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1. 发明申请

US20200158662A1 X-ray Phase Contrast Imaging Apparatus 审中-公开
公开(公告)号：US20200158662A1
公开(公告)日：2020-05-21
申请号：US16319574
申请日：2017-07-10
申请人： Shimadzu Corporation , OSAKA UNIVERSITY
发明人： Akira HORIBA , Koichi TANABE , Toshinori YOSHIMUTA , Kenji KIMURA , Hiroyuki KISHIHARA , Yukihisa WADA , Takuro IZUMI , Taro SHIRAI , Takahiro DOKI , Satoshi SANO , Takayoshi SHIMURA , Heiji WATANABE , Takuji HOSOI
IPC分类号： G01N23/041 , A61B6/00
摘要： This X-ray phase contrast imaging apparatus (100) includes an X-ray source (1), a first grating (3) that forms a self-image, a second grating (4), a detector (5) that detects X-rays, an adjustment mechanism (6), and a controller (7) that controls the adjustment mechanism (6) to adjust a misalignment of the first grating (3) or a misalignment of the second grating (4) based on Moire fringes detected by the detector (5).

2. 发明申请

US20190167219A1 X-ray Phase Contrast Imaging Apparatus 审中-公开
公开(公告)号：US20190167219A1
公开(公告)日：2019-06-06
申请号：US16321297
申请日：2017-07-10
申请人： Shimadzu Corporation , OSAKA UNIVERSITY
发明人： Satoshi SANO , Koichi TANABE , Toshinori YOSHIMUTA , Kenji KIMURA , Hiroyuki KISHIHARA , Yukihisa WADA , Takuro IZUMI , Taro SHIRAI , Takahiro DOKI , Akira HORIBA , Takayoshi SHIMURA , Heiji WATANABE , Takuji HOSOI
IPC分类号： A61B6/00
摘要： This X-ray phase contrast imaging apparatus (100) includes an X-ray source (1) that radiates continuous X-rays, a first grating (3) that forms a self-image, a second grating (4), a detector (5) that detects the continuous X-rays, and a third grating (2) arranged between the detector (5) and the first grating 3. The first grating (3), the second grating (4), and the third grating (2) are arranged so as to satisfy conditions of predetermined formulas.

3. 发明申请

US20220214291A1 X-Ray Spectroscopic Analysis Apparatus and Elemental Analysis Method 有权
公开(公告)号：US20220214291A1
公开(公告)日：2022-07-07
申请号：US17554415
申请日：2021-12-17
申请人： SHIMADZU CORPORATION
发明人： Shinji MIYAUCHI , Susumu ADACHI , Asaka KOHIYAMA , Takuro IZUMI , Takashi OMORI , Kenji SATO
IPC分类号： G01N23/223
摘要： A spectroscopic element and a detector are disposed along a circumference of one Rowland circle. The spectroscopic element has a spectral surface whose length, measured along the Rowland circle, is shorter than a length in the Rowland circle plane, of an irradiation surface irradiated with excitation beams emitted to a sample holder. The spectroscopic element and the sample holder are disposed to separate a group of characteristic X-rays within a common spectral range of the spectroscopic element.

4. 发明申请

US20230057233A1 X-RAY FLUORESCENCE ANALYZER 有权
公开(公告)号：US20230057233A1
公开(公告)日：2023-02-23
申请号：US17794855
申请日：2020-10-15
申请人： Shimadzu Corporation
发明人： Takuro IZUMI , Tetsuya YONEDA
IPC分类号： G01N23/20008 , G01N23/223
摘要： An X-ray fluorescence analyzer is provided inside an analysis chamber covered with a housing with: an X-ray tube; an analyzing crystal for spectrally dispersing X-ray fluorescence emitted from a sample; an X-ray detector for detecting the X-ray fluorescence spectrally dispersed by the analyzing crystal; a warm air generator for generating warm air to maintain a temperature of the analyzing crystal at a target temperature; and a Peltier element for cooling the X-ray detector.

5. 发明申请

US20220208408A1 DISPERSIVE ELEMENT 有权
公开(公告)号：US20220208408A1
公开(公告)日：2022-06-30
申请号：US17610640
申请日：2019-07-18
申请人： SHIMADZU CORPORATION
发明人： Takuro IZUMI , Satoshi TOKUDA , Susumu ADACHI , Tetsuya YONEDA
IPC分类号： G21K1/06
摘要： A dispersive element is provided with a dispersive crystal for spectrally dispersing X-rays, a first support layer supporting the dispersive crystal, and a second support layer supporting the first support layer. The first support layer is greater in a thermal expansion coefficient than the dispersive crystal. The second support layer is smaller in a thermal expansion coefficient than the first support layer and is greater in rigidity than the first support layer.

6. 发明申请

US20200225172A1 X-RAY SPECTROMETER 审中-公开
公开(公告)号：US20200225172A1
公开(公告)日：2020-07-16
申请号：US16612092
申请日：2017-05-18
申请人： Shimadzu Corporation
发明人： Kenji SATO , Takuro IZUMI
IPC分类号： G01N23/207 , G01N23/223
摘要： An X-ray spectrometer is provided with: an excitation source configured to irradiate excitation rays onto an irradiation area of a sample, a diffraction member provided to face the irradiation area; a slit member provided between the irradiation area and the diffraction member, the slit member having a slit extending parallel to the irradiation area and a prescribed surface of the diffraction member; an X-ray linear sensor having a light-incident surface in which a plurality of detection elements are arranged in a direction perpendicular to a longitudinal direction of the slit; a first moving mechanism configured to change an angle between the sample surface and the prescribed surface, and/or a distance between the sample surface and the prescribed surface by moving the diffraction member within a plane perpendicular to the longitudinal direction; and a second moving mechanism configured to position the X-ray linear sensor on a path of characteristic X-rays passed through the slit and diffracted by the prescribed surface by moving the X-ray linear sensor within a plane perpendicular to the longitudinal direction.

7. 发明申请

US20190175126A1 RADIATION IMAGING APPARATUS 审中-公开
公开(公告)号：US20190175126A1
公开(公告)日：2019-06-13
申请号：US16309820
申请日：2017-03-15
申请人： Shimadzu Corporation
发明人： Koichi TANABE , Toshinori YOSHIMUTA , Kenji KIMURA , Hiroyuki KISHIHARA , Yukihisa WADA , Takuro IZUMI , Taro SHIRAI , Takahiro DOKI , Satoshi SANO , Akira HORIBA
IPC分类号： A61B6/00 , G01N23/046
摘要： Provided is a radiation imaging apparatus capable of performing precise imaging without performing pre-imaging in the absence of a subject. According to the present invention, it is possible to provide a radiation imaging apparatus capable of performing precise imaging without performing pre-imaging in the absence of a subject immediately before. That is, the apparatus of the present invention is provided with a phase grating 5 provided with a subject area and a reference area. Both areas each have a predetermined pattern that absorbs radiation, but the patterns are different from each other. In this area, an image of the phase grating 5 is observed in a moire pattern of a long period. This moire image of a long period changes in the positions due to the minute change in the relative position between the phase grating 5 and the absorption grating 6, so it becomes possible to detect the minute change of the relative position between the radiation source, the phase grating 5, and the absorption grating 6 from the image of the reference area.

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