaging means condensing and imaging scintillation light emitted from an incidence surface of the radiation of the wavelength conversion member, a second imaging means condensing and imaging scintillation light emitted from a surface opposite to the incidence surface of the wavelength conversion member, a holding unit position adjusting means adjusting the position of the holding unit between the radiation source and the wavelength conversion member, and an imaging position adjusting means adjusting the position of the first imaging means.

10. 发明申请

US20160238541A1 X-RAY INSPECTION SYSTEM AND METHOD FOR ROTATING A TEST OBJECT BY MEANS OF SUCH AN X-RAY INSPECTION SYSTEM 审中-公开
标题翻译： X射线检测系统和通过这种X射线检测系统进行旋转测试对象的方法
公开(公告)号：US20160238541A1
公开(公告)日：2016-08-18
申请号：US15030600
申请日：2014-10-21
申请人： YXLON International GmbH
发明人： Andreas Mecke , Jan Spalding , Axel Klein
IPC分类号： G01N23/04
CPC分类号： G01N23/046 , G01N23/04 , G01N2223/309 , G01N2223/3303 , G01N2223/3306 , G01N2223/3308 , G01N2223/419
摘要： An X-ray inspection system includes an X-ray source and a detector. A rotary table is arranged between the X-ray source and the detector. The rotary table is configured to secure a test object on the rotary table. The rotary table is arranged on a positioning table. The positioning table is configured to move parallel to an xy-plane between the X-ray source and the detector. The xy-plane is perpendicular to a surface of the detector extending parallel to the xz-plane and the rotary table is configured to rotate about a z-axis.
摘要翻译： X射线检查系统包括X射线源和检测器。在X射线源和检测器之间设置旋转台。旋转台被配置为将测试对象固定在旋转台上。旋转台布置在定位台上。定位台被配置成平行于X射线源和检测器之间的xy平面移动。 xy平面垂直于平行于xz平面延伸的检测器的表面，并且旋转台被配置为围绕z轴旋转。

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