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1. 发明申请

US20060061759A1 Unit for measuring absorbance 失效
标题翻译：单位测量吸光度
公开(公告)号：US20060061759A1
公开(公告)日：2006-03-23
申请号：US11225044
申请日：2005-09-14
申请人： Shigeki Matsumoto , Shigenori Nozawa
发明人： Shigeki Matsumoto , Shigenori Nozawa
IPC分类号： G01N21/01
CPC分类号： G01N21/0303 , B01L3/502715 , B01L9/527 , B01L2300/0654 , B01L2300/0816 , B01L2300/0867 , G01N2201/0813
摘要： A unit for measurement of absorbance using a microchip has a microchip with a continuous cavity, a sample chamber, a reagent chamber, a reagent mixing chamber and a chamber for measuring absorbance, which is arranged in a straight line in the area of the continuous cavity. The microchip is located in a chip holder which has a capillary part which is arranged such that the light used to measure absorbance is delivered through the capillary part to the chamber for measuring absorbance, the capillary part having a smaller opening diameter than the diameter of the cross section which is perpendicular to the optical axis of the chamber for measuring absorbance.
摘要翻译：使用微芯片测量吸光度的单元具有连续空腔的微芯片，样品室，试剂室，试剂混合室和用于测量吸光度的室，其在连续空腔的区域中以直线布置。微芯片位于具有毛细管部分的芯片保持器中，该毛细管部分布置成使得用于测量吸光度的光通过毛细管部分传送到用于测量吸光度的腔室，毛细管部分的开口直径小于横截面垂直于室的光轴测量吸光度。

2. 发明授权

US07901631B2 Unit for measuring absorbance 失效
标题翻译：单位测量吸光度
公开(公告)号：US07901631B2
公开(公告)日：2011-03-08
申请号：US11225044
申请日：2005-09-14
申请人： Shigeki Matsumoto , Shigenori Nozawa
发明人： Shigeki Matsumoto , Shigenori Nozawa
IPC分类号： G01N21/00 , G01N21/01
CPC分类号： G01N21/0303 , B01L3/502715 , B01L9/527 , B01L2300/0654 , B01L2300/0816 , B01L2300/0867 , G01N2201/0813
摘要： A unit for measurement of absorbance using a microchip has a microchip with a continuous cavity, a sample chamber, a reagent chamber, a reagent mixing chamber and a chamber for measuring absorbance, which is arranged in a straight line in the area of the continuous cavity. The microchip is located in a chip holder which has a capillary part which is arranged such that the light used to measure absorbance is delivered through the capillary part to the chamber for measuring absorbance, the capillary part having a smaller opening diameter than the diameter of the cross section which is perpendicular to the optical axis of the chamber for measuring absorbance.
摘要翻译：使用微芯片测量吸光度的单元具有连续空腔的微芯片，样品室，试剂室，试剂混合室和用于测量吸光度的室，其在连续空腔的区域中以直线布置。微芯片位于具有毛细管部分的芯片保持器中，该毛细管部分布置成使得用于测量吸光度的光通过毛细管部分传送到用于测量吸光度的腔室，毛细管部分的开口直径小于横截面垂直于室的光轴测量吸光度。

3. 发明授权

US07382462B2 Device for measuring the reflection factor 有权
标题翻译：用于测量反射系数的装置
公开(公告)号：US07382462B2
公开(公告)日：2008-06-03
申请号：US11355106
申请日：2006-02-16
申请人： Shigeki Matsumoto , Shigenori Nozawa , Yoshimasa Ogawa
发明人： Shigeki Matsumoto , Shigenori Nozawa , Yoshimasa Ogawa
IPC分类号： G01N21/55 , G01N21/47
CPC分类号： G01N21/4738 , G01N21/8483 , G01N2021/478
摘要： A device for measuring the reflection factor by irradiating a measurement area of a microchip with light, and in which a light receiving part is made to receive light reflected from the measurement area for determination of the reflection factor of the measurement area. The light receiving part is located in an angular region θ, satisfying the relationship (½)α≦θ≦sin−1(1/n) and being located between angles θmin and θmax, θmin and θmax (in°) being angles which the reflection light forms with respect to a normal on the edge of the irradiated surface of the area to be measured in a virtual plane which contains the emission center of the light emitting part and which is perpendicular to the microchip, wherein θmin is ½ α and θmax corresponds to sin−1(1/n), where α (°) is the scattering angle of the light radiated by the light emitting part which is located directly above the area to be measured, and wherein n is the index of refraction of the transparent component.
摘要翻译：一种用于通过用光照射微芯片的测量区域来测量反射系数的装置，并且其中使光接收部分接收从测量区域反射的光以确定测量区域的反射系数。光接收部分位于角度区域θ中，满足关系（½）α<=θ<= SIN＆lt; 1＆gt;（1 / n），并且位于θ< / SUB>和θ，θ＆lt; min＆lt;＆gt;和θmax（°）是反射光相对于正常形成的角度在包含发光部分的发射中心并且垂直于微芯片的虚拟平面中待测量区域的被照射表面的边缘，其中θ分别为1/2和θ< SUB> max 对应于sin ^{（1 / n），其中α（°）是由位于区域正上方的发光部分辐射的光的散射角被测量，并且其中n是透明组分的折射率。}

4. 发明授权

US07981689B2 Absorption spectrometric analysis microchip and method 有权
标题翻译：吸收光谱分析微芯片和方法
公开(公告)号：US07981689B2
公开(公告)日：2011-07-19
申请号：US11224955
申请日：2005-09-14
申请人： Shigeki Matsumoto , Shigenori Nozawa
发明人： Shigeki Matsumoto , Shigenori Nozawa
IPC分类号： G01N21/03
CPC分类号： G01N21/03 , B01F13/0059 , B01L3/502707 , B01L3/502715 , B01L2300/0654 , B01L2300/0816 , B01L2300/0867 , G01N21/31 , G01N2021/0328 , G01N2021/0346
摘要： An absorption spectrometric analysis microchip with a chamber for holding a sample, a chamber for holding a reagent which reacts with this sample, a mixing chamber for mixing the reagent with the sample with the formation of a mixture and a sensing part with a sensing chamber for holding the mixture with a light incidence surface for the entry of light into the sensing chamber and a light exit surface for emergence of light from the sensing chamber. At least one of the light incidence surface and light exit surface is located in a recess area of the sensing part.
摘要翻译：具有用于保持样品的室的吸收光谱分析微芯片，用于保持与该样品反应的试剂的室，用于将试剂与样品混合形成混合物的混合室和具有感测室的感测部分保持混合物具有光入射表面，用于将光进入感测室，以及光出射表面，用于从感测室出射光。光入射面和光出射面中的至少一个位于感测部的凹部中。

5. 发明申请

US20060186407A1 Device for measuring the reflection factor 有权
标题翻译：用于测量反射系数的装置
公开(公告)号：US20060186407A1
公开(公告)日：2006-08-24
申请号：US11355106
申请日：2006-02-16
申请人： Shigeki Matsumoto , Shigenori Nozawa , Yoshimasa Ogawa
发明人： Shigeki Matsumoto , Shigenori Nozawa , Yoshimasa Ogawa
IPC分类号： H01L31/0376
CPC分类号： G01N21/4738 , G01N21/8483 , G01N2021/478
摘要： A device for measuring the reflection factor by irradiating a measurement area of a microchip with light, and in which a light receiving part is made to receive light reflected from the measurement area for determination of the reflection factor of the measurement area. The light receiving part is located in an angular region θ, satisfying the relationship (1/2)α≦θ≦ sin-1(1/n) and being located between angles θmin and θmax, θmin and θmax (in°) being angles which the reflection light forms with respect to a normal on the edge of the irradiated surface of the area to be measured in a virtual plane which contains the emission center of the light emitting part and which is perpendicular to the microchip, wherein θmin is 1/2 α and θmax corresponds to sin-1(1/n), where α (°) is the scattering angle of the light radiated by the light emitting part which is located directly above the area to be measured, and wherein n is the index of refraction of the transparent component.
摘要翻译：一种用于通过用光照射微芯片的测量区域来测量反射系数的装置，并且其中使光接收部分接收从测量区域反射的光以确定测量区域的反射系数。光接收部分位于角度区域θ中，满足关系（1/2）α1=θ1=（1 / n），并且位于θ< 最小和/或最小和/或最小（°）是反射光形成的角度，相对于在包含发光部分的发射中心并且垂直于微芯片的虚拟平面中待测量区域的被照射表面的边缘上的正常，其中θ分别为1/2 α和θ最大值对应于sin（1 / n）（1 / n），其中α（°）是由位于的发光部分辐射的光的散射角直接在要测量的区域上方，并且其中n是透明组分的折射率。

6. 发明授权

US07443502B2 Absorption spectrum photometry microchip testing device and components thereof 有权
标题翻译：吸收光谱测微微芯片测试装置及其组件
公开(公告)号：US07443502B2
公开(公告)日：2008-10-28
申请号：US11281481
申请日：2005-11-18
申请人： Shigenori Nozawa , Shigeki Matsumoto
发明人： Shigenori Nozawa , Shigeki Matsumoto
IPC分类号： G01N21/01
CPC分类号： G01N21/03 , B01L3/502715 , B01L9/527 , B01L2300/0654 , B01L2300/0816 , G01N2021/0346
摘要： A microchip testing device with a microchip having an absorbance measuring chamber for measuring absorbance, a transmitted light receiving unit for receiving light which has been emitted from a light source and has been transmitted through the absorbance measuring chamber, an aperture which extends in a straight line in the direction of the optical axis of the absorbance measuring chamber, with an entry opening for the light emitted by the light source on one end and a light exit opening on an opposite end from which the light enters the absorbance measuring chamber, an incident light beam splitter which is located in the optical path between the light exit opening of the aperture and the absorbance measuring chamber and which transmits part of the incident light and reflects another part of it, and a reflected light receiving part for receiving the light which has been reflected by the beam splitter.
摘要翻译：一种微芯片测试装置，其具有具有用于测量吸光度的吸光度测量室的微芯片测试装置，用于接收从光源发射并已经透射通过吸光度测量室的光的透射光接收单元，在吸光度测量室的光轴的方向上，具有用于一端的光源发射的光的入口孔和光入射到吸光度测量室的相对端上的光出口，入射光分束器，其位于孔的光出口和吸光度测量室之间的光路中，并且透射部分入射光并反射其另一部分;以及反射光接收部分，用于接收已经被由分束器反射。

7. 发明申请

US20060061760A1 Absorption spectrometric analysis microchip 有权
标题翻译：吸收光谱分析微芯片
公开(公告)号：US20060061760A1
公开(公告)日：2006-03-23
申请号：US11224955
申请日：2005-09-14
申请人： Shigeki Matsumoto , Shigenori Nozawa
发明人： Shigeki Matsumoto , Shigenori Nozawa
IPC分类号： G01N1/10
CPC分类号： G01N21/03 , B01F13/0059 , B01L3/502707 , B01L3/502715 , B01L2300/0654 , B01L2300/0816 , B01L2300/0867 , G01N21/31 , G01N2021/0328 , G01N2021/0346
摘要： An absorption spectrometric analysis microchip with a chamber for holding a sample, a chamber for holding a reagent which reacts with this sample, a mixing chamber for mixing the reagent with the sample with the formation of a mixture and a sensing part with a sensing chamber for holding the mixture with a light incidence surface for the entry of light into the sensing chamber and a light exit surface for emergence of light from the sensing chamber. At least one of the light incidence surface and light exit surface is located in a recess area of the sensing part.
摘要翻译：具有用于保持样品的室的吸收光谱分析微芯片，用于保持与该样品反应的试剂的室，用于将试剂与样品混合形成混合物的混合室和具有感测室的感测部分保持混合物具有光入射表面，用于将光进入感测室，以及光出射表面，用于从感测室出射光。光入射面和光出射面中的至少一个位于感测部的凹部中。

8. 发明授权

US07413447B2 Electric distribution box 有权
标题翻译：配电箱
公开(公告)号：US07413447B2
公开(公告)日：2008-08-19
申请号：US11404002
申请日：2006-04-14
申请人： Sakai Yagi , Yoshiaki Ichikawa , Shigeki Matsumoto , Junta Katayama , Yasuyoshi Fukao
发明人： Sakai Yagi , Yoshiaki Ichikawa , Shigeki Matsumoto , Junta Katayama , Yasuyoshi Fukao
IPC分类号： H01R12/00
CPC分类号： H05K7/026 , Y10S439/949
摘要： An electric distribution box includes a circuit which is operable to perform the flowing, interruption and detection of electric current, and the circuit having distribution parts and a first bus bar which connects the distribution parts, a case body in which the circuit is contained, and an external input/output terminal portion which is detachably mounted on an outer surface of the case body, and is adapted to be connected to the first bus bar.
摘要翻译：配电箱包括可操作以执行电流的流动，中断和检测的电路，并且具有分配部分的电路和连接分配部分的第一母线，其中容纳电路的壳体和外部输入/输出端子部分，其可拆卸地安装在壳体的外表面上，并且适于连接到第一汇流条。

9. 发明授权

US07381065B2 High-tension connector box 有权
标题翻译：高压接头盒
公开(公告)号：US07381065B2
公开(公告)日：2008-06-03
申请号：US11195865
申请日：2005-08-03
申请人： Tomohiro Ikeda , Yoshiaki Ichikawa , Shigeki Matsumoto , Ko Watanabe , Takenori Tsuchiya
发明人： Tomohiro Ikeda , Yoshiaki Ichikawa , Shigeki Matsumoto , Ko Watanabe , Takenori Tsuchiya
IPC分类号： H01R12/00
CPC分类号： H05K7/026
摘要： Preventing a controller securely from effects of heat or noise of a relay and a high-tension circuit, a synthetic resin inner cover is arranged between a top cover and a bottom cover. A high-tension circuit is arranged between the top cover and inner cover. A control baseboard is provided at the bottom cover. The bottom cover is covered by the inner cover. Thereby, the control baseboard is prevented from being heated by the high-tension circuit by the inner cover. A conductive metallic shielding cover is arranged between the bottom cover having the control baseboard and the inner cover to cover the bottom cover including the control baseboard. Thereby, the control baseboard is prevented from noise of the high-tension circuit. The inner cover and the shielding cover having respectively a flange are fixed on a vehicle body by a bolt to overlap the both flanges.
摘要翻译：确保控制器牢固地防止继电器和高压电路的热或噪声的影响，合成树脂内盖设置在顶盖和底盖之间。高压电路设置在顶盖和内盖之间。底盖设有控制基板。底盖被内盖覆盖。由此，防止了控制基板被内盖由高压回路加热。在具有控制基板的底盖和内盖之间布置有导电金属屏蔽盖，以覆盖包括控制基板的底盖。由此，防止了控制基板的高压电路的噪声。分别具有凸缘的内盖和屏蔽盖通过螺栓固定在车身上以与两个凸缘重叠。

10. 发明授权

US07402918B2 Arrangement structure of electric junction box 有权
标题翻译：电接线盒布置结构
公开(公告)号：US07402918B2
公开(公告)日：2008-07-22
申请号：US11195844
申请日：2005-08-03
申请人： Tomohiro Ikeda , Yoshiaki Ichikawa , Shigeki Matsumoto , Ko Watanabe , Takenori Tsuchiya
发明人： Tomohiro Ikeda , Yoshiaki Ichikawa , Shigeki Matsumoto , Ko Watanabe , Takenori Tsuchiya
IPC分类号： B60L1/00
CPC分类号： H01M2/34 , B60K6/26 , H01M2/347 , H02G3/088
摘要： An arrangement structure of an electric junction box is provided, by which damage of the electric junction box in the event of a collision of a vehicle can be reduced and a plurality of electric wires can be easily connected to the electric junction box with good workability. The arrangement structure includes: a high voltage battery; a battery pack for receiving the battery, the battery pack being mounted on a vehicle; and an electric junction box arranged in the battery pack, the electric junction box being connected to the battery, wherein on the assumption that a collision takes place on the battery pack-mounting side of the vehicle, the electric junction box is arranged on the side of a wall of the battery pack, the wall being situated on the side opposite to the collision side of the vehicle.
摘要翻译：提供了一种电接线盒的布置结构，可以减少在车辆碰撞时电接线盒的损坏，并且可以容易地将多根电线连接到电接线盒，并具有良好的可加工性。排列结构包括：高压电池; 用于接收电池的电池组，所述电池组安装在车辆上; 以及布置在电池组中的电接线盒，电接线盒连接到电池，其中假设在车辆的电池组安装侧发生碰撞，电接线盒布置在侧面的电池组的壁，该壁位于与车辆的碰撞侧相对的一侧。

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