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1. 发明授权

US12055500B1 Detection and imaging of electric fields, using polarized neutrons 有权
公开(公告)号：US12055500B1
公开(公告)日：2024-08-06
申请号：US17740504
申请日：2022-05-10
申请人： National Technology & Engineering Solutions of Sandia, LLC
发明人： Yuan-Yu Jau
IPC分类号： G01N23/04 , G01N23/09
CPC分类号： G01N23/04 , G01N23/09 , G01N2223/04 , G01N2223/40 , G01N2223/505
摘要： A method and corresponding apparatus are provided for measuring neutron spin precession in an electric field with high sensitivity suitable for practical applications in non-destructive testing, imaging, and the like. Production of a neutron beam with a polarization vector P is followed by transmitting the spin-polarized neutron beam through a sample region in which there is a target generating an electric field, polarization-analyzing the transmitted neutron beam with an analyzing direction orthogonal to P, detecting an intensity of the polarization-analyzed neutron beam; and mapping the detected neutron-beam intensity to a field-strength value for the target electric field.

2. 发明授权

US11821854B2 System and method for inspecting defects of structure by using X-ray 有权
公开(公告)号：US11821854B2
公开(公告)日：2023-11-21
申请号：US18155285
申请日：2023-01-17
申请人： NEUF Inc.
发明人： Myoung Chan Na
IPC分类号： G01N23/00 , G01N23/083 , G01N23/04 , G01N23/18
CPC分类号： G01N23/083 , G01N23/04 , G01N23/18 , G01N2223/04 , G01N2223/20 , G01N2223/3303 , G01N2223/40 , G01N2223/63 , G01N2223/646
摘要： A defect inspection system includes an X-ray generator that generates X-ray to be irradiated to a structure, and an X-ray detector that detects the X-ray generated by the X-ray generator and transmitted through the structure. In particular, the X-ray generator is configured to be moved by a first transporting means, and the X-ray detector is configured to be moved by a second transporting means. The system further includes a control unit configured to control and operate the first transporting means and the second transporting means.

3. 发明公开

US20230221457A1 Handheld Backscatter Scanning Systems With Different Detector Panel Configurations 审中-公开
公开(公告)号：US20230221457A1
公开(公告)日：2023-07-13
申请号：US18149208
申请日：2023-01-03
申请人： American Science and Engineering, Inc.
发明人： Aaron J. Couture , Jeffrey M. Denker
IPC分类号： G01V5/00 , G01N23/083 , G01T1/20 , G01N23/20008 , H01L27/146 , G01T1/203 , G01N23/203 , G01N23/04 , G01N23/10 , G01T7/00 , G01T3/06 , G01T5/08
CPC分类号： G01V5/0025 , G01N23/083 , G01T1/2018 , G01N23/20008 , G01V5/0016 , G01T1/20181 , H01L27/14658 , G01T1/203 , G01N23/203 , G01N23/04 , G01T1/2006 , G01N23/10 , H01L27/14601 , G01T7/00 , G01T1/20 , G01N2223/639 , G01N2223/501 , H01L27/14643 , G01T3/06 , H01L27/146 , G01N2223/1066 , G01N2223/1013 , G01N2223/5055 , G01T1/2008 , G01T5/08 , G01N2223/3301 , G01N2223/40 , G01N2223/1016 , G01N2223/053 , G01N2223/301
摘要： The present specification provides a detector for an X-ray imaging system. The detector includes at least one high resolution layer having high resolution wavelength-shifting optical fibers, each fiber occupying a distinct region of the detector, at least one low resolution layer with low resolution regions, and a single segmented multi-channel photo-multiplier tube for coupling signals obtained from the high resolution fibers and the low resolution regions.

4. 发明申请

US20190234888A1 DISTRIBUTED SENSOR NETWORK FOR NONDESTRUCTIVELY MONITORING AND INSPECTING INSULATED ELECTRICAL MACHINE COMPONENTS 审中-公开
公开(公告)号：US20190234888A1
公开(公告)日：2019-08-01
申请号：US16379115
申请日：2019-04-09
申请人： GENERAL ELECTRIC COMPANY
发明人： Ehsan DEHGHAN NIRI , Jeffrey Michael BREZNAK , Gene MURPHY
IPC分类号： G01N23/00 , G01R31/12 , G01B15/00 , G01N23/04
CPC分类号： G01N23/00 , G01B15/00 , G01N23/04 , G01N2223/40 , G01N2223/611 , G01N2223/632 , G01N2223/646 , G01R31/1218 , G01R31/1272
摘要： An insulated electrical component of an insulated electrical machine includes a conducting element, a first radiographically-visible conductor sensor node coupled to the conducting element, at least one second radiographically-visible conductor sensor node coupled to the conducting element a first distance in a predetermined direction from the first radiographically-visible conductor sensor node, and an insulating material bonded to the conducting element. In some embodiments, the insulated electrical component further includes a first radiographically-visible insulator sensor node coupled to the insulating material and not coupled to the conducting element and at least one second radiographically-visible insulator sensor node coupled to the insulating material and not coupled to the conducting element a second distance from the first radiographically-visible insulator sensor node. The radiographically-visible sensor nodes are distinguishable from the conducting element and the insulating material in a radiographic image. Methods of manufacturing and non-destructive testing of insulated electrical components are also disclosed.

5. 发明授权

US09983134B2 Systems and methods for imaging and processing tissue 有权
公开(公告)号：US09983134B2
公开(公告)日：2018-05-29
申请号：US14300425
申请日：2014-06-10
申请人： Timothy Ragan
发明人： Timothy Ragan
IPC分类号： G01N21/64 , G01N1/06 , G02B21/00 , G02B21/36 , A61B3/10 , G01B9/02 , C12Q1/68 , G01N1/30 , G01N33/53 , G01N21/65
CPC分类号： G01N21/6458 , A61B3/102 , C12Q1/686 , G01B9/02091 , G01N1/06 , G01N1/30 , G01N33/53 , G01N2001/068 , G01N2021/653 , G01N2223/40 , G01N2223/401 , G01N2223/419 , G02B21/008 , G02B21/367
摘要： In accordance with preferred embodiments of the present invention, a method for imaging tissue, for example, includes the steps of mounting the tissue on a computer controlled stage of a microscope, determining volumetric imaging parameters, directing at least two photons into a region of interest, scanning the region of interest across a portion of the tissue, imaging a plurality of layers of the tissue in a plurality of volumes of the tissue in the region of interest, sectioning the portion of the tissue, capturing the sectioned tissue, and imaging a second plurality of layers of the tissue in a second plurality of volumes of the tissue in the region of interest, and capturing each sectioned tissue, detecting a fluorescence image of the tissue due to said excitation light; and processing three-dimensional data that is collected to create a three-dimensional image of the region of interest. Further, captured tissue sections can be processed, re-imaged, and indexed to their original location in the three dimensional image.

6. 发明申请

US20170052125A1 SYSTEMS AND METHODS FOR PERFORMING BACKSCATTER THREE DIMENSIONAL IMAGING FROM ONE SIDE OF A STRUCTURE 有权
标题翻译：从结构一侧执行背板三维成像的系统和方法
公开(公告)号：US20170052125A1
公开(公告)日：2017-02-23
申请号：US14827653
申请日：2015-08-17
申请人： THE BOEING COMPANY
发明人： Gary E. Georgeson , Morteza Safai
IPC分类号： G01N23/203 , G01N23/20 , G21K1/02
CPC分类号： G01N23/203 , G01N23/20008 , G01N23/20025 , G01N2223/053 , G01N2223/1016 , G01N2223/301 , G01N2223/40 , G21K1/043
摘要： An imaging system for generating three dimensional image data using X-ray backscattering from one side of a structure is provided. The imaging system includes at least one X-ray source, at least one rotating collimator coupled to the at least one X-ray source, an X-ray detector, and a controller coupled to the at least one X-ray source, the at least one rotating collimator and the X-ray detector. The controller is configured to emit X-rays from the at least one X-ray source through the at least one rotating collimator towards the one side of the structure. Additionally, the controller is configured to detect backscattered X-rays from the one side of the structure, using the X-ray detector, at a plurality of depths within the structure. Additionally, the controller is configured to generate three dimensional image data of the structure based on the detected backscattered X-rays.
摘要翻译：提供一种用于使用从结构的一侧的X射线反向散射来生成三维图像数据的成像系统。所述成像系统包括至少一个X射线源，耦合到所述至少一个X射线源的至少一个旋转准直器，X射线检测器和耦合到所述至少一个X射线源的控制器，所述at 至少一个旋转准直仪和X射线检测器。控制器被配置为从至少一个X射线源通过至少一个旋转准直器向结构的一侧发射X射线。此外，控制器被配置为在结构内的多个深度处使用X射线检测器从结构的一侧检测反向散射的X射线。另外，控制器被配置为基于检测的反向散射X射线生成结构的三维图像数据。

7. 发明授权

US09052269B1 Methods for characterizing relative film density using spectroscopic analysis at the device level 有权
标题翻译：在器件级使用光谱分析表征相对膜密度的方法
公开(公告)号：US09052269B1
公开(公告)日：2015-06-09
申请号：US13460501
申请日：2012-04-30
申请人： Lifan Chen , Haifeng Wang , Li Zeng , Dehua Han
发明人： Lifan Chen , Haifeng Wang , Li Zeng , Dehua Han
IPC分类号： G06F19/00 , G01N31/00 , G01N23/083
CPC分类号： G01N23/083 , G01N9/24 , G01N23/20091 , G01N2223/40
摘要： Methods for characterizing relative film density using spectroscopic analysis at the device level are provided. One such method includes obtaining a composition of materials at preselected areas of a workpiece using energy dispersive X-ray spectroscopy, obtaining an electron energy loss spectrum-imaging data at each of the preselected areas using electron energy loss spectroscopy, removing, for each of the preselected areas, a preselected noise component of the electron energy spectrum-imaging data to form a plasmon energy spectrum-imaging data, generating, for each of the preselected areas, a plasmon energy map based on the respective plasmon energy spectrum-imaging data, determining, for each of the preselected areas, an average plasmon energy value from the respective plasmon energy map, and calculating a relative mass density of the preselected areas based on the average plasmon energy value, a number of valence electrons per molecule, and a molecular weight for each of the preselected areas.
摘要翻译：提供了在器件级使用光谱分析来表征相对膜密度的方法。一种这样的方法包括使用能量色散X射线光谱法在工件的预选区域获得材料的组成，使用电子能量损失光谱法在每个预选区域获得电子能量损失光谱成像数据，预选区域，电子能谱成像数据的预选噪声分量，以形成等离子体激元能谱成像数据，为每个预选区域生成基于相应的等离子体激元能谱成像数据的等离子体激元能量图，确定对于每个预选区域，来自各个等离子体激元能量图的平均等离子体激元能量值，并且基于平均等离子体激元能量值，每分子的价电子数和分子量来计算预选区域的相对质量密度对于每个预选区域。

8. 发明授权

US3965353A Cross-sectional X-ray emission imaging system 失效
标题翻译：横截面X射线发射成像系统
公开(公告)号：US3965353A
公开(公告)日：1976-06-22
申请号：US530399
申请日：1974-12-06
申请人： Albert Macovski
发明人： Albert Macovski
IPC分类号： A61B6/02 , A61B6/06 , G01N23/08 , G01N23/22 , G06T11/00 , G01T1/00
CPC分类号： G01N23/083 , A61B6/02 , A61B6/06 , A61B6/4258 , A61B6/483 , G01N23/22 , G06T11/003 , A61B6/037 , G01N2223/071 , G01N2223/1016 , G01N2223/108 , G01N2223/40 , G06T2211/412
摘要： A sheet beam x-ray source having energy components greater than 1.02 Mev is passed through an object under study. The emitted gamma rays due to pair production are measured using a positron-sensitive coincidence counting system on either side of the excited section. The location of each detected event is made using the positron information of each detector and the location of the excited section. An image is rapidly formed which is sensitive to the atomic number and density of materials in the cross section of the object.
摘要翻译：具有大于1.02Mev的能量分量的片束x射线源通过被研究对象。由于对产生而发射的γ射线是在激发部分的任一侧上使用正电子敏感的重合计数系统来测量的。每个检测到的事件的位置是使用每个检测器的正电子信息和被激励部分的位置来进行的。快速形成对物体横截面中材料的原子数和密度敏感的图像。

9. 发明授权

US12099024B2 Methods and apparatus for electron backscatter diffraction sample characterisation 有权
$Methods and apparatus for electron backscatter diffraction sample characterisation$
公开(公告)号：US12099024B2
公开(公告)日：2024-09-24
申请号：US17427791
申请日：2020-03-03
申请人： VG SYSTEMS LIMITED , FEI Company
发明人： Austin Penrose Day , Christopher James Stephens , Pavel Stejskal , Martin Petrek
IPC分类号： G01N23/203
CPC分类号： G01N23/203 , G01N2223/0566 , G01N2223/40
摘要： A method of analyzing a sample imaged by electron backscatter diffraction. The method comprises identifying a plurality of Kikuchi bands in an electron backscatter diffraction image of a position on the sample. The method further comprises forming, for each identified Kikuchi band, a respective vector representation of said Kikuchi band based at least in part on an estimate of the position on the sample. A configuration of the sample is determined by identifying a particular set of expected vector representations from a plurality of sets of expected vector representations as matching the vector representations of the plurality of identified Kikuchi bands.

10. 发明授权

US11966203B2 System and method to adjust a kinetics model of surface reactions during plasma processing 有权
公开(公告)号：US11966203B2
公开(公告)日：2024-04-23
申请号：US16872879
申请日：2020-05-12
申请人： KLA Corporation
发明人： Ankur Agarwal , Chad Huard , Yiting Zhang , Haifeng Pu , Xin Li , Premkumar Panneerchelvam , Fiddle Han , Yeurui Chen
IPC分类号： G05B13/04 , G01B11/24 , G01B15/04 , G01N21/21 , G01N23/201 , G06F17/14
CPC分类号： G05B13/042 , G01B11/24 , G01B15/045 , G01N21/21 , G01N23/201 , G01N2223/054 , G01N2223/40 , G06F17/14
摘要： A system is disclosed, in accordance with one or more embodiments of the present disclosure. The system includes a metrology tool configured to acquire one or more measurements of a portion of a sample. The system includes a controller including one or more processors configured to execute program instructions causing the one or more processors to: generate a surface kinetics model output based on a surface kinetics model; determine an expected response of the surface kinetics model output to excitation by polarized light; compare the determined expected response to the one or more measurements; generate one or more metrics based on the comparison between the determined expected response and the one or more measurements of the sample; adjust one or more parameters of the surface kinetics model to generate an adjusted surface kinetics model; and apply the adjusted surface kinetics model to simulate on-sample performance during plasma processing.

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